Download or read book Thickness Measurements of Thin Films by Multiple beam Interferometry written by T. W. Bartlett and published by . This book was released on 1954 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Multiple beam Interference Microscopy of Metals written by Samuel Tolansky and published by . This book was released on 1970 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optical Interferometry 2e written by P. Hariharan and published by Academic Press. This book was released on 2003-09-22 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Download or read book Multiple beam Interferometry of Surfaces and Films written by Samuel Tolansky and published by . This book was released on 1970 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Multiple Beam Interferometry for Small Step Measurement written by John William Beck and published by . This book was released on 1961 with total page 84 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Basics of Interferometry written by P. Hariharan and published by Academic Press. This book was released on 2012-12-02 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Download or read book Measurement Techniques for Thin Films written by Bertram Schwartz and published by . This book was released on 1967 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book National Bureau of Standards Miscellaneous Publication written by and published by . This book was released on 1964 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Miscellaneous Publication National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1934 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Optical Shop Testing written by Daniel Malacara and published by John Wiley & Sons. This book was released on 2007-08-03 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Download or read book IUTAM Symposium on Elastohydrodynamics and Micro elastohydrodynamics written by R.W. Snidle and published by Springer Science & Business Media. This book was released on 2006-10-03 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the IUTAM Symposium on Elastohydrodynamics and Microelastohydrodynamics held in Cardiff from 1-3 September 2004. It contains 31 articles by leading researchers in the field. The symposium focused on theoretical, experimental and computational issues in elastohydrodynamic lubrication (EHL) both in relation to smooth surfaces and in situations where the film is of the same order or thinner than the surface roughness (micro-EHL). The last IUTAM Symposium in this general area of contact of deformable bodies was in 1974. The emphasis in the Symposium was upon fundamental issues such as: solution methods; lubricant rheological models, thermal effects; both low and high elastic modulus situations; human and replacement joints; fluid traction; dynamic effects, asperity lubrication and the failure of lubrication; surface fatigue and thermal distress under EHL conditions. The book will be useful to those active in basic elastohydrodynamics research who wish to gain an up-to-date understanding of the subject from leading experts in the field.
Download or read book Dimensional Metrology Subject classified with Abstracts Through 1964 written by and published by . This book was released on 1966 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Measurement and Sensor Systems written by Alexander W. Koch and published by Springer Nature. This book was released on 2023-01-01 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers both the physical properties of sensors for converting physical quantities into digital data and the design of complex measurement and data analyzing systems. In respect thereof, a unique treatment of measurement and sensor systems is given from a physical point of view, wherein a focus is on innovative links between physics and engineering sciences. The acquisition of data by measurement systems equipped with appropriate sensors is a fundamental activity in science and industry. In a connected world, the field of measurement and sensor systems can be regarded as an enabling technology for other fields of research and development, e.g., for electronics, chemistry, biology, and environmental monitoring. The book is divided into eleven chapters, each chapter starting with a discussion of measurement systems based on the relevant sensor concept followed by an in-depth description of the data processing and analysis procedures. After an introduction presenting fundamentals of measurement systems, digital measurement systems are addressed in detail. Then, operational amplifiers and measurement bridges as well as measurement signal processing methods are presented. After discussing transducers based on ohmic, capacitive, and inductive effects, temperature measurement systems are described. A separate chapter is devoted to optical measurement and sensor systems which represent a field of increasing importance.
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fundamentals of Tribology and Bridging the Gap Between the Macro and Micro Nanoscales written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 961 pages. Available in PDF, EPUB and Kindle. Book excerpt: The word tribology was fIrst reported in a landmark report by P. Jost in 1966 (Lubrication (Tribology)--A Report on the Present Position and Industry's Needs, Department of Education and Science, HMSO, London). Tribology is the science and technology of two interacting surfaces in relative motion and of related subjects and practices. The popular equivalent is friction, wear and lubrication. The economic impact of the better understanding of tribology of two interacting surfaces in relative motion is known to be immense. Losses resulting from ignorance of tribology amount in the United States alone to about 6 percent of its GNP or about $200 billion dollars per year (1966), and approximately one-third of the world's energy resources in present' use, appear as friction in one form or another. A fundamental understanding of the tribology of the head-medium interface in magnetic recording is crucial to the future growth of the $100 billion per year information storage industry. In the emerging microelectromechanical systems (MEMS) industry, tribology is also recognized as a limiting technology. The advent of new scanning probe microscopy (SPM) techniques (starting with the invention of the scanning tunneling microscope in 1981) to measure surface topography, adhesion, friction, wear, lubricant-fIlm thickness, mechanical properties all on a micro to nanometer scale, and to image lubricant molecules and the availability of supercomputers to conduct atomic-scale simulations has led to the development of a new fIeld referred to as Microtribology, Nanotribology, or Molecular Tribology (see B. Bhushan, J. N. Israelachvili and U.
Download or read book Materials and Processes of Electron Devices written by Max Knoll and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Download or read book Thin Film Fundamentals written by A. Goswami and published by New Age International. This book was released on 1996 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt: Even Though Thin Solid Films Have Found Tremendous Applications In Electronic, Optical And Other Industries The Basic Concepts About Them Have Often Been Taken Similar To Those Of The Bulk Materials From Which Films Are Prepared And These Need Not Be So. This Book Is Intended To Serve As A Guide To Students, Beginners And Research Workers Interested In This Field.The Basic Science Behind Thin Solid Films Has Been Described With Special Reference To Nucleation, Structures Of Films, Their Growth Process, Phase Transitions, Behaviour Of Films Under Electrical, Electromagnetic And Other Fields With Film Thickness, Temperatures Etc. Characteristic Behaviour Of Films, Different From Bulk, Can Often Be Related To Nearly Two-Dimensional Nature Of Films And Also To The Presence Of Factors Such As Surface States, Contact Potential, High Defect Concentration, Creation Of New Energy Levels, In-Homogeneities, Discontinuities Or Gaps, Etc. Which Are More Often Less Significant In Bulk Materials. Special Techniques Used For Measuring Thin Film Properties And Also Precautions To Be Taken Have Been Given In Details. This Book Also Includes Many Useful Relations Otherwise Scattered In Literatures And Also A Good Number Of References Though Not Complete But Relevant To The Topics Discussed.
