Download or read book 35th International Field Emission Symposium written by M. K. Miller and published by . This book was released on 1988 with total page 566 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 35th International Field Emission Symposium written by Michael K. Miller and published by . This book was released on 1988 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 35th International Field Emission Symposium written by Michael Kenneth Miller and published by . This book was released on 1988 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 35th International Field Emission Symposium July 18 22 1988 written by M. K. Miller and published by . This book was released on 1988 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book International Field Emission Symposium written by International Field Emission Symposium and published by . This book was released on 1988 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Atom Probe Tomography written by Michael K. Miller and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

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Download or read book Proceedings of the 35th International MATADOR Conference written by Srichand Hinduja and published by Springer Science & Business Media. This book was released on 2007-06-30 with total page 391 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presented here are 88 refereed papers given at the 35th MATADOR Conference held at the National University of Taiwan in Taipei, Taiwan in July 2007. The MATADOR series of conferences covers the topics of Manufacturing Automation and Systems Technology, Applications, Design, Organisation and Management, and Research. The proceedings of this conference contains original papers contributed by researchers from many countries on different continents. The papers cover the principles, techniques and applications associated with: manufacturing processes; technology; system design and integration; and computer applications and management. The papers in this volume reflect: • the importance of manufacturing in international wealth creation; • the emerging fields of micro- and nano-manufacture; • the increasing trend towards the fabrication of parts using additive processes; • the growing demand for precision engineering and part inspection techniques; • measurement techniques and equipment.

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