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Book Proceedings 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book Proceedings 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1996 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 39 papers cover avoiding defects, predicting yield, enhancing yield and reliability, layout-driven tests, analyzing process data, tests and diagnosis, designing self-tests and self- checking, fault-tolerant structures, synthesizing reliable circuits, and approaches to fault-tolerance. The gathering was the latest in an annual series that began in 1988 and has become recognized as the major international forum for researchers and practitioners to discuss defect and fault tolerance at the integrated circuit level. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR

Book Selected Papers from IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT

Download or read book Selected Papers from IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT written by International Symposium on Defect and Fault Tolerance in VLSI Systems and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Fault Tolerant Systems

    Fault Tolerant Systems

    Book Details:
  • Author : Israel Koren
  • Publisher : Morgan Kaufmann
  • Release : 2020-09-01
  • ISBN : 0128181060
  • Pages : 418 pages

Download or read book Fault Tolerant Systems written by Israel Koren and published by Morgan Kaufmann. This book was released on 2020-09-01 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fault-Tolerant Systems, Second Edition, is the first book on fault tolerance design utilizing a systems approach to both hardware and software. No other text takes this approach or offers the comprehensive and up-to-date treatment that Koren and Krishna provide. The book comprehensively covers the design of fault-tolerant hardware and software, use of fault-tolerance techniques to improve manufacturing yields, and design and analysis of networks. Incorporating case studies that highlight more than ten different computer systems with fault-tolerance techniques implemented in their design, the book includes critical material on methods to protect against threats to encryption subsystems used for security purposes. The text's updated content will help students and practitioners in electrical and computer engineering and computer science learn how to design reliable computing systems, and how to analyze fault-tolerant computing systems. - Delivers the first book on fault tolerance design with a systems approach - Offers comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Features fully updated content plus new chapters on failure mechanisms and fault-tolerance in cyber-physical systems - Provides a complete ancillary package, including an on-line solutions manual for instructors and PowerPoint slides

Book Defect and Fault Tolerance in Vlsi Systems dft 2002 17th Ieee International Symposium

Download or read book Defect and Fault Tolerance in Vlsi Systems dft 2002 17th Ieee International Symposium written by Ieee International Symposium On Defect And Fault Tolerance In Vlsi Systems and published by . This book was released on 2002 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS

Download or read book Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS written by and published by . This book was released on 2015 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2001 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the proceedings of the International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001).

Book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by IEEE. This book was released on 2000 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by IEEE Computer Society and published by . This book was released on 1999-11-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by Israel Koren and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.