Download or read book Simulation and Test Pattern Generation for Bridge Faults in CMO ICs written by Carl Roth and published by . This book was released on 1994 with total page 102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2000-08-09 with total page 1186 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Handbook of Semiconductor Manufacturing Technology describes the individual processes and manufacturing control, support, and infrastructure technologies of silicon-based integrated-circuit manufacturing, many of which are also applicable for building devices on other semiconductor substrates. Discussing ion implantation, rapid thermal processing, photomask fabrication, chip testing, and plasma etching, the editors explore current and anticipated equipment, devices, materials, and practices of silicon-based manufacturing. The book includes a foreword by Jack S. Kilby, cowinner of the Nobel Prize in Physics 2000 "for his part in the invention of the integrated circuit."
Download or read book Proceedings written by and published by . This book was released on 1994 with total page 1062 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book CMOS Electronics written by Jaume Segura and published by John Wiley & Sons. This book was released on 2004-03-26 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
Download or read book Proceedings International Symposium on VLSI Design written by and published by . This book was released on 1996 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings written by International Symposium on Multiple Valued Logic and published by . This book was released on 2002 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Mantech Journal written by and published by . This book was released on 1979 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 17th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Download or read book Digest of Papers written by and published by . This book was released on 1997 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Test Conference 1993 written by and published by Conference. This book was released on 1993 with total page 1090 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Download or read book Conference Publication written by and published by . This book was released on 1977 with total page 610 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1996 with total page 1316 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 1973- cover the entire IEEE technical literature.
Download or read book Hierarchical Testing Using Precomputed Tests for Modules written by Brian Thomas Murray and published by . This book was released on 1994 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Download or read book Proceedings of the Ninth Asian Test Symposium written by and published by I E E E. This book was released on 2000 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.
Download or read book Asian Test Symposium written by and published by . This book was released on 2000 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt:
