Download or read book Section A Transient Radiation Effects on Materials and Passive Electronic Components Section B Transient Radiation Effects on Discrete Semiconductor Parts written by N. J. Rudie and published by . This book was released on 1986 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices written by D. C. Jones and published by . This book was released on 1963 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Transient Radiation Effects on Materials and Passive Electronic Components written by and published by . This book was released on 1986 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Download or read book Radiation Effects on Semiconductor Devices written by Los Alamos Scientific Laboratory and published by . This book was released on 1961 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Section A Transient radiation effects in field effects transistor parts Section B Transient radiation effects in miscellaneous electronics written by N. J. Rudie and published by . This book was released on 1986 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book TRANSIENT RADIATION EFFECTS ON ELECTRONIC COMPONENTS AND SEMICONDUCTOR DEVICES written by and published by . This book was released on 1963 with total page 117 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report summarizes the information that was available before 1962 concerning the effects of nuclear-weapon-burst and simulated-burst radia tion on electronic components and semiconductor devices. This work reports only the effects observed in components that are due to gamma rays and/or neutrons of a transient radiation environment.
Download or read book Transient Radiation Effects in Discrete Semiconductor Parts written by and published by . This book was released on 1986 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Report on Space radiation Damage to Electronic Components and Materials written by W. E. Chapin and published by . This book was released on 1963 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Basic Mechanisms of Radiation Effects in Electronic Materials and Devices written by and published by . This book was released on 1987 with total page 91 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report reviews the primary physical processes underlying the response of electronic materials and devices to radiation as well as the relationship of these processes to the modes of circuit degradation and failure. An overview presents brief discussions of the major radiation environments of practical interest, the interaction of radiation with solid targets, common terminology of radiation exposure, and the primary radiation effects in electronic materials, including ionization effects (radiation-induced photocurrents and space charge buildup) and atomic displacement damage effects. An emphasis is given to the problem of total-dose ionization response, primarily in metal-oxide-semiconductor (MOS) systems. In particular, a description of the basic physical phenomena underlying the complex time history of the MOS radiation response is given, and some implications of the time-dependent response for issues of radiation testing, hardness assurance and radiation response prediction are pointed out. There is also discussion on the implications of scaling down the gate oxide thickness and on the increasingly important problem of radiation-induced leakage currents. Keywords: Radiation effects, Ionizing radiation, Nuclear weapons effects, Microelectronics, Metal oxide semiconductor devices, Bipolar devices, Total dose ionization, Transient radiation, Single event upset.
Download or read book Radiation Effects in Advanced Semiconductor Materials and Devices written by C. Claeys and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Download or read book Transient radiation Effects on Electronics Handbook written by Richard K. Thatcher and published by . This book was released on 1967 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.
Download or read book Technical Abstract Bulletin written by and published by . This book was released on 1978 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Radiation Effects in Semiconductors written by Krzysztof Iniewski and published by CRC Press. This book was released on 2018-09-03 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Download or read book Radiation Effects on Electronic Systems written by Henning L. Olesen and published by Springer. This book was released on 2013-12-11 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Research on the Radiation Effects and Compact Model of SiGe HBT written by Yabin Sun and published by Springer. This book was released on 2017-10-24 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.
