Download or read book Software based Self test and Diagnosis for Processors and System on chips written by Li Chen and published by . This book was released on 2003 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Embedded Processor Based Self Test written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Download or read book Processor Design written by Jari Nurmi and published by Springer Science & Business Media. This book was released on 2007-07-26 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.
Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Download or read book System level Test and Validation of Hardware Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.
Download or read book Design of Hardware Software Embedded Systems written by Eugenio Villar Bonet and published by Ed. Universidad de Cantabria. This book was released on 2001 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Este libro presenta los desafíos planteados por las nuevas y sumamente poderosas tecnologías de integración de sistemas electrónicos, que están en la base de los cambios sociales hacia lo que llaman la Sociedad de la Información; en la que los dispositivos electrónicos se harán una parte incorporada de la vida diaria, encajados en casi cada producto. Es necesario un conocimiento cuidadoso de los desafíos para aprovechar la amplia gama de ocasiones ofrecidas por tales capacidades de integración y las correspondientes posibilidades de diseño de sistemas electrónicos.
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Download or read book Improving Test Compression and Diagnosis for System on chip Designs written by Kamran Saleem (Ph. D.) and published by . This book was released on 2016 with total page 170 pages. Available in PDF, EPUB and Kindle. Book excerpt: This dissertation presents new approaches to improve test compression and fault diagnosis for system-on-chip (SOC) designs. SOCs typically contain one or more embedded processors which can be used to aid in test and diagnosis. Novel techniques are presented for test vector compression and output response compaction running in software on an embedded processor, and for diagnosis from compactor signatures. The proposed test compression technique is based on a novel algorithm called Recursively Defined Invertible Sets (RDIS). It exploits the abundance of don’t cares in industrial test data and achieves large amounts of compression. The compressed data is stored on the tester and transferred on-chip to be decompressed by the software program. A test response compaction technique is proposed and implemented in software. Unlike previous techniques for software based test response compaction, the proposed approach is able to handle output responses with unknown (X) values. The methodology is based on canceling out X's in response signatures while using cost-effective X masking as a preprocessing step. The results indicate significant improvement in compression compared with previous approaches. A fundamentally new technique for precisely identifying error locations from output response signatures for propagation cones reaching fewer scan cells than the size of the MISR is described. The proposed approach does not require any additional hardware or extra data to be collected. It uses off-line software-based processing to extract information from signatures to deduce error locations even when there are a large number of errors. Experimental results demonstrate the reductions in suspect set size that can be obtained with the proposed techniques. The above diagnosis technique is further improved by a novel circuit partitioning technique that adds observation points to observe faults before they can spread out to too many primary outputs. An extra MISR is introduced to compact the data form these observation points. By careful selection of the location of the observation points, the maximal propagation cone for any fault to one of the MISRs is kept small enough to allow precise diagnosis of the error locations. All the aforementioned methods are described in detail along with experimental results.
Download or read book VLSI SoC From Algorithms to Circuits and System on Chip Design written by Andreas Burg and published by Springer. This book was released on 2013-11-26 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Download or read book VLSI SoC The Advanced Research for Systems on Chip written by Salvador Mir and published by Springer. This book was released on 2012-09-25 with total page 197 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, held in Hong Kong, China, in October 2011. The 10 papers included in the book were carefully reviewed and selected from the 45 full papers and 16 special session papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.
Download or read book Introduction to Advanced System on Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2009 with total page 810 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book System level Test and Validation of Hardware Software Systems written by Zebo Peng and published by Springer Science & Business Media. This book was released on 2005-04-07 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Download or read book VLSI SOC From Systems to Chips written by Manfred Glesner and published by Springer Science & Business Media. This book was released on 2006-05-17 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph, divided into four parts, presents a comprehensive treatment and systematic examination of cycle spaces of flag domains. Assuming only a basic familiarity with the concepts of Lie theory and geometry, this work presents a complete structure theory for these cycle spaces, as well as their applications to harmonic analysis and algebraic geometry. Key features include: accessible to readers from a wide range of fields, with all the necessary background material provided for the nonspecialist; many new results presented for the first time; driven by numerous examples; the exposition is presented from the complex geometric viewpoint, but the methods, applications and much of the motivation also come from real and complex algebraic groups and their representations, as well as other areas of geometry; comparisons with classical Barlet cycle spaces are given; and good bibliography and index. Researchers and graduate students in differential geometry, complex analysis, harmonic analysis, representation theory, transformation groups, algebraic geometry, and areas of global geometric analysis will benefit from this work.
Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2002-09-30 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt: Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).
Download or read book Automatic Generation of Instruction Sequences for Software based Self test of Processors and Systems on a chip written by Sankaranarayanan Gurumurthy and published by . This book was released on 2008 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Not available.
