Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Principles of VLSI and CMOS Integrated Circuits written by Jain Richa & Rai Amrita and published by S. Chand Publishing. This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: For B.E./B.Tech students of all Technical Universities. Microelectronics/VLSI Design is an emerging subject in the field of electronics in recent years. It is an introductory source to internal parts of electronics at minute level. This book is covering CMOS Design from a digital system level to circuit level and providing a background in CMOS Processing Technology. The book includes basic theortical knowledge as well as good engineering practice. This book is recommended for B.Tech., M.Tech. and diploma students of all Indian Universities and also useful for competitive examinations.

Download or read book Design Automation and Test in Europe written by Rudy Lauwereins and published by Springer Science & Business Media. This book was released on 2008-01-08 with total page 499 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.

Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book Proceedings of the European Test Conference written by and published by . This book was released on 1991 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Development of N version Software Samples for an Experiment in Software Fault Tolerance written by and published by . This book was released on 1987 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Concurrent and Comparative Discrete Event Simulation written by Ernst G. Ulrich and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.

Download or read book Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic written by Zuolu Wang and published by Springer Nature. This book was released on with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Oriented Testing for Nano Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Download or read book Big Data Driven Intelligent Fault Diagnosis and Prognosis for Mechanical Systems written by Yaguo Lei and published by Springer Nature. This book was released on 2022-10-19 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents systematic overviews and bright insights into big data-driven intelligent fault diagnosis and prognosis for mechanical systems. The recent research results on deep transfer learning-based fault diagnosis, data-model fusion remaining useful life (RUL) prediction, etc., are focused on in the book. The contents are valuable and interesting to attract academic researchers, practitioners, and students in the field of prognostics and health management (PHM). Essential guidelines are provided for readers to understand, explore, and implement the presented methodologies, which promote further development of PHM in the big data era. Features: Addresses the critical challenges in the field of PHM at present Presents both fundamental and cutting-edge research theories on intelligent fault diagnosis and prognosis Provides abundant experimental validations and engineering cases of the presented methodologies

Download or read book Official Gazette of the United States Patent and Trademark Office written by United States. Patent and Trademark Office and published by . This book was released on 2000 with total page 1392 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design of Dependable Computing Systems written by J.C. Geffroy and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 678 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book analyzes the causes of failures in computing systems, their consequences, as weIl as the existing solutions to manage them. The domain is tackled in a progressive and educational manner with two objectives: 1. The mastering of the basics of dependability domain at system level, that is to say independently ofthe technology used (hardware or software) and of the domain of application. 2. The understanding of the fundamental techniques available to prevent, to remove, to tolerate, and to forecast faults in hardware and software technologies. The first objective leads to the presentation of the general problem, the fault models and degradation mechanisms wh ich are at the origin of the failures, and finally the methods and techniques which permit the faults to be prevented, removed or tolerated. This study concerns logical systems in general, independently of the hardware and software technologies put in place. This knowledge is indispensable for two reasons: • A large part of a product' s development is independent of the technological means (expression of requirements, specification and most of the design stage). Very often, the development team does not possess this basic knowledge; hence, the dependability requirements are considered uniquely during the technological implementation. Such an approach is expensive and inefficient. Indeed, the removal of a preliminary design fault can be very difficult (if possible) if this fault is detected during the product's final testing.

Download or read book Economics of Electronic Design Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Download or read book ISTFA 2006 written by Electronic Device Failure Analysis Society and published by ASM International. This book was released on 2006 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt: