Download or read book The 1988 International Test Conference written by and published by . This book was released on 1990 with total page 110 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special issue on the 1988 International Test Conference written by and published by . This book was released on 1990 with total page 110 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Special Issue on the 1988 International Test Conference written by Vinod K. Agarwal and published by . This book was released on 1990 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Conference ITC 19th International 1988 written by IEEE Computer Society Press and published by . This book was released on 1988 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Conference held Sept. 1988. Covers new work in test hardware, fault simulation, and testability standards; also, quality, yield, and the cost of testing, and designing for testability. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book New Frontiers in Testing written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Test Conference 1992 written by Institute of Electrical and Electronics Engineers and published by Conference. This book was released on 1992 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation The proceedings of the 23rd edition of the premier technical conference on electronic testing, held in Baltimore, Maryland, September 1992, comprise papers, panels, and tutorials in the areas of design and test integration; test management; software; test hardware; device, assembly, and system test; and IEEE test standards. ITC's 1992 theme, Discover the New World of Test and Design, reflects the growing emphasis on tighter integration of test and design to assure the highest quality products. No subject index. Ruggedly bound for heavy use. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures written by International Conference on Microelectronic Test Structures (1, 1988, Long Beach, Calif.) and published by . This book was released on 1986 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS written by and published by . This book was released on 1988 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the IEEE International Conference on Microelectronic Test Structures written by International Conference on Microelectronic Test Structures and published by . This book was released on 1988 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Download or read book Dependable Computing EDCC 1 written by Klaus Echtle and published by Springer Science & Business Media. This book was released on 1994-09-21 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger of two former European events on dependable computing. The volume comprises 34 refereed full papers selected from 106 submissions. The contributions address all current aspects of dependable computing and reflect the state of the art in dependable systems research and advanced applications; among the topics covered are hardware and software reliability, safety-critical and secure systems, fault-tolerance and detection, verification and validation, formal methods, hardware and software testing, and parallel and distributed systems.
Download or read book Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS written by and published by . This book was released on 1988 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Algorithm Design for Networked Information Technology Systems written by Sumit Ghosh and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: I felt deeply honored when Professor Sumit Ghosh asked me to write the foreword to his book with an extraordinary perspective. I have long admired him, ?rst as a student leader at Stanford, where he initiated the ?rst IEEE Computer Society’s student chapter, and later as an esteemed and inspiring friend whose transdisciplinary research broadened and enhanced the horizons of practitioners of computer science and engineering, including my own. His ideas, which are derived from his profound vision, deep critical thinking, and personal intuition, reach from information technology to bioscience, as - hibited in this excellent book. To me, an ordinary engineer, it opens up a panoramic view of the Universe of Knowledge that keeps expanding and - spiring,likethegoodIndianproverb,whichsays,“agoodbookinformsyou,an excellent book teaches you, and a great book changes you. ” I sincerely believe that Professor Ghosh’s book will help us change and advance the methods of systems engineering and technology. Vision Inspired vision sees ahead of others what will or may come to be, a vivid, imagined concept or anticipation. An inspired vision personi?es what is good and what like-minded individuals hope for. Our vision is one of creating an Internet of minds, where minds are Web sites or knowledge centers, which create, store, and radiate knowledge through interaction with other minds connected by a universal shared network. This vision will not just hasten the death of distance, but will also - carcerate ignorance.
Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Download or read book EDA for IC System Design Verification and Testing written by Louis Scheffer and published by CRC Press. This book was released on 2018-10-03 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.
Download or read book From Contamination to Defects Faults and Yield Loss written by Jitendra B. Khare and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
Download or read book International Test Conference 1991 written by and published by . This book was released on 1991 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
