Download or read book Uncertainties in Nist Noise Temperature Measurements Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-11-19 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Uncertainties in Nist Noise-Temperature Measurements The many different systems and our understanding of them have evolved considerably over the years, with concomitant changes m the uncertainty analyses. Even for systems whose uncertainties have not changed, the method of reporting the uncertainties has changed. Prior to about 1993 the common practice in the nist Noise Project was to compute and quote a worst-case or maximum possible error. This was done by estimating the maximum possible value for each component of the uncertainty and then forming the linear sum of the individual components. In 1992 nist officially adopted the policy of reporting uncertainties which conform to the iso guidelines Accordingly, the measurement services offered by the Noise Project now quote an expanded (20) uncertainty, corresponding to a 95 percent confidence level. This required a conversion from worst-case errors to standard uncertainties for the individual components of uncertainty, as well as a change in the manner of combining the components. As a result of all these changes - in the systems, the analyses, and the method of reporting the uncertainty - the uncertainty analysis for a typical system is now scattered in several different places, often rather inaccessible, and-there are sometimes conflicting forms for one analysis. The present paper addresses this problem; it assembles. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book UNCERTAINTIES IN NIST NOISE TEMPERATURE MEASUREMENTS NIST TECHNICAL 1502 U S DEPARTMENT OF COMMERCE written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1998* with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Uncertainty Analysis for Nist Noise Parameter Measurements Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-10-28 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Uncertainty Analysis for Nist Noise-Parameter Measurements The contributions to the standard uncertainty are divided into two groups. Generally, type-a uncertainties are those that are determined by statistical means, and type-b are all others. The standard or combined uncertainty (uc) in a quantity is the root sum of squares (rss) of the type-a and type-b uncertainties. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Uncertainties in NIST Noises temperature Measurements written by and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Noise Parameter Uncertainties written by and published by DIANE Publishing. This book was released on with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Uncertainty Analysis for NIST Noise Parameter Measurement written by U.s. Department of Commerce and published by Createspace Independent Publishing Platform. This book was released on 2014-01-21 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
Download or read book Uncertainty analysis for NIST noise parameter measurements written by James Randa and published by . This book was released on 2008 with total page 31 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results rev Ed written by Barry N. Taylor and published by DIANE Publishing. This book was released on 2009-11 with total page 25 pages. Available in PDF, EPUB and Kindle. Book excerpt: Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Download or read book Noise Temperature Measurement System for the Wr 28 Band Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-12-14 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Noise-Temperature Measurement System for the Wr-28 Band Before proceeding, we establish some notation and conventions. We use the term noise temperature to mean the spectral density of available power from the source, divided by Boltzmann's constant. Thus for a small bandwidth B, over which the available power density is constant, the available power is given by P kbbtn. Available powers will be denoted by capital P, and delivered powers by lowercase p. The subscript on an available power generally indicates the device, except in the case of P where it indicates the ambient. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Noise Temperature Measurements on Wafer Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-10-27 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Noise Temperature Measurements on Wafer Parameters on wafer, in particular the noise figure of a two - port device, such as some variety of low-noise transistor. The noise figure of a device is a measure of the noise added to the input signal by the device itself. It is determined by measuring the output noise power from the device for different known levels of input noise power. Because the noise figure of a device depends on the impedance of the input source, it must be measured for several different input impedances to characterize that dependence. Alternatively, if there is a single input impedance of interest, for example, 50 0, then the noise figure can be measured at just that one impedance. A good deal of work. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Noise Temperature Measurement System For The WR 28 Band NIST Technical Note 1395 U S Department Of Commerce written by and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1994 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Uncertainties in Low noise Amplifier Noise Figure noise Temperature Measurement at Microwave Frequencies written by Thomas Böhme and published by . This book was released on 1994 with total page 105 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Subject Guide to Books in Print written by and published by . This book was released on 2001 with total page 3054 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantifying Uncertainty in Analytical Measurement written by Eurachem/CITAC Working Group and published by . This book was released on 2000-01-01 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Evaluating Measurement Accuracy written by Semyon G Rabinovich and published by Springer Science & Business Media. This book was released on 2013-07-03 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: “Evaluating Measurement Accuracy, 2nd Edition” is intended for those who are concerned with measurements in any field of science or technology. It reflects the latest developments in metrology and offers new results, but is designed to be accessible to readers at different levels: scientists who advance the field of metrology, engineers and experimental scientists who use measurements as tool in their professions, students and graduate students in natural sciences and engineering, and, in parts describing practical recommendations, technicians performing mass measurements in industry, quality control, and trade. This book presents material from the practical perspective and offers solutions and recommendations for problems that arise in conducting real-life measurements. This new edition adds a method for estimating accuracy of indirect measurements with independent arguments, whose development Dr. Rabinovich was able to complete very recently. This method, which is called the Method of Enumeration, produces estimates that are no longer approximate, similar to the way the method of reduction described in the first edition removed approximation in estimating uncertainty of indirect measurements with dependent arguments. The method of enumeration completes addressing the range of problems whose solutions signify the emergence of the new theory of accuracy of measurements. A new method is added for building a composition of histograms, and this method forms a theoretical basis for the method of enumeration.Additionally, as a companion to this book, a concise practical guide that assembles simple step-by-step procedures for typical tasks the practitioners are likely to encounter in measurement accuracy estimation is available at SpringerLink.
Download or read book Introduction to Quantum Metrology written by Waldemar Nawrocki and published by Springer. This book was released on 2015-03-24 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
