Download or read book Electronic Materials written by Yuriy M. Poplavko and published by Elsevier. This book was released on 2018-11-23 with total page 710 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mechanical and thermal properties are reviewed and electrical and magnetic properties are emphasized. Basics of symmetry and internal structure of crystals and the main properties of metals, dielectrics, semiconductors, and magnetic materials are discussed. The theory and modern experimental data are presented, as well as the specifications of materials that are necessary for practical application in electronics. The modern state of research in nanophysics of metals, magnetic materials, dielectrics and semiconductors is taken into account, with particular attention to the influence of structure on the physical properties of nano-materials. The book uses simplified mathematical treatment of theories, while emphasis is placed on the basic concepts of physical phenomena in electronic materials. Most chapters are devoted to the advanced scientific and technological problems of electronic materials; in addition, some new insights into theoretical facts relevant to technical devices are presented. Electronic Materials is an essential reference for newcomers to the field of electronics, providing a fundamental understanding of important basic and advanced concepts in electronic materials science. Provides important overview of the fundamentals of electronic materials properties significant for device applications along with advanced and applied concepts essential to those working in the field of electronics Takes a simplified and mathematical approach to theories essential to the understanding of electronic materials and summarizes important takeaways at the end of each chapter Interweaves modern experimental data and research in topics such as nanophysics, nanomaterials and dielectrics

Download or read book ULSI Semiconductor Technology Atlas written by Chih-Hang Tung and published by John Wiley & Sons. This book was released on 2003-10-06 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt: More than 1,100 TEM images illustrate the science of ULSI The natural outgrowth of VLSI (Very Large Scale Integration), Ultra Large Scale Integration (ULSI) refers to semiconductor chips with more than 10 million devices per chip. Written by three renowned pioneers in their field, ULSI Semiconductor Technology Atlas uses examples and TEM (Transmission Electron Microscopy) micrographs to explain and illustrate ULSI process technologies and their associated problems. The first book available on the subject to be illustrated using TEM images, ULSI Semiconductor Technology Atlas is logically divided into four parts: * Part I includes basic introductions to the ULSI process, device construction analysis, and TEM sample preparation * Part II focuses on key ULSI modules--ion implantation and defects, dielectrics and isolation structures, silicides/salicides, and metallization * Part III examines integrated devices, including complete planar DRAM, stacked cell DRAM, and trench cell DRAM, as well as SRAM as examples for process integration and development * Part IV emphasizes special applications, including TEM in advanced failure analysis, TEM in advanced packaging development and UBM (Under Bump Metallization) studies, and high-resolution TEM in microelectronics This innovative guide also provides engineers and managers in the microelectronics industry, as well as graduate students, with: * More than 1,100 TEM images to illustrate the science of ULSI * A historical introduction to the technology as well as coverage of the evolution of basic ULSI process problems and issues * Discussion of TEM in other advanced microelectronics devices and materials, such as flash memories, SOI, SiGe devices, MEMS, and CD-ROMs

Download or read book Dielectrics for Nanosystems written by and published by The Electrochemical Society. This book was released on 2004 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Polyphase Induction Motors Analysis written by Paul Cochran and published by CRC Press. This book was released on 2018-10-08 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Generously illustrated with over 1600 dispaly equations and more than 145 drawings, diagrams and photographs, this book is a handy, single-source reference suited to readers with a wide span of educational backgrounds and technical experience. Comprehensive in both scope and depth this manual covers all significant aspects of the field, such as Amperes Law and Faraday's Law, emphasing basic explanations of motor behaviour, derives all important equations and relationships required to analyze, design and apply polyphase induction motors, uses worldwide SI units or international MKS system of units as well as practical units used in the US and shows how to apply working equations to real-life situations with numerical examples... and more.

Download or read book Guidebook for Managing Silicon Chip Reliability written by Michael Pecht and published by CRC Press. This book was released on 2017-11-22 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.

Download or read book Dielectric Breakdown in Gigascale Electronics written by Juan Pablo Borja and published by Springer. This book was released on 2016-09-16 with total page 109 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.

Download or read book Defects in HIgh k Gate Dielectric Stacks written by Evgeni Gusev and published by Springer Science & Business Media. This book was released on 2006-01-27 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main goal of this book is to review at the nano and atomic scale the very complex scientific issues that pertain to the use of advanced high dielectric constant (high-k) materials in next generation semiconductor devices. One of the key obstacles to integrate this novel class of materials into Si nano-technology are the electronic defects in high-k dielectrics. It has been established that defects do exist in high-k dielectrics and they play an important role in device operation. The unique feature of this book is a special focus on the important issue of defects. The subject is covered from various angles, including silicon technology, processing aspects, materials properties, electrical defects, microstructural studies, and theory. The authors who have contributed to the book represents a diverse group of leading scientists from academic, industrial and governmental labs worldwide who bring a broad array of backgrounds (basic and applied physics, chemistry, electrical engineering, surface science, and materials science). The contributions to this book are accessible to both expert scientists and engineers who need to keep up with leading edge research, and newcomers to the field who wish to learn more about the exciting basic and applied research issues relevant to next generation device technology.

Download or read book Modern Aspects of Electrochemistry written by John O'M. Bockris and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: Number 25 of this acclaimed series breaks new ground with articles on charge transfer across liquid-liquid interfaces, electrochemical techniques to study hydrogen ingress in metals, and electrical breakdown of liquids. Also included are articles on the measurement of corrosion and ellipsometry, bringing these older subjects up to date.

Download or read book Reliability Wearout Mechanisms in Advanced CMOS Technologies written by Alvin W. Strong and published by John Wiley & Sons. This book was released on 2009-10-13 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

Download or read book Proceedings of the American Institute of Electrical Engineers written by and published by . This book was released on 1930 with total page 1080 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1887-1946 include the preprint pages of the institute's Transactions.

Download or read book Transistors Diodes and Solar Cells written by Shamus McNamara and published by Rising Dragon Books. This book was released on 2024-08-12 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor devices are present everywhere in modern society. Understanding them is critical for anyone pursuing a career in areas such as semiconductor processing, electrical circuit design, VLSI design, power engineering, and solid-state sensors. Students with a background in electrical engineering, material science, physics, process engineering, or nanotechnology will all find this book useful. This textbook starts with a description of what a semiconductor is and proceeds to describe how semiconductor devices work. The semiconductor devices covered include the MOSFET, diode, LED, solar cell, power MOSFET, and IGBT. The book focuses on an understanding of the key concepts. This book is written for use in the classroom or for self-study and includes numerous examples that are clearly worked out. The author brings years of teaching experience breaking down complicated topics and making them easy to understand without sacrificing the level of the content.

Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1931 with total page 1366 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Abstracts of Scientific and Technical Publications written by Massachusetts Institute of Technology and published by . This book was released on 1928 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electric Contacts written by and published by . This book was released on 1965 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Insulating Materials for Design and Engineering Practice written by Frank M. Clark and published by . This book was released on 1962 with total page 1242 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Statistical Physics of Fracture and Breakdown in Disordered Systems written by Bikas K. Chakrabarti and published by Oxford University Press. This book was released on 1997 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: Under extreme conditions the mechanical or electrical properties of solids tend to destabilize, leading to failure or breakdown. These instabilities often nucleate or spread from disorders in the structure of the solid. This book by two experts in the field investigates current techniques for modeling these failure and breakdown processes. It illustrates the basic modeling principles through a series of computer and laboratory simulations and `table top' experiments. The book centers on three important case studies: electrical failures like fuse and dielectric breakdown; mechanical fractures; and earthquakes, which exhibit dynamic failure. The material will interest all graduate students and researchers studying disordered systems, whether their focus is the mechanical failure of solids, the electrical breakdown of conductors, or earthquake mechanics.

Download or read book Branches written by Philip Ball and published by Oxford University Press. This book was released on 2011-05-26 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Nature's patterns is a trilogy composed of Shapes, Flow, and Branches."