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Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by ETATS UNIS. National Bureau of Standards and published by . This book was released on 1976 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Proceedings of a Workshop Gaithersburg Md 1975

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Proceedings of a Workshop Gaithersburg Md 1975 written by K. F. J. Heinrich and published by . This book was released on 1977 with total page 165 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book WORKSHOP ON USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY Gaithersburg Md Oct 1 3 1975 Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Edited by Kur

Download or read book WORKSHOP ON USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY Gaithersburg Md Oct 1 3 1975 Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Edited by Kur written by and published by . This book was released on 1976 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by Forgotten Books. This book was released on 2018-10-02 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron, Microscopy: Proceedings of a Workshop Held at the National Bureau of Standards Gaithersburg, Maryland, October, 1-3, 1975 The Analytical Chemistry Division of the Institute for Materials Research, National Bureau of Standards, seeks to develop new techniques of chemical analysis and improve existing techniques. Part of the mission of nbs is to disseminate knowledge in the scientific and technical community. To aid in reaching this objective, the Analytical Chemistry Division has sponsored a series of workshops on various topics in analytical chemistry. The workshop topics are chosen to fulfill current needs for detailed discussions on sharply defined subjects in a wide variety of specialist areas. The objective is to bring together specialists from throughout the world to concentrate intensively on a particular subject in order to advance the state-of-the-art. It is often very difficult to achieve this goal at large international meetings where the size and diversity of topics presented often limits detailed discussion of special subjects. Past topics of these workshops and the published proceedings include: Quantitative Electron Probe Microanalysis (nbs Special Publication 298, available from editors), Aerosol Measurements (nbs Special Publication 4l2), Oil Pollution Monitoring (nbs Special Publication and Secondary Ion Mass Spectrometry (nbs Special Publication These proceedings are available from the Superintendent of Documents, Government Printing Office, washington, DC 20402. Further information on the workshops can be obtained by writing to the Division Office, Analytical Chemistry Division, National Bureau of Standards, Washington, DC 20234. This volume contains the proceedings of a Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy. The three-day meeting involved participants from the United States and Europe. The workshop format consisted of a keynote talk on each topic followed by extensive discussions. The papers in this volume are based on the keynote talks augmented with some points raised in the discussion. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

Book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP NATIONAL BUREAU OF STANDARDS INSTITUTE FOR MATERIALS RESEARCH ANALYTICAL CHEMISTRY DIVISION

Download or read book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP NATIONAL BUREAU OF STANDARDS INSTITUTE FOR MATERIALS RESEARCH ANALYTICAL CHEMISTRY DIVISION written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Monte Carlo Modeling for Electron Microscopy and Microanalysis

Download or read book Monte Carlo Modeling for Electron Microscopy and Microanalysis written by David C. Joy and published by Oxford University Press. This book was released on 1995-04-13 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

Book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP GAITHERSBURG MARYLAND OCT 1 3 1975

Download or read book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP GAITHERSBURG MARYLAND OCT 1 3 1975 written by United States. National Bureau of Standards and published by . This book was released on with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Quantitative Electron probe Microanalysis

Download or read book Quantitative Electron probe Microanalysis written by Victor D. Scott and published by . This book was released on 1983 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Electron Beam Interactions with Solids

Download or read book Electron Beam Interactions with Solids written by Maurizio Dapor and published by Springer. This book was released on 2003-07-03 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt: The interaction of an electron beam with a solid target has been studied since the early part of the past century. Since 1960, the electron–solid interaction hasbecomethesubjectofanumberofinvestigators’workowingtoitsfun- mental role in scanning electron microscopy, in electron-probe microanalysis, in Auger electron spectroscopy, in electron-beam lithography and in radiation damage. The interaction of an electron beam with a solid target has often been investigated theoretically by using the Monte Carlo method, a nume- cal procedure involving random numbers that is able to solve mathematical problems. This method is very useful for the study of electron penetration in matter. The probabilistic laws of the interaction of an individual electron with the atoms constituting the target are well known. Consequently, it is possible to compute the macroscopic characteristics of interaction processes by simulating a large number of real trajectories, and then averaging them. The aim of this book is to study the probabilistic laws of the interaction of individual electrons with atoms (elastic and inelastic cross-sections); to - vestigate selected aspects of electron interaction with matter (backscattering coe?cients for bulk targets, absorption, backscattering and transmission for both supported and unsupported thin ?lms, implantation pro?les, seconda- electron emission, and so on); and to introduce the Monte Carlo method and its applications to compute the macroscopic characteristics of the inter- tion processes mentioned above. The book compares theory, computational simulations and experimental data in order to o?er a more global vision.