Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1979 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by and published by . This book was released on 1975 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by Institute for Applied Technology (U.S.). Electronic Technology Division and published by . This book was released on 1973 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by W. Murray Bullis and published by . This book was released on 1975 with total page 84 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by Murray W.. Bullis and published by . This book was released on 1978 with total page 84 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology Combined Quarterly Report October 1 1973 to March 31 1974 written by W. Murray Bullis and published by . This book was released on 1974 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Special Publication written by and published by . This book was released on 1964 with total page 676 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The United States Department of Commerce Publications Catalog and Index Supplement written by United States. Department of Commerce and published by . This book was released on 1972 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1980 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 748 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Handbook of Silicon Semiconductor Metrology written by Alain C. Diebold and published by CRC Press. This book was released on 2001-06-29 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

Download or read book Monthly Catalogue United States Public Documents written by and published by . This book was released on 1978 with total page 1152 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microelectronic Test Patterns written by Martin G. Buehler and published by . This book was released on 1974 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by James M. Kenney and published by . This book was released on 1976 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: