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Download or read book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2000 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

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