Download or read book Semiconductor Devices Mechanical and Climatic Test Methods written by British Standards Institution and published by . This book was released on 2019 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book GB T 2018 GB 2018 Chinese National Standard PDF English Catalog year 2018 written by https://www.chinesestandard.net and published by https://www.chinesestandard.net. This book was released on 2020-06-06 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document provides the comprehensive list of Chinese National Standards - Category: GB, GB/T Series of year 2018.

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Download or read book List of English translated Chinese standards GB T written by https://www.codeofchina.com and published by https://www.codeofchina.com. This book was released on with total page 3495 pages. Available in PDF, EPUB and Kindle. Book excerpt: HTTPS://WWW.CODEOFCHINA.COM EMAIL:[email protected] "Codeofchina Inc., a part of TransForyou (Beijing) Translation Co., Ltd., is a professional Chinese code translator in China. Now, Codeofchina Inc. is running a professional Chinese code website, www.codeofchina.com. Through this website, Codeofchina Inc. provides English-translated Chinese codes to clients worldwide. About TransForyou TransForyou (Beijing) Translation Co., Ltd., established in 2003, is a reliable language service provider for clients at home and abroad. Since our establishment, TransForyou has been aiming to build up a translation brand with our professional dedicated service. Currently, TransForyou is the director of China Association of Engineering Construction Standardization (CECS); the committeeman of Localization Service Committee / Translators Association of China (TAC) and the member of Boya Translation Culture Salon (BTCS); and the field study center of the University of the University of International Business & Economics (UIBE) and Hebei University (HU). In 2016, TransForyou ranked 27th among Asian Language Service Providers by Common Sense Advisory. "

Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

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Download or read book Semiconductor Devices Mechanical and Climatic Test Methods Neutron Beam Irradiated Single Event Effect SEE Test Method for Semiconductor Devices written by British Standards Institute Staff and published by . This book was released on 1916-11-30 with total page 26 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Moisture measurement, Gas analysis, Water vapour, Water-vapour tests

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

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Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Download or read book Publications of the National Bureau of Standards 1977 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1972 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NASA Scientific and Technical Reports written by United States. National Aeronautics and Space Administration Scientific and Technical Information Division and published by . This book was released on 1967 with total page 2300 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer Science & Business Media. This book was released on 2010-11-08 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.