Download or read book Totally self checking Check Circuits for Separable Codes written by Mohammad Javad Ashjaee and published by . This book was released on 1976 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Error Detecting Codes Self checking Circuits and Applications written by John F. Wakerly and published by North Holland. This book was released on 1978 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Self Checking and Fault Tolerant Digital Design written by Parag K. Lala and published by Morgan Kaufmann. This book was released on 2001 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Error Detecting Codes Self checking Circuits and Applications written by John F. Wakerly and published by North Holland. This book was released on 1978 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Error-detecting codes; Self-checking circuits; Data paths and memory; Arithmetic operations; Logical operations; Microprogrammed control units; Example design of a self-checking processor.
Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Download or read book Foundations of Dependable Computing written by Gary M. Koob and published by Springer Science & Business Media. This book was released on 2007-08-19 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: Foundations of Dependable Computing: System Implementation, explores the system infrastructure needed to support the various paradigms of Paradigms for Dependable Applications. Approaches to implementing support mechanisms and to incorporating additional appropriate levels of fault detection and fault tolerance at the processor, network, and operating system level are presented. A primary concern at these levels is balancing cost and performance against coverage and overall dependability. As these chapters demonstrate, low overhead, practical solutions are attainable and not necessarily incompatible with performance considerations. The section on innovative compiler support, in particular, demonstrates how the benefits of application specificity may be obtained while reducing hardware cost and run-time overhead. A companion to this volume (published by Kluwer) subtitled Models and Frameworks for Dependable Systems presents two comprehensive frameworks for reasoning about system dependability, thereby establishing a context for understanding the roles played by specific approaches presented in this book's two companion volumes. It then explores the range of models and analysis methods necessary to design, validate and analyze dependable systems. Another companion to this book (published by Kluwer), subtitled Paradigms for Dependable Applications, presents a variety of specific approaches to achieving dependability at the application level. Driven by the higher level fault models of Models and Frameworks for Dependable Systems, and built on the lower level abstractions implemented in a third companion book subtitled System Implementation, these approaches demonstrate how dependability may be tuned to the requirements of an application, the fault environment, and the characteristics of the target platform. Three classes of paradigms are considered: protocol-based paradigms for distributed applications, algorithm-based paradigms for parallel applications, and approaches to exploiting application semantics in embedded real-time control systems.
Download or read book Design of Totally Self checking Checker for T unidirectional Error Detecting Codes written by Sanjeev Malhotra and published by . This book was released on 1989 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: The use of Totally Self-Checking Checkers in the design of highly reliable systems has significant advantages. It allows errors to be detected upon occurance without testing whether the error is caused by a permanent or an intermittent fault. The TSC circuit provides an error indication whenever the input is not a code word or a fault occurs within a checker itself. TSC checkers have already been designed for m-out of-n codes and Berger codes. Bose Lin Code is a separable and efficient code for the detection of t-unidirectional errors. The purpose of this thesis is to describe the basis for the design of a self-checking checker and design a TSC checker for Bose Lin Code.
Download or read book Dependable Computing EDDC 3 written by Jan Hlavicka and published by Springer. This book was released on 2003-06-26 with total page 442 pages. Available in PDF, EPUB and Kindle. Book excerpt: The idea of creating the European Dependable Computing Conference (EDCC) was born at the moment when the Iron Curtain fell. A group of enthusiasts, who were pre viously involved in research and teaching in the ?eld of fault tolerant computing in different European countries, agreed that there is no longer any point in keeping pre viously independent activities apart and created a steering committee which took the responsibility for preparing the EDCC calendar and appointing the chairs for the in dividual conferences. There is no single European or global professional organization that took over the responsibility for this conference, but there are three national in terest groups that sent delegates to the steering committee and support its activities, especially by promoting the conference materials. As can be seen from these materi als, they are the SEE Working Group “Dependable Computing” (which is a successor organizationof AFCET)in France,theGI/ITG/GMATechnicalCommitteeonDepend ability and Fault Tolerance in Germany, and the AICA Working Group “Dependability of Computer Systems” in Italy. In addition, committees of several global professional organizations, such as IEEE and IFIP, support this conference. Prague has been selected as a conference venue for several reasons. It is an easily accessible location that may attract many visitors by its beauty and that has a tradition in organizing international events of this kind (one of the last FTSD conferences took place here).
Download or read book Code Design for Dependable Systems written by Eiji Fujiwara and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 718 pages. Available in PDF, EPUB and Kindle. Book excerpt: Theoretical and practical tools to master matrix code design strategy and technique Error correcting and detecting codes are essential to improving system reliability and have popularly been applied to computer systems and communication systems. Coding theory has been studied mainly using the code generator polynomials; hence, the codes are sometimes called polynomial codes. On the other hand, the codes designed by parity check matrices are referred to in this book as matrix codes. This timely book focuses on the design theory for matrix codes and their practical applications for the improvement of system reliability. As the author effectively demonstrates, matrix codes are far more flexible than polynomial codes, as they are capable of expressing various types of code functions. In contrast to other coding theory publications, this one does not burden its readers with unnecessary polynomial algebra, but rather focuses on the essentials needed to understand and take full advantage of matrix code constructions and designs. Readers are presented with a full array of theoretical and practical tools to master the fine points of matrix code design strategy and technique: * Code designs are presented in relation to practical applications, such as high-speed semiconductor memories, mass memories of disks and tapes, logic circuits and systems, data entry systems, and distributed storage systems * New classes of matrix codes, such as error locating codes, spotty byte error control codes, and unequal error control codes, are introduced along with their applications * A new parallel decoding algorithm of the burst error control codes is demonstrated In addition to the treatment of matrix codes, the author provides readers with a general overview of the latest developments and advances in the field of code design. Examples, figures, and exercises are fully provided in each chapter to illustrate concepts and engage the reader in designing actual code and solving real problems. The matrix codes presented with practical parameter settings will be very useful for practicing engineers and researchers. References lead to additional material so readers can explore advanced topics in depth. Engineers, researchers, and designers involved in dependable system design and code design research will find the unique focus and perspective of this practical guide and reference helpful in finding solutions to many key industry problems. It also can serve as a coursebook for graduate and advanced undergraduate students.
Download or read book Essentials of Error Control Coding Techniques written by Hideki Imai and published by Academic Press. This book was released on 2014-06-28 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: Essentials of Error-Control Coding Techniques presents error-control coding techniques with an emphasis on the most recent applications. It is written for engineers who use or build error-control coding equipment. Many examples of practical applications are provided, enabling the reader to obtain valuable expertise for the development of a wide range of error-control coding systems. Necessary background knowledge of coding theory (the theory of error-correcting codes) is also included so that the reader is able to assimilate the concepts and the techniques. The book is divided into two parts. The first provides the reader with the fundamental knowledge of the coding theory that is necessary to understand the material in the latter part. Topics covered include the principles of error detection and correction, block codes, and convolutional codes. The second part is devoted to the practical applications of error-control coding in various fields. It explains how to design cost-effective error-control coding systems. Many examples of actual error-control coding systems are described and evaluated. This book is particularly suited for the engineer striving to master the practical applications of error-control coding. It is also suitable for use as a graduate text for an advanced course in coding theory.
Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Fault Tolerant Computing Systems written by Mario Dal Cin and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: 5th International GI/ITG/GMA Conference, Nürnberg, September 25-27, 1991. Proceedings
Download or read book FTCS 6 written by and published by . This book was released on 1976 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Partially Self checking Circuits and Their Use in Performing Logical Operations written by Stanford University. Computer Science Department and published by . This book was released on 1973 with total page 58 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.
