Download or read book 14th IEEE VLSI Test Symposium written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fourteenth IEEE VLSI Test Symposium written by and published by IEEE Computer Society. This book was released on 1996-01-01 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2004 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Download or read book 17th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Download or read book 2017 IEEE 35th VLSI Test Symposium VTS written by and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Ieee Vlsi Test Symposium written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium VTS 98 16th IEEE written by IEEE, Society Staff and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on 16th IEEE VLSI Test Symposium VTS 98 written by VLSI Test Symposium and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book Field Programmable Logic and Applications The Roadmap to Reconfigurable Computing written by Reiner W. Hartenstein and published by Springer. This book was released on 2003-06-29 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the proceedings volume of the 10th International Conference on Field Programmable Logic and its Applications (FPL), held August 27 30, 2000 in Villach, Austria, which covered areas like reconfigurable logic (RL), reconfigurable computing (RC), and its applications, and all other aspects. Its subtitle "The Roadmap to Reconfigurable Computing" reminds us, that we are currently witnessing the runaway of a breakthrough. The annual FPL series is the eldest international conference in the world covering configware and all its aspects. It was founded 1991 at Oxford University (UK) and is 2 years older than its two most important competitors usually taking place at Monterey and Napa. FPL has been held at Oxford, Vienna, Prague, Darmstadt, London, Tallinn, and Glasgow (also see: http://www. fpl. uni kl. de/FPL/). The New Case for Reconfigurable Platforms: Converging Media. Indicated by palmtops, smart mobile phones, many other portables, and consumer electronics, media such as voice, sound, video, TV, wireless, cable, telephone, and Internet continue to converge. This creates new opportunities and even necessities for reconfigurable platform usage. The new converged media require high volume, flexible, multi purpose, multi standard, low power products adaptable to support evolving standards, emerging new standards, field upgrades, bug fixes, and, to meet the needs of a growing number of different kinds of services offered to zillions of individual subscribers preferring different media mixes.
Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium 21st IEEE written by IEEE Computer Society Staff and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ISTFA 1997 International Symposium for Testing and Failure Analysis written by Grace M. Davidson and published by ASM International. This book was released on 1997-01-01 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Test Symposium VTS 2014 IEEE 32nd written by and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The 12th IEEE VLSI Test Symposium written by W. Maly and published by . This book was released on 1995 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt:
