Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1979 with total page 1132 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1977 with total page 746 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microelectronic test pattern NBS 3 for evaluating the resistivity dopaut density relationship of silicon written by Martin G. Buehler and published by . This book was released on 1976 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1976 with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Catalog of National Bureau of Standards Publications 1966 1976 written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Catalog of National Bureau of Standards Publications 1966 1976 pt 1 Citations and abstracts v 2 pt 1 Key word index A through L v 2 pt 2 Key word index M through Z written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards 1976 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Yield Modelling and Defect Tolerance in VLSI Papers Presented at the INT Workshop on Designing for Yield 1 3 July 1987 Oxford written by Will Moore and published by CRC Press. This book was released on 1988 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield l

Download or read book Publications of the National Bureau of Standards 1987 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1988 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1976 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Guide to NIST National Institute of Standards and Technology written by DIANE Publishing Company and published by DIANE Publishing. This book was released on 1997-07 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gathers in one place descriptions of NIST's many programs, products, services, and research projects, along with contact names, phone numbers, and e-mail and World Wide Web addresses for further information. It is divided into chapters covering each of NIST's major operating units. In addition, each chapter on laboratory programs includes subheadings for NIST organizational division or subject areas. Covers: electronics and electrical engineering; manufacturing engineering; chemical science and technology; physics; materials science and engineering; building and fire research and information technology.