Download or read book The Determination of Oxygen Content in Titanium Foils by Proton Microanalysis written by Bing Kwong Mak and published by . This book was released on 1967 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Report on the Spectrographic Determination of Oxygen in Titanium written by R. E. Heffelfinger and published by . This book was released on 1958 with total page 26 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Measurement of Oxygen Contamination in Titanium Alloy Ingots by Fast Neutron Activation Analysis written by Adel Abusamra and published by . This book was released on 1982 with total page 23 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this report, the determination of oxygen content of titanium alloy - 6211 - will be demonstrated with a great deal of accuracy and reliability. The ultimate goal is to develop a safe and reliable portable unit that can measure oxygen levels in titanium or metallic welds, and indicate whether to accept such a weld or reject it based on its oxygen content.

Download or read book Union List of Higher Degree Theses in Australian University Libraries written by and published by . This book was released on 1966 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1971 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1975 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1971 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1971 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Energy Research Abstracts written by and published by . This book was released on 1988 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1973 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book INIS Atomindex written by and published by . This book was released on 1985 with total page 1364 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards 1970 written by Betty L. Oberholtzer and published by . This book was released on 1971 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1972 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Surface Analysis by XPS and AES written by John F. Watts and published by John Wiley & Sons. This book was released on 2019-08-27 with total page 307 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

Download or read book Physics Briefs written by and published by . This book was released on 1991 with total page 1806 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.