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Book The Fundamentals of Digital Semiconductor Testing

Download or read book The Fundamentals of Digital Semiconductor Testing written by Guy Perry and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Principles of Semiconductor Network Testing

Download or read book Principles of Semiconductor Network Testing written by Amir Afshar and published by Elsevier. This book was released on 1996-04-22 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing

Book ISTFA 2010

Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book The Fundamentals of Digital Semiconductor Testing

Download or read book The Fundamentals of Digital Semiconductor Testing written by Guy Perry and published by . This book was released on 1996-03-01 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Opportunities in Electronics Careers

Download or read book Opportunities in Electronics Careers written by Mark Rowh and published by McGraw Hill Professional. This book was released on 1999 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Energize your job search!. . Get started in a career that has a promising future and is financially rewarding. "Opportunities in Electronics Careers" provides you with a complete overview of the job possibilities, salary figures, and experience required to enter the field of electronics.. . This career-boosting book will help you: . Determine the focus that's right for you, from designing to repairing to operating electronics equipment . Acquire in-depth knowledge of the electronics industry . Find out what kind of salary you can expect. Understand the daily routine of your chosen field. Focus your job search using industry resources. . . ENJOY A GREAT CAREER AS AN: . . repair specialist * electronics tester * design engineer * inspector * utility worker * service technician.

Book The Fundamentals of Mixed Signal Testing

Download or read book The Fundamentals of Mixed Signal Testing written by Brian Lowe and published by . This book was released on 2002 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Essentials of Electronic Testing for Digital  Memory and Mixed Signal VLSI Circuits

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Book Fundamentals of Digital Switching

Download or read book Fundamentals of Digital Switching written by John C. McDonald and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication of the first edition of Fundamentals of Digital Switching in 1983, there has been substantial improvement in digital switching technology and in digital networks. Packet switching has advanced from a low-speed data-oriented switching approach into a robust broadband technology which supports services ranging from low-speed data to video. This technology has eclipsed the flexibility of circuit switching. Fiber optic cable has advanced since the first edition and has substantially changed the technology of transmission. to research in optical devices to find a still better means of This success has led switching. Digital switching systems continue to benefit from the 100-fold improvement in the capabilities of semiconductor devices which has occurred during the past decade. The chip industry forecasts a similar escalation in complexity during the next 10 years. Networks of switching systems have changed due to regulatory policy reform in many nations, including the breakup of the Bell System in the United States, the introduction of new types of carriers in Japan, competition in the United Kingdom, and a reexamination of public policy in virtually all nations. Standards bodies have been productive in specifying new capabilities for future networks involving interactive and distributive services through STM and A TM technologies.

Book Testing of Digital Systems

Download or read book Testing of Digital Systems written by Niraj K. Jha and published by . This book was released on 2003 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt: The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Book ESD Testing

Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-10-07 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

Book Fundamentals of Semiconductor Manufacturing and Process Control

Download or read book Fundamentals of Semiconductor Manufacturing and Process Control written by Gary S. May and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.

Book EBOOK  Fundamentals of Digital Logic

Download or read book EBOOK Fundamentals of Digital Logic written by Stephen Brown and published by McGraw Hill. This book was released on 2008-07-16 with total page 958 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamentals of Digital Logic with VHDL Design teaches the basic design techniques for logic circuits. The text ptovides a clear and easily understandable discussion of logic circuit design without the use of unnecessary formalism. It emphasizes the synthesis of circuits and explains how circuits are implemented in real chips. Fundamental concepts are illustrated by using small examples, which are easy to understand. Then, a modular approach is used to show how larger circuits are designed. VHDL is a complex language so it is introduced gradually in the book. Each VHDL feature is presented as it becomes pertinent for the circuits being discussed. While it includes a discussion of VHDL, the book provides thorough coverage of the fundamental concepts of logic circuit design, independent of the use of VHDL and CAD tools. A CD-ROM containg all of the VHDL design examples used in the book, as well Altera's Quartus II CAD software, is included free with every text.

Book Testing of Digital Systems

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Book Semiconductor Testing

    Book Details:
  • Author : Ramakrishna shanbhag
  • Publisher :
  • Release : 2019-03-15
  • ISBN : 9781090600523
  • Pages : 64 pages

Download or read book Semiconductor Testing written by Ramakrishna shanbhag and published by . This book was released on 2019-03-15 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gives basic overview of a semiconductor testing. The modern world is pure outcome of a huge revolution in the fireld of electronics. The Integrated Circuit is the heart of all modern devices. There are very few companies which design, test and sell these ICs. Testing of these ICs is different from other testing. So, this book is an attempt to give basic overview on testing.

Book Guide to the Evaluation of Educational Experiences in the Armed Services

Download or read book Guide to the Evaluation of Educational Experiences in the Armed Services written by American Council on Education and published by . This book was released on 1978 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Digital Communications Test and Measurement

Download or read book Digital Communications Test and Measurement written by Dennis Derickson and published by Pearson Education. This book was released on 2007-12-10 with total page 1240 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM