Download or read book Time of flight Detector for Heavy Ion Backscattering Spectrometry written by and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Time of flight Heavy Ion Backscattering Spectrometry written by and published by . This book was released on 1993 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt: A new time-of-flight (TOF) ion detection system for Heavy Ion Backscattering Spectrometry (HIBS) is described. Examples are also given of the use of the system for measuring low-level contamination on Si wafers. Currently, the TOF-HBIS system has a sensitivity of 1 x 109/cm2 for the heaviest of surface impurity atoms and a mass resolution capable of separating Fe from Cu. The sensitivity is expected to improve by an additional order of magnitude on a industrial TOF-HIBS system being constructed for SEMATECH.
Download or read book Time of flight Detector and Its Application in High Energy Heavy Ion Scattering written by Ziwei Fang and published by . This book was released on 1994 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Recipes for High Resolution Time of flight Detectors written by and published by . This book was released on 1995 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt: The authors discuss the dynamics, construction, implementation and benefits of a time-of-flight (TOF) detector with count rates an order of magnitude higher and resolution three to four times better than that obtainable with a surface barrier detector. The propose use of design criteria for a time-of-flight detector is outlined, and the determination of a TOF detector's total relative timing error and how this value determines the mass resolution are illustrated using a graphical analysis. They present simulation and experimental examples employing light ions and discuss advantages and pitfalls of medium-energy heavy ion TOF spectrometry.
Download or read book Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices written by P. Rai-Choudhury and published by The Electrochemical Society. This book was released on 1997 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Energy Research Abstracts written by and published by . This book was released on 1995 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Ion Beams in Materials Processing and Analysis written by Bernd Schmidt and published by Springer Science & Business Media. This book was released on 2012-12-13 with total page 425 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning is treated in detail. Its applications in materials research, development and analysis, developments of special techniques and interaction mechanisms of ion beams with solid state matter result in the optimization of new material properties, which are discussed thoroughly. Solid-state properties optimization for functional materials such as doped semiconductors and metal layers for nano-electronics, metal alloys, and nano-patterned surfaces is demonstrated. The ion beam is an important tool for both materials processing and analysis. Researchers engaged in solid-state physics and materials research, engineers and technologists in the field of modern functional materials will welcome this text.
Download or read book ERDA Energy Research Abstracts written by and published by . This book was released on 1985 with total page 676 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold and published by CRC Press. This book was released on 2001-06-29 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1975 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Control of Semiconductor Interfaces written by I. Ohdomari and published by Elsevier. This book was released on 2017-05-03 with total page 600 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Download or read book Ion Beam Modification of Materials written by J.S. Williams and published by Newnes. This book was released on 2012-12-02 with total page 1157 pages. Available in PDF, EPUB and Kindle. Book excerpt: This conference consisted of 15 oral sessions, including three plenary papers covering areas of general interest, 22 specialist invited papers and 51 contributed presentations as well as three poster sessions. There were several scientific highlights covering a diverse spectrum of materials and ion beam processing methods. These included a wide range of conventional and novel applications such as: optical displays and opto-electronics, motor vehicle and tooling parts, coatings tailored for desired properties, studies of fundamental defect properties, the production of novel (often buried) compounds, and treating biomedical materials. The study of nanocrystals produced by ion implantation in a range of host matrices, particularly for opto-electronics applications, was one especially new and exciting development. Despite several decades of study, major progress was reported at the conference in understanding defect evolution in semiconductors and the role of defects in transient impurity diffusion. The use of implantation to tune or isolate optical devices and in forming optically active centres and waveguides in semiconductors, polymers and oxide ceramics was a major focus of several presentations at the conference. The formation of hard coatings by ion assisted deposition or direct implantation was also an area which showed much recent progress. Ion beam techniques had also developed apace, particularly those based on plasma immersion ion implantation or alternative techniques for large area surface treatment. Finally, the use of ion beams for the direct treatment of cancerous tissue was a particularly novel and interesting application of ion beams.
Download or read book Engineered Nanoparticles written by Ashok K. Singh and published by Academic Press. This book was released on 2015-11-24 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: Engineered Nanoparticles: Structure, Properties and Mechanisms of Toxicity is an indispensable introduction to engineered nanomaterials (ENM) and their potential adverse effects on human health and the environment. Although research in the area of pharmacology and toxicology of ENM is rapidly advancing, a possible correlation between their physicochemical properties and biomedical properties or toxicity is not yet fully understood. This understanding is essential to develop strategies for the safe applications and handling of ENM. The book comprehensively defines the current understanding of ENM toxicity, first describing these materials and their physicochemical properties, and then discussing the toxicological theory and methodology before finally demonstrating the potential impact of ENM on the environment and human health. It represents an essential reference for students and investigators in toxicology, pharmacology, chemistry, material sciences, medicine, and those in related disciplines who require an introduction to ENM and their potential toxicological effects. - Provides state-of-the-art physicochemical descriptions and methodologies for the characterization of engineered nanomaterials (ENM) - Describes the potential toxicological effects of ENM and the nanotoxicological mechanisms of action - Presents how to apply theory to practice in a public health and risk assessment setting
Download or read book Proceedings of the International Conference on Applications of High Precision Atomic and Nuclear Methods written by and published by Agata Olariu. This book was released on 2005 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Abstracts for the Twelfth International Conference on the Application of Accelerators in Research Industry November 2 3 4 and 5 1992 written by Jerome L. Duggan and published by . This book was released on 1992 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 1994 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
