Download or read book Test Generation and Test Application Time Reduction for Sequential Circuits written by Soo Y. Lee and published by . This book was released on 1994 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Automatic Test Pattern Generator for Full Scan Sequential Circuits Using Limited Scan Operations written by Vinod Pagalone and published by . This book was released on 2006 with total page 83 pages. Available in PDF, EPUB and Kindle. Book excerpt: In testing sequential circuits with scan chains, the test application time is the main factor that determines the overall cost of testing the circuit. For these circuits, the test application time principally depends on the number flip-flops as well as the number of vectors in the test set. Though test set compaction is one way of reducing test application time, for a significant reduction in testing costs the duration of scan operation has to be reduced. The proposed method achieves this by using limited scan operations where the number of shifts is smaller that the actual length of the scan chain. Thus the compacted test set consists of limited scan operations in places where the scan operation cannot be dropped completely. The method uses an iterative procedure that identifies the vectors that have high fault coverage with minimal shifts in the scan chain.

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book Combinational Test Generation for Sequential Circuits written by Yong Chang Kim and published by . This book was released on 2002 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Test Pattern Generation Techniques that Target Low Test Application Time written by Arkan M. Abdulrahman and published by . This book was released on 2008 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: The dissertation investigates and proposes techniques to reduce test application time and time to market test requirements. Test generation techniques for logic and delay faults in digital circuits are presented. For logic defects, concurrent test generation in multi-core system on chip to reduce test application time is proposed. The single stuck-at fault model is considered. For timing defects, a compaction technique based on implicit path removal is proposed. The path delay fault model is considered. Also, a test generation technique for sequential (non-scan) circuits proposed.

Download or read book Test Pattern Generation and Test Application Time Reduction Algorithms for VLSI Circuits written by Ilker Hamzaoglu and published by . This book was released on 1999 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Automatic Test Pattern Generation Technique for Sequential Circuits Using Scan Applications written by Venkat N. Koripalli and published by . This book was released on 2006 with total page 74 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increase in speed and the shrinking of technology has led to modern day ICs becoming more sensitive to timing related defects. These defects must be rectified to prevent hazards in the circuit. The timing related defects can be identified with At-Speed Testing using the path delay fault model. A subset of the total number of paths known as critical paths cannot be sequentially activated i.e. we cannot find two successive vectors that activate a fault along the path. The elimination of untestable paths helps us to save a lot of time. In this report a new method, called the Launch-on-Shift is used to determine the testability of critical paths. The method uses a vector pair in which the first vector is the scan in steady state vector and the second vector is the function of the first vector.

Download or read book Modeling the Difficulty of Automatic Test Pattern Generation for Sequential Circuits written by Thomas E. Marchok and published by . This book was released on 1995 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "Several manufacturing challenges have accompanied the explosive growth in the scale of integration for VLSI circuits. One of these is the increased difficulty of generating manufacturing test sets, which has resulted from the vast increase in the ratio of the number of transistors to the number of I/O pins. The difficulty of test generation is crucial since it impacts both the resultant product quality and time to market, both of which continue to gain importance in the present day semiconductor industry. Design for testability (DFT) techniques can be used to offset this difficulty. The mechanics of such techniques are well understood. DFT techniques are also known to increase other manufacturing costs and to decrease performance. Thus the relevant issue facing designers is not how to use DFT, but rather if such techniques should be applied. The correct decision is a matter of economics. Integrated circuit (IC) designers must balance manufacturing costs, performance, time to market, and product quality concerns. Achieving the desired balance requires the ability to quantify trade-offs in the different manufacturing costs which various DFT techniques would affect. Unfortunately, test generation cost is among the least predictable of these affected costs, even though the principal reason that DFT techniques are often applied is to reduce the difficulty of test generation. Furthermore, there does not exist a complete understanding of which circuit attributes influence the difficulty of test generation. In this thesis, a model is developed which predicts the difficulty of automatic test generation for non-scan sequential circuits. This model is based on a newly recognized circuit attribute, termed density of encoding, which differs from those notions which have been used to describe this difficulty in the past. This thesis also discusses how the concept of the density of encoding can be applied to devise more powerful sequential automatic test pattern generation algorithms, more efficient DFT techniques, and more effective synthesis for testability schemes."

Download or read book Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation written by Kee Sup Kim and published by . This book was released on 1992 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Download or read book Time Efficient Automatic Test Pattern Generation Systems written by Byungse So and published by . This book was released on 1994 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press (MA). This book was released on 1985-06-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.

Download or read book Emerging Developments in the Power and Energy Industry written by Rodolfo Dufo-López and published by CRC Press. This book was released on 2019-10-31 with total page 1147 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power and Energy Engineering are important and pressing topics globally, covering issues such as shifting paradigms of energy generation and consumption, intelligent grids, green energy and environmental protection. The 11th Asia-Pacific Power and Energy Engineering Conference (APPEEC 2019) was held in Xiamen, China from April 19 to 21, 2019. APPEEC has been an annual conference since 2009 and has been successfully held in Wuhan (2009 & 2011), Chengdu (2010 & 2017), Shanghai (2012 & 2014), Beijing (2013 & 2015), Suzhou (2016) and Guilin (2018), China. The objective of APPEEC 2019 was to provide scientific and professional interactions for the advancement of the fields of power and energy engineering. APPEEC 2019 facilitated the exchange of insights and innovations between industry and academia. A group of excellent speakers have delivered keynote speeches on emerging technologies in the field of power and energy engineering. Attendees were given the opportunity to give oral and poster presentations and to interface with invited experts.

Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2000-08-09 with total page 1186 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Handbook of Semiconductor Manufacturing Technology describes the individual processes and manufacturing control, support, and infrastructure technologies of silicon-based integrated-circuit manufacturing, many of which are also applicable for building devices on other semiconductor substrates. Discussing ion implantation, rapid thermal processing, photomask fabrication, chip testing, and plasma etching, the editors explore current and anticipated equipment, devices, materials, and practices of silicon-based manufacturing. The book includes a foreword by Jack S. Kilby, cowinner of the Nobel Prize in Physics 2000 "for his part in the invention of the integrated circuit."

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Modified Pattern Generator of Built in Self Test for Sequential Circuits with Reduced Test Time written by Muhamad Ridzuan Radin Muhamad Amin and published by . This book was released on 2011 with total page 95 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Logic and Architecture Synthesis written by Gabriele Saucier and published by Springer. This book was released on 2016-01-09 with total page 381 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes several methods and systems solving one of the highlighted problems within computer aided design, namely architectural and logic synthesis. The book emphasises the most recent technologies in high level synthesis, concentrating on applicative studies and practical constraints or criteria during synthesis. Logic and Architecture Synthesis concentrates on the practical problems involving automatic synthesis of designs. It is essential reading for researchers and CAD Managers working in this area.