Download or read book A Survey of Research at the Center for Reliable Computing Stanford University written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1976 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Center for reliable computing current research written by Stanford University. Computer Science Department and published by . This book was released on 1975 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.

Download or read book Stanford University Electronics Research Review written by and published by . This book was released on 1977 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes brief descriptions of projects, listings of contracts and grant support, and listings of publications.

Download or read book Research in the Digital Systems Laboratory August 1976 July 1977 written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: _________________________________ *Renamed Computer Systems Laboratory in 1978.

Download or read book FTCS 8 written by and published by . This book was released on 1978 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book TUGboat written by and published by . This book was released on 1982 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Second Survey of Domestic Electronic Digital Computing Systems written by Martin H. Weik and published by . This book was released on 1957 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Design Automation Fault tolerant Computing written by and published by . This book was released on 1976 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

Download or read book Echnology Assessment in Software Applications written by Harold F. O'Neil, Jr. and published by Routledge. This book was released on 2013-11-05 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume offers an expansion of ideas presented at a recent conference convened to identify the major strategies and more promising practices for assessing technology. The authors -- representing government, business, and university sectors -- helped to set the boundaries of present technology assessment by offering perspectives from computer science, cognitive and military psychology, and education. Their work explores both the use of techniques to assess technology and the use of technology to facilitate the assessment process. The book's main purpose is to portray the state of the art in technology assessment and to provide conceptual options to help readers understand the power of technology. Technological innovation will continue to develop its own standards of practice and effectiveness. To the extent that these practices are empirically based, designers, supporters, and consumers will be given better information for their decisions.

Download or read book Research in Education written by and published by . This book was released on 1974 with total page 1208 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Government wide Index to Federal Research Development Reports written by and published by . This book was released on 1967 with total page 1352 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Pioneer Venus written by Richard O. Fimmel and published by . This book was released on 1983 with total page 253 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Selected Water Resources Abstracts written by and published by . This book was released on 1977 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Engineering written by Elsayed A. Elsayed and published by John Wiley & Sons. This book was released on 2021-01-07 with total page 930 pages. Available in PDF, EPUB and Kindle. Book excerpt: Get a firm handle on the engineering reliability process with this insightful and complete resource Named one of the Best Industrial Management eBooks of All Time by BookAuthority As featured on CNN, Forbes and Inc – BookAuthority identifies and rates the best books in the world, based on recommendations by thought leaders and experts The newly and thoroughly revised 3rd Edition of Reliability Engineering delivers a comprehensive and insightful analysis of this crucial field. Accomplished author, professor, and engineer, Elsayed. A. Elsayed includes new examples and end-of-chapter problems to illustrate concepts, new chapters on resilience and the physics of failure, revised chapters on reliability and hazard functions, and more case studies illustrating the approaches and methodologies described within. The book combines analyses of system reliability estimation for time independent and time dependent models with the construction of the likelihood function and its use in estimating the parameters of failure time distribution. It concludes by addressing the physics of failures, mechanical reliability, and system resilience, along with an explanation of how to ensure reliability objectives by providing preventive and scheduled maintenance and warranty policies. This new edition of Reliability Engineering covers a wide range of topics, including: Reliability and hazard functions, like the Weibull Model, the Exponential Model, the Gamma Model, and the Log-Logistic Model, among others System reliability evaluations, including parallel-series, series-parallel, and mixed parallel systems The concepts of time- and failure-dependent reliability within both repairable and non-repairable systems Parametric reliability models, including types of censoring, and the Exponential, Weibull, Lognormal, Gamma, Extreme Value, Half-Logistic, and Rayleigh Distributions Perfect for first-year graduate students in industrial and systems engineering, Reliability Engineering, 3rd Edition also belongs on the bookshelves of practicing professionals in research laboratories and defense industries. The book offers a practical and approachable treatment of a complex area, combining the most crucial foundational knowledge with necessary and advanced topics.

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.