Download or read book Statistical Approach to VLSI written by Stephen W. Director and published by North Holland. This book was released on 1994 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all VLSI manufacturing processes. VLSI design today cannot be performed without taking into account economic-related issues such as yield, cost and performance oriented tradeoffs. The book includes practical methods relevant to real life applications. It contains edited papers by top industrial and academic specialists in the field. These papers describe all three categories of CAD tools employed for statistical design: IC performance optimization tools, process simulation tools and tools for characterization of process fluctuations. In each category both practical approaches and more theoretical approaches are presented.
Download or read book Statistical Analysis and Optimization for VLSI Timing and Power written by Ashish Srivastava and published by Springer Science & Business Media. This book was released on 2006-04-04 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by Ruijing Shen and published by Springer Science & Business Media. This book was released on 2014-07-08 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Download or read book Path Delay Faults in VLSI Circuits written by Mustapha M. Hamad and published by . This book was released on 1995 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Statistical Analysis and Optimization for VLSI Timing and Power written by Ashish Srivastava and published by Springer Science & Business Media. This book was released on 2005-06-21 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Download or read book Advanced Symbolic Analysis for VLSI Systems written by Guoyong Shi and published by Springer. This book was released on 2014-06-19 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.
Download or read book Statistical Analysis and Optimization for VLSI Timing and Power written by Ashish Srivastava and published by Springer. This book was released on 2008-11-01 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
Download or read book Statistical Analysis and Design Techniques for Analog VLSI Circuits written by Hing-yan To and published by . This book was released on 1995 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Statistical Modeling for Computer Aided Design of MOS VLSI Circuits written by Christopher Michael and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.
Download or read book Application of Statistical Techniques to VLSI Technology Computer aided Design written by Shahin Sharifzadeh-Moghaddam and published by . This book was released on 1989 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs written by and published by Springer. This book was released on 2012-03-21 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Moment Method for Statistical Analysis of High Speed VLSI Interconnects written by Lena Le Li and published by . This book was released on 1995 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Moment Method for Statistical Analysis of High Speed VLSI Interconnects microform written by Lena Le Li and published by National Library of Canada = Bibliothèque nationale du Canada. This book was released on 1996 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design for Manufacturability and Statistical Design written by Michael Orshansky and published by Springer Science & Business Media. This book was released on 2007-10-28 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 1988-11-30 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987
Download or read book A Statistical Performance Simulation Methodology for VLSI Circuits written by Michael Eugene Orshansky and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Probabilistic and Statistical Sampling Techniques for Efficient Power Estimation in VLSI Circuits written by Chih-Shun Ding and published by . This book was released on 1998 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
