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Book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan Moore Henry Walker and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Download or read book Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan Moore Henry Walker and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1992 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana

Download or read book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by IEEE Computer Society and published by . This book was released on 1995 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR.

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by Israel Koren and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.

Book Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Download or read book Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan M. Walker and published by IEEE Computer Society. This book was released on 1992 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect a

Book Proceedings

Download or read book Proceedings written by and published by . This book was released on 2003 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by C.H. Stapper and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.

Book Proceedings 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Download or read book Proceedings 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1996 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 39 papers cover avoiding defects, predicting yield, enhancing yield and reliability, layout-driven tests, analyzing process data, tests and diagnosis, designing self-tests and self- checking, fault-tolerant structures, synthesizing reliable circuits, and approaches to fault-tolerance. The gathering was the latest in an annual series that began in 1988 and has become recognized as the major international forum for researchers and practitioners to discuss defect and fault tolerance at the integrated circuit level. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR

Book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana

Download or read book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1998 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana

Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by IEEE Computer Society and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Defect and Fault Tolerance in VLSI Systems

Download or read book Defect and Fault Tolerance in VLSI Systems written by Israel Koren and published by Springer. This book was released on 1989-08-01 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.