Download or read book Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation written by Kee Sup Kim and published by . This book was released on 1992 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Combinational Test Generation for Sequential Circuits written by Yong Chang Kim and published by . This book was released on 2002 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Generation and Partial Scan Design for Synchronous Sequential Circuits written by Dongho Lee and published by . This book was released on 1992 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book An Automatic Test Pattern Generation Technique for Sequential Circuits Using Scan Applications written by Venkat N. Koripalli and published by . This book was released on 2006 with total page 74 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increase in speed and the shrinking of technology has led to modern day ICs becoming more sensitive to timing related defects. These defects must be rectified to prevent hazards in the circuit. The timing related defects can be identified with At-Speed Testing using the path delay fault model. A subset of the total number of paths known as critical paths cannot be sequentially activated i.e. we cannot find two successive vectors that activate a fault along the path. The elimination of untestable paths helps us to save a lot of time. In this report a new method, called the Launch-on-Shift is used to determine the testability of critical paths. The method uses a vector pair in which the first vector is the scan in steady state vector and the second vector is the function of the first vector.
Download or read book American Doctoral Dissertations written by and published by . This book was released on 2002 with total page 776 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Efficient Methods for Partial Scan Sequential Circuit Design and Test written by Chia-Lin Chan and published by . This book was released on 1994 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Modeling the Difficulty of Automatic Test Pattern Generation for Sequential Circuits written by Thomas E. Marchok and published by . This book was released on 1995 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "Several manufacturing challenges have accompanied the explosive growth in the scale of integration for VLSI circuits. One of these is the increased difficulty of generating manufacturing test sets, which has resulted from the vast increase in the ratio of the number of transistors to the number of I/O pins. The difficulty of test generation is crucial since it impacts both the resultant product quality and time to market, both of which continue to gain importance in the present day semiconductor industry. Design for testability (DFT) techniques can be used to offset this difficulty. The mechanics of such techniques are well understood. DFT techniques are also known to increase other manufacturing costs and to decrease performance. Thus the relevant issue facing designers is not how to use DFT, but rather if such techniques should be applied. The correct decision is a matter of economics. Integrated circuit (IC) designers must balance manufacturing costs, performance, time to market, and product quality concerns. Achieving the desired balance requires the ability to quantify trade-offs in the different manufacturing costs which various DFT techniques would affect. Unfortunately, test generation cost is among the least predictable of these affected costs, even though the principal reason that DFT techniques are often applied is to reduce the difficulty of test generation. Furthermore, there does not exist a complete understanding of which circuit attributes influence the difficulty of test generation. In this thesis, a model is developed which predicts the difficulty of automatic test generation for non-scan sequential circuits. This model is based on a newly recognized circuit attribute, termed density of encoding, which differs from those notions which have been used to describe this difficulty in the past. This thesis also discusses how the concept of the density of encoding can be applied to devise more powerful sequential automatic test pattern generation algorithms, more efficient DFT techniques, and more effective synthesis for testability schemes."
Download or read book AUTEG written by Hussein Ahmad Abdallah and published by . This book was released on 1991 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Automatic Test Pattern Generator for Full Scan Sequential Circuits Using Limited Scan Operations written by Vinod Pagalone and published by . This book was released on 2006 with total page 83 pages. Available in PDF, EPUB and Kindle. Book excerpt: In testing sequential circuits with scan chains, the test application time is the main factor that determines the overall cost of testing the circuit. For these circuits, the test application time principally depends on the number flip-flops as well as the number of vectors in the test set. Though test set compaction is one way of reducing test application time, for a significant reduction in testing costs the duration of scan operation has to be reduced. The proposed method achieves this by using limited scan operations where the number of shifts is smaller that the actual length of the scan chain. Thus the compacted test set consists of limited scan operations in places where the scan operation cannot be dropped completely. The method uses an iterative procedure that identifies the vectors that have high fault coverage with minimal shifts in the scan chain.
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1990 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Engineering Index Annual written by and published by . This book was released on 1992 with total page 2264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Computational Complexity written by Sanjeev Arora and published by Cambridge University Press. This book was released on 2009-04-20 with total page 609 pages. Available in PDF, EPUB and Kindle. Book excerpt: New and classical results in computational complexity, including interactive proofs, PCP, derandomization, and quantum computation. Ideal for graduate students.
Download or read book CMOS Digital Integrated Circuits written by Sung-Mo Kang and published by . This book was released on 2002 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the sigificant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples. The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.
Download or read book Patterns Predictions and Actions Foundations of Machine Learning written by Moritz Hardt and published by Princeton University Press. This book was released on 2022-08-23 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: An authoritative, up-to-date graduate textbook on machine learning that highlights its historical context and societal impacts Patterns, Predictions, and Actions introduces graduate students to the essentials of machine learning while offering invaluable perspective on its history and social implications. Beginning with the foundations of decision making, Moritz Hardt and Benjamin Recht explain how representation, optimization, and generalization are the constituents of supervised learning. They go on to provide self-contained discussions of causality, the practice of causal inference, sequential decision making, and reinforcement learning, equipping readers with the concepts and tools they need to assess the consequences that may arise from acting on statistical decisions. Provides a modern introduction to machine learning, showing how data patterns support predictions and consequential actions Pays special attention to societal impacts and fairness in decision making Traces the development of machine learning from its origins to today Features a novel chapter on machine learning benchmarks and datasets Invites readers from all backgrounds, requiring some experience with probability, calculus, and linear algebra An essential textbook for students and a guide for researchers
Download or read book Ant Colony Optimization written by Marco Dorigo and published by MIT Press. This book was released on 2004-06-04 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: An overview of the rapidly growing field of ant colony optimization that describes theoretical findings, the major algorithms, and current applications. The complex social behaviors of ants have been much studied by science, and computer scientists are now finding that these behavior patterns can provide models for solving difficult combinatorial optimization problems. The attempt to develop algorithms inspired by one aspect of ant behavior, the ability to find what computer scientists would call shortest paths, has become the field of ant colony optimization (ACO), the most successful and widely recognized algorithmic technique based on ant behavior. This book presents an overview of this rapidly growing field, from its theoretical inception to practical applications, including descriptions of many available ACO algorithms and their uses. The book first describes the translation of observed ant behavior into working optimization algorithms. The ant colony metaheuristic is then introduced and viewed in the general context of combinatorial optimization. This is followed by a detailed description and guide to all major ACO algorithms and a report on current theoretical findings. The book surveys ACO applications now in use, including routing, assignment, scheduling, subset, machine learning, and bioinformatics problems. AntNet, an ACO algorithm designed for the network routing problem, is described in detail. The authors conclude by summarizing the progress in the field and outlining future research directions. Each chapter ends with bibliographic material, bullet points setting out important ideas covered in the chapter, and exercises. Ant Colony Optimization will be of interest to academic and industry researchers, graduate students, and practitioners who wish to learn how to implement ACO algorithms.
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
