Download or read book Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas written by Channing C. Ahn and published by John Wiley & Sons. This book was released on 2006-03-06 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
Download or read book Transmission Electron Energy Loss Spectrometry in Materials Science written by Minerals, Metals and Materials Society Staff and published by . This book was released on with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Transmission Electron Energy Loss Spectrometry in Materials Science written by MM Disko (Ed) and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2011-07-29 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Download or read book Electron Energy Loss Spectroscopy written by R. Brydson and published by Garland Science. This book was released on 2020-08-13 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
Download or read book Electron Energy Loss Spectroscopy written by Rik Brydson and published by Springer Verlag. This book was released on 2000-11-01 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is an introductory practical guide to the use of Electron Energy Loss Spectroscopy (EELS) in the laboratory. EELS is a technique used in the transmission electron microscope, in materials or physical science laboratories, to examine the microstructure and characteristics of materials. An ideal starting point for newcomers to the area, Electron Energy Loss Spectroscopy allows first-time users to fully understand the technique and to appreciate how useful results can be obtained.
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by Ray Egerton and published by . This book was released on 2014-01-15 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2009-08-05 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.
Download or read book Spectroscopy for Materials Characterization written by Simonpietro Agnello and published by John Wiley & Sons. This book was released on 2021-09-08 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Download or read book Electron Energy Loss Spectroscopy Solutions for Nanoscale Materials Science Problems written by Sònia Estradé Albiol and published by . This book was released on 2018 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic scattering, the incident electron gives a part of its energy to the electrons in the sample. The amount of lost energy can then be measured by a magnetic filter at the end of the column, and a plot displaying how many electrons have lost what amount of energy will give us an Electron Energy Loss (EEL) Spectrum. Thus, in an EEL Spectrum the ordinate axis corresponds to the number of electrons, or counts, and the abscise corresponds to the Energy Loss. Notice that most electrons shall not suffer any inelastic scattering whatsoever. As a consequence, the greatest contribution to the spectrum is due to these electrons having lost zero energy, giving rise to the so-called zero loss peak (ZLP). As for those electrons having lost a certain amount of energy, they may lose it to ionization of specimen electrons, transitions from occupied core states to unoccupied core states or to conduction band states, to interband transitions or excitations of collective vibrations of conduction band electrons. Incident electrons carry a given momentum, and it is worth keeping in mind that in an inelastic scattering event not only energy, but also momentum, may be transferred. In fact, this is the reason why it is not straightforward to compare EELS results with those obtained by means of optic spectroscopies. EELS detectors can provide an energy resolution down to the order of the 0.1 eV. In addition, incident electrons can be tuned by TEM optics, making it possible to get spectroscopic information from an extremely constrained area, and to combine EEL Spectroscopy with TEM imaging.
Download or read book High Resolution Imaging and Spectrometry of Materials written by Frank Ernst and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by and published by . This book was released on 2011-10-29 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
