Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the 2000 Congress on Evolutionary Computation written by and published by . This book was released on 2000 with total page 802 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Download or read book Evolvable Systems From Biology to Hardware written by Julian Miller and published by Springer Science & Business Media. This book was released on 2000-03-29 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Download or read book Evolvable Systems From Biology to Hardware written by Julian F. Miller and published by Springer. This book was released on 2003-06-29 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Download or read book Computational Logic CL 2000 written by John Lloyd and published by Springer. This book was released on 2003-06-26 with total page 1399 pages. Available in PDF, EPUB and Kindle. Book excerpt: These are the proceedings of the First International Conference on Compu- tional Logic (CL 2000) which was held at Imperial College in London from 24th to 28th July, 2000. The theme of the conference covered all aspects of the theory, implementation, and application of computational logic, where computational logic is to be understood broadly as the use of logic in computer science. The conference was collocated with the following events: { 6th International Conference on Rules and Objects in Databases (DOOD 2000) { 10th International Workshop on Logic-based Program Synthesis and Tra- formation (LOPSTR 2000) { 10th International Conference on Inductive Logic Programming (ILP 2000). CL 2000 consisted of seven streams: { Program Development (LOPSTR 2000) { Logic Programming: Theory and Extensions { Constraints { Automated Deduction: Putting Theory into Practice { Knowledge Representation and Non-monotonic Reasoning { Database Systems (DOOD 2000) { Logic Programming: Implementations and Applications. The LOPSTR 2000 workshop constituted the program development stream and the DOOD 2000 conference constituted the database systems stream. Each stream had its own chair and program committee, which autonomously selected the papers in the area of the stream. Overall, 176 papers were submitted, of which 86 were selected to be presented at the conference and appear in these proceedings. The acceptance rate was uniform across the streams. In addition, LOPSTR 2000 accepted about 15 extended abstracts to be presented at the conference in the program development stream.
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 1998 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ATS 2003 written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Download or read book Proceedings written by and published by . This book was released on 2002 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Asian Test Symposium written by and published by . This book was released on 2003 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Applied Science Technology Index written by and published by . This book was released on 1996 with total page 1628 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Defect and Fault Tolerance in VLSI Systems written by Robert Aitken and published by . This book was released on 2004 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Download or read book Proceedings International Test Conference 1996 written by and published by Conference. This book was released on 1996 with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt: ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.
Download or read book Proceedings of the International Symposium on the Physical Failure Analysis of Integrated Circuits written by and published by . This book was released on 2003 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt:
