Download or read book The Study of Electromigration Reliability by the Use of 1 f and 1 f Noise Measurements in Thin Metal Films written by Phinese Oren Barkley and published by . This book was released on 1993 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Physical Properties of Thin Metal Films written by G.P. Zhigal'skii and published by CRC Press. This book was released on 2003-07-10 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Download or read book IEEE Proceedings of the Southeastcon written by and published by . This book was released on 1992 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability of Compound Analogue Semiconductor Integrated Circuits written by Aris Christou and published by RIAC. This book was released on 2006 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Noise In Physical Systems And 1 f Fluctuations Proceedings Of The 13th International Conference written by Vytautas Bareikis and published by World Scientific. This book was released on 1995-04-26 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.
Download or read book Quantum 1 F Noise Other Low Frequency Fluctuations in Electronic Devices written by American Institute of Physics and published by A I P Press. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text contains the papers from the fifth Symposium in the sequence of quantum 1/f noise. The scope of the conference includes quantum 1/f noise, other low frequency fluctuations in electronic devices and their relation to fundamental 1/f noise.
Download or read book 1 f Noise and Electromigration in A1 Ti Thin Films written by James N. Bisnett and published by . This book was released on 1986 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1985 written by and published by . This book was released on 1985 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Electronics and Electron Physics written by and published by Academic Press. This book was released on 1993-11-17 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Electronics and Electron Physics
Download or read book IEEE International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1997 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Materials Reliability in Microelectronics II Volume 265 written by C. V. Thompson and published by . This book was released on 1992-09-30 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Download or read book Electromigration Studies on Al alloy Thin Film Conductors by Means of 1 f Noise Measurements and High resolution Resistance Experiments written by Jan Richard Kraayeveld and published by . This book was released on 1995 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Materials Reliability in Microelectronics written by and published by . This book was released on 1992 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Materials Reliability in Microelectronics III Volume 309 written by Kenneth P. Rodbell and published by . This book was released on 1993-08-31 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Download or read book Proceedings written by and published by . This book was released on 1992 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Effect of Electromigration of 1 f Noise of Thin Film Conductor written by Tuck Pao Djeu and published by . This book was released on 1984 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Noise as a Tool for Studying Materials written by Michael B. Weissman and published by SPIE-International Society for Optical Engineering. This book was released on 2003 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt:
