Download or read book Single Event Phenomena written by G.C. Messenger and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is written for neophytes, students, and practitioners to aid in their understanding of single event phenomena. It attempts to collect the highlights as well as many of the more detailed aspects of this field into an entity that portrays the theoretical as well as the practical applications of this subject. Those who claim that "theory" is not for them can skip over the earlier chapters dealing with the fundamental and theoretical portions and find what they need in the way of hands-on guidelines and pertinent formulas in the later chapters. Perhaps, after a time they will return to peruse the earlier chapters for a more complete rendition and appreciation of the subject matter. It is felt that the reader should have some acquaintance with the electronics of semiconductors and devices, some broad atomic physics introduction, as well as a respectable level of mathematics through calculus, including simple differential equations. A large part of the preceding can be obtained informally, through job experience, self-study, evening classes, as well as from a formal college curriculum.

Download or read book Single Event Effects in Aerospace written by Edward Petersen and published by John Wiley & Sons. This book was released on 2011-10-04 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."

Download or read book Standard Guide for the Measurement of Single Event Phenomena SEP Induced by Heavy Ion Irradiation of Semiconductor Devices written by and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Illuminati Bible of Divine Light Part one written by Sorin Cerin and published by Amazon. This book was released on 2021-07-10 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the appearance of my first philosophical studies but also of aphorisms, I initially published the book entitled Bible of the Light and then a more complete form of the book Bible of the Light was the book entitled The Illuminati Bible, so that in present to publish the full form of the Bible, which I felt that it will be perfected with the help of God, and which I decided to call the Illuminati Bible of Divine Light. Some will wonder why I chose this name of The Illuminati Bible starting with that book published in 2014, the content of which is also in this book called the Illuminati Bible of Divine Light which in turn contains many other parts? Simple. Firstly because I wanted to help, in Good, the Karma of this World, because Illuminati and Enlightenment are spoken of in negative terms, and secondly because Illuminati comes from Enlightenment, and true Enlightenment cannot bring the Evil, nor can it be the Evil, vile. True Enlightenment must be based only on Good and never on bringing the Evil as the supreme Wickedness. Therefore, in order to improve the Karma of Mankind, I show that Enlightenment does not consist in Wickedness but in combating Wickedness. The enlightened ones cannot be a hidden group of people who lead humanity out of the shadows committing all sorts of evils and abuses to maintain power.These people are by no means Enlightened but Dark. If there really are some in such a situation then they use the term Illuminati or Enlightened falsely. How, just as Dark are those who dirtyly attack on the true Illuminati or Enlightened only out of obscure interests of a religious nature, for fear that the Enlightened ones might open the souls of the People and show them the Way to the Truth from which some high prelates that are at the head of certain churches flee, who are afraid that, if the Truth would be found, they will lose both their financial and their decision-making power. I believe that the future will belong to those truly Enlightened, the true Illuminati. A thing is to use Evil to bring through it, Good and another is to use Evil to bring through it the Wickedness. The true Enlightened and not Dark are those who understand that the Evil can only be used for Good when he can do it, and the Good only for the Evil less Evil, when the Good itself can lead to destruction, disaster or pain. The real Bad People, the Dark Ones, are the ones who use both Good and Evil to do as much as possible Evil and not Good. Mankind must understand that the Evil and Good, the God and the Devil are an Entity with two distinct characteristics, an Entity that defines our True God, that is, our Creator Factor and Unique-Incidentally. Therefore, in order to improve the Karma of this World, we will have to pray to the Universal Consciousness formed by the Universal Pure Language.That is, to pray to the Divine Light of all the Worlds, the Supreme God of Intelligence, which to inspire our thoughts so that to use in moderation both Good and Evil, for the ultimate purpose of doing and bringing through us as much as possible Good. Why didn't I let in continuation the name of the Illuminati Bible and to this new, much deeper work of the Bible and call it the Illuminati Bible of Divine Light ? Because compared to the other book called the Illuminati Bible, the Illuminati Bible of Divine Light contains in addition to the content of that book many other new chapters that appeared with the new Wisdom Collections or with the final form of the Coaxialism.(Sorin Cerin)

Download or read book Compound Semiconductor Integrated Circuits written by Tho T. Vu and published by World Scientific. This book was released on 2003-01-01 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the book version of a special issue of the International Journal of High Speed Electronics and Systems, reviewing recent work in the field of compound semiconductor integrated circuits. There are fourteen invited papers covering a wide range of applications, frequencies and materials. These papers deal with digital, analog, microwave and millimeter-wave technologies, devices and integrated circuits for wireline fiber-optic lightwave transmissions, and wireless radio-frequency microwave and millimeter-wave communications. In each case, the market is young and experiencing rapid growth for both commercial and millitary applications. Many new semiconductor technologies compete for these new markets, leading to an alphabet soup of semiconductor materials described in these papers. The book also includes three papers focused on radiation effects and reliability in III-V semiconductor electronics, which are useful for reference and future directions. Moreover, reliability is covered in several papers separately for certain process technologies. Contents: Present and Future of High-Speed Compound Semiconductor IC''s (T Otsuji); The Transforming MMIC (E J Martinez); Distributed Amplifier for Fiber-Optic Communication Systems (H Shigematsu et al.); Microwave GaN-Based Power Transistors on Large-Scale Silicon Wafers (S Manohar et al.); Radiation Effects in High Speed III-V Integrated Circuits (T R Weatherford); Radiation Effects in III-V Semiconductor Electronics (B D Weaver et al.); Reliability and Radiation Hardness of Compound Semiconductors (S A Kayali & A H Johnston); and other papers. Readership: Engineers, scientists and graduate students working on high speed electronics and systems, and in the area of compound semiconductor integrated circuits.

Download or read book Systems Engineering and Analysis of Electro Optical and Infrared Systems written by William Wolfgang Arrasmith and published by CRC Press. This book was released on 2018-10-08 with total page 828 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electro-optical and infrared systems are fundamental in the military, medical, commercial, industrial, and private sectors. Systems Engineering and Analysis of Electro-Optical and Infrared Systems integrates solid fundamental systems engineering principles, methods, and techniques with the technical focus of contemporary electro-optical and infrared optics, imaging, and detection methodologies and systems. The book provides a running case study throughout that illustrates concepts and applies topics learned. It explores the benefits of a solid systems engineering-oriented approach focused on electro-optical and infrared systems. This book covers fundamental systems engineering principles as applied to optical systems, demonstrating how modern-day systems engineering methods, tools, and techniques can help you to optimally develop, support, and dispose of complex, optical systems. It introduces contemporary systems development paradigms such as model-based systems engineering, agile development, enterprise architecture methods, systems of systems, family of systems, rapid prototyping, and more. It focuses on the connection between the high-level systems engineering methodologies and detailed optical analytical methods to analyze, and understand optical systems performance capabilities. Organized into three distinct sections, the book covers modern, fundamental, and general systems engineering principles, methods, and techniques needed throughout an optical system’s development lifecycle (SDLC); optical systems building blocks that provide necessary optical systems analysis methods, techniques, and technical fundamentals; and an integrated case study that unites these two areas. It provides enough theory, analytical content, and technical depth that you will be able to analyze optical systems from both a systems and technical perspective.

Download or read book Extreme Environment Electronics written by John D. Cressler and published by CRC Press. This book was released on 2017-12-19 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt: Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Download or read book Heavy Ion Induced Single Event Phenomena Sep Data for Semiconductor Devices from Engineering Testing written by National Aeronautics and Space Administration (NASA) and published by Createspace Independent Publishing Platform. This book was released on 2018-07-08 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt: The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes. Nichols, Donald K. and Huebner, Mark A. and Price, William E. and Smith, L. S. and Coss, James R. Jet Propulsion Laboratory...

Download or read book Standard guide for the measurement of single event phenomena SEP induced by heavy ion irradiation of semiconductor devices written by ASTM International and published by . This book was released on 2011 with total page 11 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Download or read book Accurate Modeling of Heavy ion induced Single Event Phenomena in Semiconductors written by Heather M. B. Dussault and published by . This book was released on 1995 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Silicon on Insulator Technology Materials to VLSI written by J.-P. Colinge and published by Springer Science & Business Media. This book was released on 2004-02-29 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon-on-Insulator Technology: Materials to VLSI, Third Edition, retraces the evolution of SOI materials, devices and circuits over a period of roughly twenty years. Twenty years of progress, research and development during which SOI material fabrication techniques have been born and abandoned, devices have been invented and forgotten, but, most importantly, twenty years during which SOI Technology has little by little proven it could outperform bulk silicon in every possible way. The turn of the century turned out to be a milestone for the semiconductor industry, as high-quality SOI wafers suddenly became available in large quantities. From then on, it took only a few years to witness the use of SOI technology in a wealth of applications ranging from audio amplifiers and wristwatches to 64-bit microprocessors. This book presents a complete and state-of-the-art review of SOI materials, devices and circuits. SOI fabrication and characterization techniques, SOI CMOS processing, and the physics of the SOI MOSFET receive an in-depth analysis. Silicon-on-Insulator Technology: Materials to VLSI, Third Edition, also describes the properties of other SOI devices, such as multiple gate MOSFETs, dynamic threshold devices and power MOSFETs. The advantages and performance of SOI circuits used in both niche and mainstream applications are discussed in detail. The SOI specialist will find this book invaluable as a source of compiled references covering the different aspects of SOI technology. For the non-specialist, the book serves an excellent introduction to the topic with detailed, yet simple and clear explanations. Silicon-on-Insulator Technology: Materials to VLSI, Third Edition is recommended for use as a textbook for classes on semiconductor device processing and physics at the graduate level.

Download or read book Defect Oriented Testing for Nano Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Download or read book On Single Event Phenomena in Microprocessors written by Rolf Johansson and published by . This book was released on 1993 with total page 61 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book FUNDAMENTALS OF RESEARCH METHODOLOGY AND INTELLECTUAL PROPERTY RIGHTS written by Palagati Anusha and published by RED'SHINE Publication. Pvt. Ltd. This book was released on with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book CMOS Memory Circuits written by Tegze P. Haraszti and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 567 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS Memory Circuits is a systematic and comprehensive reference work designed to aid in the understanding of CMOS memory circuits, architectures, and design techniques. CMOS technology is the dominant fabrication method and almost the exclusive choice for semiconductor memory designers. Both the quantity and the variety of complementary-metal-oxide-semiconductor (CMOS) memories are staggering. CMOS memories are traded as mass-products worldwide and are diversified to satisfy nearly all practical requirements in operational speed, power, size, and environmental tolerance. Without the outstanding speed, power, and packing density characteristics of CMOS memories, neither personal computing, nor space exploration, nor superior defense systems, nor many other feats of human ingenuity could be accomplished. Electronic systems need continuous improvements in speed performance, power consumption, packing density, size, weight, and costs. These needs continue to spur the rapid advancement of CMOS memory processing and circuit technologies. CMOS Memory Circuits is essential for those who intend to (1) understand, (2) apply, (3) design and (4) develop CMOS memories.