Download or read book Test Generation for Boolean Expressions and Combinational Logic Circuits written by Hsun-Kang Su and published by . This book was released on 1989 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Practical Digital Logic Design and Testing written by Parag K. Lala and published by . This book was released on 1996 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.
Download or read book Reasoning in Boolean Networks written by Wolfgang Kunz and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonstrate their usefulness for today's industrially relevant problems. Reasoning in Boolean Networks provides lucid descriptions of basic algorithmic concepts in automatic test pattern generation, logic synthesis and verification and elaborates their intimate relationship to provide further intuition and insight into the subject. Numerous examples are provide for ease in understanding the material. Reasoning in Boolean Networks is intended for researchers in logic synthesis, VLSI testing and formal verification as well as for integrated circuit designers who want to enhance their understanding of basic CAD methodologies.
Download or read book Automatic Test Pattern Generation for Logic Circuits Using the Boolean Tree written by Taegwon Jeong and published by . This book was released on 1991 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Switching and Finite Automata Theory written by Zvi Kohavi and published by Cambridge University Press. This book was released on 2010 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understand the structure, behavior, and limitations of logic machines with this thoroughly updated third edition. Many new topics are included, such as CMOS gates, logic synthesis, logic design for emerging nanotechnologies, digital system testing, and asynchronous circuit design, to bring students up-to-speed with modern developments. The intuitive examples and minimal formalism of the previous edition are retained, giving students a text that is logical and easy to follow, yet rigorous. Kohavi and Jha begin with the basics, and then cover combinational logic design and testing, before moving on to more advanced topics in finite-state machine design and testing. Theory is made easier to understand with 200 illustrative examples, and students can test their understanding with over 350 end-of-chapter review questions.
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Download or read book High Quality Test Pattern Generation and Boolean Satisfiability written by Stephan Eggersglüß and published by Springer Science & Business Media. This book was released on 2012-02-01 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Download or read book Test Generation for Combinational Logic Circuits Using Information Theory written by Yusuf Murat Erten and published by . This book was released on 1983 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Pattern Generation using Boolean Proof Engines written by Rolf Drechsler and published by Springer Science & Business Media. This book was released on 2009-04-22 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Download or read book CASCON written by and published by . This book was released on 1993 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press (MA). This book was released on 1985-06-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.
Download or read book Datafair 73 written by and published by . This book was released on 1973* with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Automatic test pattern generation for combinational logic using the Boolean difference technique with binary decision diagrams written by Steve McMahan and published by . This book was released on 1987 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Pattern Generation for Combinational Logic Circuits written by Rajesh Raina and published by . This book was released on 1986 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital Electronics written by Anil K. Maini and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fundamentals and implementation of digital electronics are essential to understanding the design and working of consumer/industrial electronics, communications, embedded systems, computers, security and military equipment. Devices used in applications such as these are constantly decreasing in size and employing more complex technology. It is therefore essential for engineers and students to understand the fundamentals, implementation and application principles of digital electronics, devices and integrated circuits. This is so that they can use the most appropriate and effective technique to suit their technical need. This book provides practical and comprehensive coverage of digital electronics, bringing together information on fundamental theory, operational aspects and potential applications. With worked problems, examples, and review questions for each chapter, Digital Electronics includes: information on number systems, binary codes, digital arithmetic, logic gates and families, and Boolean algebra; an in-depth look at multiplexers, de-multiplexers, devices for arithmetic operations, flip-flops and related devices, counters and registers, and data conversion circuits; up-to-date coverage of recent application fields, such as programmable logic devices, microprocessors, microcontrollers, digital troubleshooting and digital instrumentation. A comprehensive, must-read book on digital electronics for senior undergraduate and graduate students of electrical, electronics and computer engineering, and a valuable reference book for professionals and researchers.
