Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2000 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 773 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Download or read book Designing Correct Circuits written by Geraint Jones and published by Springer Science & Business Media. This book was released on 2013-12-14 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings contain the papers presented at a workshop on Designing Correct Circuits, jointly organised by the Universities of Oxford and Glasgow, and held in Oxford on 26-28 September 1990. There is a growing interest in the application to hardware design of the techniques of software engineering. As the complexity of hardware systems grows, and as the cost both in money and time of making design errors becomes more apparent, so there is an eagerness to build on the success of mathematical techniques in program develop ment. The harsher constraints on hardware designers mean both that there is a greater need for good abstractions and rigorous assurances of the trustworthyness of designs, and also that there is greater reason to expect that these benefits can be realised. The papers presented at this workshop consider the application of mathematics to hardware design at several different levels of abstraction. At the lowest level of this spectrum, Zhou and Hoare show how to describe and reason about synchronous switching circuits using UNilY, a formalism that was developed for reasoning about parallel programs. Aagaard and Leeser use standard mathematical tech niques to prove correct their implementation of an algorithm for Boolean simplification. The circuits generated by their formal synthesis system are thus correct by construction. Thuau and Pilaud show how the declarative language LUSTRE, which was designed for program ming real-time systems, can be used to specify synchronous circuits.

Download or read book Asian Test Symposium written by and published by . This book was released on 2004 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digest of Technical Papers written by and published by . This book was released on 1987 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Unified On chip Transformation Framework for Cost effective SOC Test written by Ozgur Sinanoglu and published by . This book was released on 2004 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings International Symposium on VLSI Design written by and published by . This book was released on 1997 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Computer Control Abstracts written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Dissertation Abstracts International written by and published by . This book was released on 2002 with total page 858 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 1860 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1990 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 15th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1997 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sixty-two proceedings papers and eight panel sessions from the April 1997 symposium exploring the difficulties inherent in testing electronic systems and providing innovative solutions to those problems. The papers span the key testing areas such as core and processor testing, delay test and diagnosis, RAM testing, BIST, scan and boundary scan, current testing (IDDQ), analog and mixed signal testing, verification, and debugging. Additionally, new emerging processes were presented, describing thermal and elevated voltage tests, and power dissipation during test. Lacks an index. Annotation copyrighted by Book News, Inc., Portland, OR.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1990 with total page 1036 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book Mathematical Reviews written by and published by . This book was released on 1980 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt: