Download or read book Terrestrial Neutron induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Download or read book Terrestrial Neutron induced Soft Error In Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008-03-28 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Download or read book Terrestrial Neutron induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients.The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.
Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer Science & Business Media. This book was released on 2010-11-08 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Download or read book CERN Courier written by European Organization for Nuclear Research and published by . This book was released on 2008 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This journal is devoted to the latest research on physics, publishing articles on everything from elementary particle behavior to black holes and the history of the universe.
Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2002 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Neutron Induced Soft Errors in Digital Surveillance Technology written by W. Rosenstock and published by . This book was released on 2001 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Cosmic Rays at Earth written by P.K.F. Grieder and published by Elsevier. This book was released on 2001-07-27 with total page 1117 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1912 Victor Franz Hess made the revolutionary discovery that ionizing radiation is incident upon the Earth from outer space. He showed with ground-based and balloon-borne detectors that the intensity of the radiation did not change significantly between day and night. Consequently, the sun could not be regarded as the sources of this radiation and the question of its origin remained unanswered. Today, almost one hundred years later the question of the origin of the cosmic radiation still remains a mystery.Hess' discovery has given an enormous impetus to large areas of science, in particular to physics, and has played a major role in the formation of our current understanding of universal evolution. For example, the development of new fields of research such as elementary particle physics, modern astrophysics and cosmology are direct consequences of this discovery. Over the years the field of cosmic ray research has evolved in various directions: Firstly, the field of particle physics that was initiated by the discovery of many so-called elementary particles in the cosmic radiation. There is a strong trend from the accelerator physics community to reenter the field of cosmic ray physics, now under the name of astroparticle physics. Secondly, an important branch of cosmic ray physics that has rapidly evolved in conjunction with space exploration concerns the low energy portion of the cosmic ray spectrum. Thirdly, the branch of research that is concerned with the origin, acceleration and propagation of the cosmic radiation represents a great challenge for astrophysics, astronomy and cosmology. Presently very popular fields of research have rapidly evolved, such as high-energy gamma ray and neutrino astronomy. In addition, high-energy neutrino astronomy may soon initiate as a likely spin-off neutrino tomography of the Earth and thus open a unique new branch of geophysical research of the interior of the Earth. Finally, of considerable interest are the biological and medical aspects of the cosmic radiation because of it ionizing character and the inevitable irradiation to which we are exposed. This book is a reference manual for researchers and students of cosmic ray physics and associated fields and phenomena. It is not intended to be a tutorial. However, the book contains an adequate amount of background materials that its content should be useful to a broad community of scientists and professionals. The present book contains chiefly a data collection in compact form that covers the cosmic radiation in the vicinity of the Earth, in the Earth's atmosphere, at sea level and underground. Included are predominantly experimental but also theoretical data. In addition the book contains related data, definitions and important relations. The aim of this book is to offer the reader in a single volume a readily available comprehensive set of data that will save him the need of frequent time consuming literature searches.
Download or read book IBM Journal of Research and Development written by and published by . This book was released on 1996 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Low Power and Reliable SRAM Memory Cell and Array Design written by Koichiro Ishibashi and published by Springer Science & Business Media. This book was released on 2011-08-18 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt: Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because issues about variability, leakage and reliability have to be taken into account for the design.
Download or read book Neutron Induced Failures in Semiconductor Devices written by and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing at the Speed of Light written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2018-07-08 with total page 89 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Download or read book Transactions of the American Nuclear Society written by American Nuclear Society and published by . This book was released on 1958 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:
