Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Download or read book Algorithms Advances in Research and Application 2012 Edition written by and published by ScholarlyEditions. This book was released on 2012-12-26 with total page 2152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Algorithms—Advances in Research and Application: 2012 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Algorithms. The editors have built Algorithms—Advances in Research and Application: 2012 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Algorithms in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Algorithms—Advances in Research and Application: 2012 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Download or read book Systems Modeling and Simulation Theory and Applications written by Doo-Kwon Baik and published by Springer. This book was released on 2005-02-07 with total page 747 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed post-proceedings of the third Asian Simulation Conference, AsiaSim 2004, held in Jeju Island, Korea in October 2004. The 78 revised full papers presented together with 2 invited keynote papers were carefully reviewed and selected from 178 submissions; after the conference, the papers went through another round of revision. The papers are organized in topical sections on modeling and simulation methodology, manufacturing, aerospace simulation, military simulation, medical simulation, general applications, network simulation and modeling, e-business simulation, numerical simulation, traffic simulation, transportation, virtual reality, engineering applications, and DEVS modeling and simulation.

Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

Download or read book VLSI SoC New Technology Enabler written by Carolina Metzler and published by Springer Nature. This book was released on 2020-07-22 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019. The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.

Download or read book Proceedings written by and published by . This book was released on 2002 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Knowledge Based Intelligent Information and Engineering Systems written by Mircea Gh. Negoita and published by Springer Science & Business Media. This book was released on 2004-09-20 with total page 962 pages. Available in PDF, EPUB and Kindle. Book excerpt: The three-volume set LNAI 3213, LNAI 3214, and LNAI 3215 constitutes the refereed proceedings of the 8th International Conference on Knowledge-Based Intelligent Information and Engineering Systems, KES 2004, held in Wellington, New Zealand in September 2004. The over 450 papers presented were carefully reviewed and selected from numerous submissions. The papers present a wealth of original research results from the field of intelligent information processing in the broadest sense; among the areas covered are artificial intelligence, computational intelligence, cognitive technologies, soft computing, data mining, knowledge processing, various new paradigms in biologically inspired computing, and applications in various domains like bioinformatics, finance, signal processing etc.

Download or read book Nanoscale Memory Repair written by Masashi Horiguchi and published by Springer Science & Business Media. This book was released on 2011-01-11 with total page 221 pages. Available in PDF, EPUB and Kindle. Book excerpt: Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

Download or read book Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs written by Brandon Noia and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Download or read book Records of the 2002 IEEE International Workshop on Memory Technology Design and Testing written by Bernard Courtois and published by IEEE Computer Society Press. This book was released on 2002 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.

Download or read book Mathematics Advances in Research and Application 2013 Edition written by and published by ScholarlyEditions. This book was released on 2013-06-21 with total page 906 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mathematics—Advances in Research and Application: 2013 Edition is a ScholarlyBrief™ that delivers timely, authoritative, comprehensive, and specialized information about ZZZAdditional Research in a concise format. The editors have built Mathematics—Advances in Research and Application: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about ZZZAdditional Research in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Mathematics—Advances in Research and Application: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Download or read book Integrated Circuit Manufacturability written by José Pineda de Gyvez and published by John Wiley & Sons. This book was released on 1998-10-30 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: "INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."

Download or read book Proceedings of Congress on Control Robotics and Mechatronics written by Pradeep Kumar Jha and published by Springer Nature. This book was released on 2023-11-09 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features high-quality research papers presented at the International Conference of Mechanical and Robotic Engineering “Congress on Control, Robotics, and Mechatronics” (CRM 2023), jointly organized by Modi Institute of Technology, Kota, India, and Soft Computing Research Society, India, during 25–26 March 2023. This book discusses the topics such as combustion and fuels, controls and dynamics, fluid mechanics, I.C. engines and automobile engineering, machine design, mechatronics, rotor dynamics, solid mechanics, thermodynamics and combustion engineering, composite material, aerodynamics, aerial vehicles, missiles and robots, automatic design and manufacturing, artificial intelligence, unmanned aerial vehicles, autonomous robotic vehicles, evolutionary robotics, humanoids, hardware architecture, industrial robotics, intelligent control systems, microsensors and actuators, multi-robots systems, neural decoding algorithms, neural networks for mobile robots, space robotics, control theory and applications, model predictive control, variable structure control, and decentralized control.

Download or read book Proceedings of the 11th International Conference on Robotics Vision Signal Processing and Power Applications written by Nor Muzlifah Mahyuddin and published by Springer Nature. This book was released on 2022-02-11 with total page 1124 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceeding is a collection of research papers presented at the 11th International Conference on Robotics, Vision, Signal Processing & Power Applications (RoViSP 2021). The theme of RoViSP 2021 “Enhancing Research and Innovation through the Fourth Industrial Revolution (IR 4.0)” served as a platform for researchers, scientists, engineers, academicians as well as industrial professionals from all around the globe to present and exchange their research findings and development activities through oral presentations. The book covers various topics of interest, including: Robotics, Control, Mechatronics and Automation Telecommunication Systems and Applications Electronic Design and Applications Vision, Image and Signal Processing Electrical Power, Energy and Industrial Applications Computer and Information Technology Biomedical Engineering and Applications Intelligent Systems Internet-of-things Mechatronics Mobile Technology

Download or read book Yield Simulation for Integrated Circuits written by D.M. Walker and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.