Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advanced Techniques for Embedded Systems Design and Test written by Juan C. López and published by Springer Science & Business Media. This book was released on 1998-02-28 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: As electronic technology reaches the point where complex systems can be integrated on a single chip, and higher degrees of performance can be achieved at lower costs, designers must devise new ways to undertake the laborious task of coping with the numerous, and non-trivial, problems that arise during the conception of such systems. On the other hand, shorter design cycles (so that electronic products can fit into shrinking market windows) put companies, and consequently designers, under pressure in a race to obtain reliable products in the minimum period of time. New methodologies, supported by automation and abstraction, have appeared which have been crucial in making it possible for system designers to take over the traditional electronic design process and embedded systems is one of the fields that these methodologies are mainly targeting. The inherent complexity of these systems, with hardware and software components that usually execute concurrently, and the very tight cost and performance constraints, make them specially suitable to introduce higher levels of abstraction and automation, so as to allow the designer to better tackle the many problems that appear during their design. Advanced Techniques for Embedded Systems Design and Test is a comprehensive book presenting recent developments in methodologies and tools for the specification, synthesis, verification, and test of embedded systems, characterized by the use of high-level languages as a road to productivity. Each specific part of the design process, from specification through to test, is looked at with a constant emphasis on behavioral methodologies. Advanced Techniques for Embedded Systems Design and Test is essential reading for all researchers in the design and test communities as well as system designers and CAD tools developers.
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Download or read book Power Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Download or read book Algorithms and Architectures for Parallel Processing written by Arrems Hua and published by Springer Science & Business Media. This book was released on 2009-07-10 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 9th International Conference on Algorithms and Architectures for Parallel Processing, ICA3PP 2009, held in Taipei, Taiwan, in June 2009. The 80 revised full papers were carefully reviewed and selected from 243 submissions. The papers are organized in topical sections on bioinformatics in parallel computing; cluster, grid and fault-tolerant computing; cluster distributed parallel operating systems; dependability issues in computer networks and communications; dependability issues in distributed and parallel systems; distributed scheduling and load balancing, industrial applications; information security internet; multi-core programming software tools; multimedia in parallel computing; parallel distributed databases; parallel algorithms; parallel architectures; parallel IO systems and storage systems; performance of parallel ditributed computing systems; scientific applications; self-healing, self-protecting and fault-tolerant systems; tools and environments for parallel and distributed software development; and Web service.
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Download or read book Logic Verification and Test Generation for VLSI Circuits written by Ruey-sing Wei and published by . This book was released on 1986 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI SoC Design for Reliability Security and Low Power written by Youngsoo Shin and published by Springer. This book was released on 2016-09-12 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Download or read book Official Gazette of the United States Patent and Trademark Office written by and published by . This book was released on 1995 with total page 876 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Parallel and Distributed Processing written by Jose Rolim and published by Springer Science & Business Media. This book was released on 1998-03-18 with total page 1194 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of 10 international workshops held in conjunction with the merged 1998 IPPS/SPDP symposia, held in Orlando, Florida, US in March/April 1998. The volume comprises 118 revised full papers presenting cutting-edge research or work in progress. In accordance with the workshops covered, the papers are organized in topical sections on reconfigurable architectures, run-time systems for parallel programming, biologically inspired solutions to parallel processing problems, randomized parallel computing, solving combinatorial optimization problems in parallel, PC based networks of workstations, fault-tolerant parallel and distributed systems, formal methods for parallel programming, embedded HPC systems and applications, and parallel and distributed real-time systems.
Download or read book Opto VLSI Devices and Circuits for Biomedical and Healthcare Applications written by Ankur Kumar and published by CRC Press. This book was released on 2023-09-04 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: The text comprehensively discusses the latest Opto-VLSI devices and circuits useful for healthcare and biomedical applications. It further emphasizes the importance of smart technologies such as artificial intelligence, machine learning, and the internet of things for the biomedical and healthcare industries. Discusses advanced concepts in the field of electro-optics devices for medical applications. Presents optimization techniques including logical effort, particle swarm optimization and genetic algorithm to design Opto-VLSI devices and circuits. Showcases the concepts of artificial intelligence and machine learning for smart medical devices and data auto-collection for distance treatment. Covers advanced Opto-VLSI devices including a field-effect transistor and optical sensors, spintronic and photonic devices. Highlights application of flexible electronics in health monitoring and artificial intelligence integration for better medical devices. The text presents the advances in the fields of optics and VLSI and their applicability in diverse areas including biomedical engineering and the healthcare sector. It covers important topics such as FET biosensors, optical biosensors and advanced optical materials. It further showcases the significance of smart technologies such as artificial intelligence, machine learning and the internet of things for the biomedical and healthcare industries. It will serve as an ideal design book for senior undergraduate, graduate students, and academic researchers in the fields including electrical engineering, electronics and communication engineering, computer engineering and biomedical engineering.
Download or read book Design systems for VLSI circuits written by Giovanni DeMicheli and published by Springer Science & Business Media. This book was released on 1987-07-31 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the NATO Advanced Study Institute, L'Aquila, Italy, July 7-18, 1986
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2001 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Download or read book ICAUTO 95 written by Pradip K. Chande and published by Allied Publishers. This book was released on 1995 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt:
