Download or read book Semiconductor Reliability Handbook written by Sharp Corporation and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Sharp Semiconductor Reliability Handbook written by Shāpu Kabushiki Kaisha and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials and Reliability Handbook for Semiconductor Optical and Electron Devices written by Osamu Ueda and published by Springer Science & Business Media. This book was released on 2012-09-22 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 3276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Download or read book Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by and published by . This book was released on 1987 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by National Semiconductor Corporation (U.S.). Military/Aerospace Products Division and published by . This book was released on 1986 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Components Quality reliability Handbook written by Intel Corporation and published by . This book was released on 1985 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Components Quality Reliability Handbook written by Intel Staff and published by . This book was released on 1989-01-01 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Reliability Manual written by Christopher L. Henderson and published by . This book was released on 2001 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Reliability Handbook written by Santa Clara NATIONAL SEMICONDUCTOR CORPORATION (CA, Estados Unidos) and published by . This book was released on 1982 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and the die; Reliability and internal construction; MIL-STD-883; MIL-M-38510; Reliability and the hybrid device; Reliability and VLSI/VHSIC devices; Reliability and the radiation environment; Reliability and the discrete device; Reliability and standardization; Quality assurance and reliability engineering; reliability and documentation; Reliability and the commercial grade device; European reliability programs; Reliability and the cost of semiconductor; The total military/aerospace standadization program; 883B/RETS tm products from National Semiconductor; 883S/RETS tm products from National Semicondutor; 883S/RETS tm hybrids from national semiconductor; MIL-M-38510 class B products from National Semiconductor; Radiation hardened technology from National Semiconductor; Military leadless chip carriers from National Semiconductor; Appendix: Wafer fabrication; Semiconductor assembly and packaging; Glossary of terms; Key governement agencies; AN/NUMBERS and acronyms; Bibbliography; MIL-M-38510 cross reference.

Download or read book Electronic Failure Analysis Handbook written by Perry L. Martin and published by McGraw Hill Professional. This book was released on 1999 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--BOOK JACKET. Title Summary field provided by Blackwell North America, Inc. All Rights Reserved.

Download or read book Electronic Failure Analysis Handbook written by Perry Martin and published by . This book was released on 1999 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt: The definitive, all-in-one, cost-saving guide to electronic failure analysis--from the field's top experts Still digging for the latest developments and techniques in electronic failure analysis? The leading-edge methods for slashing product failure rates are all right here in this complete, comprehensive source. You'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance. Absolutely essential to anyone concerned with electronic product development and testing, the Handbook gives you ready-to-use, insider information on state-of-the-art EFA techniques; the how's and why's of electronic failures; failure prediction; warranty cost control; liability-costs and other issues.