Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book Fault Diagnosis and Fault Tolerance written by Tinghuai Chen and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the rapid growth of integration scale of VLSI chips and the present need for reliable computers in space exploration, fault diagnosis and fault toleran ce have become more important than before, and hence reveal a lot of interest ing topics which attract many researchers to make a great number of contribu tions to this field. In recent years, many new and significant results have been achieved. A quick scan over the proceedings of the conferences on fault tolerant computing and design automation as well as on testing will convince the reader of that. But unfortunately these achievements have not been entire ly reflected in the textbooks, so that there seems to be a gap for the new researcher who already has the basic knowledge and wants to begin research in this area. As a remedy for this deficiency, this book is intended for begin ners, especially graduate students, as a textbook which will lead them to the frontier of some branches of the fault-tolerant computing field. The first chapter introduces the four-valued logic B4 and its applica tions. In 1966 Roth first proposed this four-valued logic as a technique to generate tests for logical circuits, but this work did not concern the mathe matical basis of B4 itself.
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Download or read book Assessing Fault Model and Test Quality written by Kenneth M. Butler and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.
Download or read book Formal Hardware Verification written by Thomas Kropf and published by Springer Science & Business Media. This book was released on 1997-08-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: This state-of-the-art monograph presents a coherent survey of a variety of methods and systems for formal hardware verification. It emphasizes the presentation of approaches that have matured into tools and systems usable for the actual verification of nontrivial circuits. All in all, the book is a representative and well-structured survey on the success and future potential of formal methods in proving the correctness of circuits. The various chapters describe the respective approaches supplying theoretical foundations as well as taking into account the application viewpoint. By applying all methods and systems presented to the same set of IFIP WG10.5 hardware verification examples, a valuable and fair analysis of the strenghts and weaknesses of the various approaches is given.
Download or read book Soft Computing and Signal Processing written by Jiacun Wang and published by Springer. This book was released on 2019-02-13 with total page 765 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book includes research papers on current developments in the field of soft computing and signal processing, selected from papers presented at the International Conference on Soft Computing and Signal Processing (ICSCSP 2018). It features papers on current topics, such as soft sets, rough sets, fuzzy logic, neural networks, genetic algorithms and machine learning. It also discusses various aspects of these topics, like technologies, product implementation, and application issues.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1979 with total page 734 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Download or read book Research in Progress written by and published by . This book was released on 1973 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Sequential Logic Testing and Verification written by Abhijit Ghosh and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.
Download or read book Proceedings written by and published by . This book was released on 1977 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Large Scale Integration Digital Testing written by T. F. Leedy and published by . This book was released on 1979 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book Computer Systems Reliability written by T. Anderson and published by CUP Archive. This book was released on 1979-07-31 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book FTCS 7 written by and published by . This book was released on 1977 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Architecture Design and Validation Methods written by Egon Börger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 363 pages. Available in PDF, EPUB and Kindle. Book excerpt: This state-of-the-art survey gives a systematic presentation of recent advances in the design and validation of computer architectures. The book covers a comprehensive range of architecture design and validation methods, from computer aided high-level design of VLSI circuits and systems to layout and testable design, including the modeling and synthesis of behavior and dataflow, cell-based logic optimization, machine assisted verification, and virtual machine design.
