Download or read book Specular and Diffuse X ray Scattering from Surfaces and Interfaces written by and published by . This book was released on 1991 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Specular and Diffuse X ray Scattering from Surfaces and Interfaces written by and published by . This book was released on 1991 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray and neutron scattering studies of surfaces and interfaces have become increasingly popular over that last few year due to the recent developments in both scattering techniques and high intensity sources, particularly synchrotron x-ray sources. Although detailed characterization of any interface requires understanding of scattering both at small angles and in the (wide angle) Bragg reflection regime, as shall restrict ourselves here to discussing only the small angle region. Despite fundamental differences in the basic interactions between x-rays (or neutrons) with atoms, most of the analysis of our x-ray scattering results presented here can be used for neutron studies, with minor modifications. Although it should be mentioned here that current synchrotron x-ray sources are several orders of magnitude more intense than neutron sources and as a result for relatively smooth solid surface specular reflectivity can be measured down to 10−9 with x-rays where as for neutrons this value is (approximately) 10−6 before the measured intensity is buried with diffuse scattering and other background. As we shall discuss, this reduces the resolution with which one can determine density profile at an interface. The plan of this talk is as follows. After giving a brief outline of this method, we shall discuss out results on liquid surfaces first, and then we shall analyze specular and diffuse scattering data of multilayer interfaces. Finally we demonstrate a new method of anomalous reflectivity to determine electron density profiles of thin films in a model independent way.
Download or read book Specular and Diffuse X ray Scattering Studies of Surfaces and Interfaces written by John Matthew Hudson and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book X ray and Neutron Reflectivity written by Jean Daillant and published by Springer. This book was released on 2008-11-19 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .
Download or read book X Ray and Neutron Reflectivity Principles and Applications written by Jean Daillant and published by Springer Science & Business Media. This book was released on 2003-07-01 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Download or read book Liquid Surfaces and Interfaces written by Peter S. Pershan and published by Cambridge University Press. This book was released on 2012-08-02 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: The availability of synchrotron x-ray sources and the subsequent developments described in this book have led to substantial progress in our understanding of molecular ordering at liquid interfaces. This practical guide enables graduate students and researchers working in physics, chemistry, biology and materials science to understand and carry out experimental investigations into the basic physical and chemical properties of liquid surfaces and interfaces. The book examines the surfaces of bulk liquids, thin wetting films and buried liquid-liquid interfaces. It discusses experiments on simple and complex fluids, including pure water and organic liquids, liquid crystals, liquid metals, electrified liquid-liquid interfaces and interfacial monolayers of amphiphiles, nanoparticles, polymers and biomolecules. A detailed description of the apparatus and techniques required for these experiments is provided, and theoretical approaches to data analysis are described, including approximate methods such as the Master formula, the Born approximation, Parratt's algorithm and the Distorted Wave Approximation.
Download or read book Liquid Surfaces and Interfaces written by Peter S. Pershan and published by Cambridge University Press. This book was released on 2012-08-02 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide for graduate students and researchers on all aspects of x-ray scattering experiments on liquid surfaces and interfaces.
Download or read book Polymer Surfaces and Interfaces written by Manfred Stamm and published by Springer Science & Business Media. This book was released on 2008-01-26 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: In what is an extremely practical and applicable new work, experts provide concise explanations, with examples and illustrations, of the key techniques in this important field. In each case, after basic principles have been reviewed, applications of the experimental techniques are discussed and illustrated with specific examples. Scientists and engineers in research and development will benefit from an application-oriented book that helps them to find solutions to both fundamental and applied problems. They will know that the surfaces and interfaces of polymers play an important role in most of the application areas of polymers, from moulds, foils, and composites, to biomaterials and applications in micro- and nanotechnology.
Download or read book Surface X Ray and Neutron Scattering written by Hartmut Zabel and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: Owing to the increased availability of synchrotron sources, surface X-ray scattering is a rapidly expanding technique with important applications to surface structures and surface phase transitions, roughening of surfaces and interfaces, and the structure of liquid surfaces, including polymers, liquid crystals, and organic films. Surface studies with neutrons, on the other hand provide important information on liquid andmagnetic films. The contributions to this volume, written by active researchers in the field, provide an up-to-date overview of the highly sophisticated techniques and their applications.
Download or read book X ray Scattering From Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2000-10-27 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a
Download or read book Diffuse Scattering and the Fundamental Properties of Materials written by Rozaliya I. Barabash and published by Momentum Press. This book was released on 2009 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Beginning with a concise review of the physics and chemistry of polymers and their structure and morphology, this book goes on to describe and explain the common methods of characterizing polymers, including optical microscopy, scanning electron microscopy and transmission electron microscopy, among others. Also covered are the characterization and modification of such surface properties as adhesion, wetting, tribology, and surface thermodynamics.
Download or read book High Resolution X Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Download or read book X ray Scattering From Semiconductors 2nd Edition written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1992 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Local Structure from Diffraction written by S.J.L. Billinge and published by Springer Science & Business Media. This book was released on 2006-02-04 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.
Download or read book Off specular X ray Scattering Studies of the Morphology of Thin Films written by and published by . This book was released on 1996 with total page 17 pages. Available in PDF, EPUB and Kindle. Book excerpt: We discuss the scattering of x-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.
Download or read book Theoretical Concepts of X Ray Nanoscale Analysis written by Andrei Benediktovich and published by Springer Science & Business Media. This book was released on 2013-09-07 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
