Download or read book Scanning Transmission X ray Microscope for Materials Science Spectromicroscopy at the ALS written by and published by . This book was released on 1997 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300[mu]m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.
Download or read book Development of Scanning X ray Microscopes for Materials Science Spectromicroscopy at the Advanced Light Source written by and published by . This book was released on 1997 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt: Third generation synchrotron sources of soft x-rays provide an excellent opportunity to apply established x-ray spectroscopic materials analysis techniques to surface imaging on a sub-micron scale. This paper describes an effort underway at the Advanced Light Source (ALS) to pursue this development using Fresnel zone plate lenses. These are used to produce a sub-micron spot of x-rays for use in scanning microscopy. Several groups have developed microscopes using this technique. A specimen is rastered in the focused x-ray spot and a detector signal is acquired as a function of position to generate an image. Spectroscopic capability is added by holding the small spot on a feature of interest and scanning through the spectrum. The authors are pursuing two spectroscopic techniques: Near Edge X-ray Absorption Spectroscopy (NEXAFS), X-ray Photoelectron Spectroscopy (XPS) which together provide a powerful capability for light element analysis in materials science.
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-22 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Download or read book A New Scanning Transmission X ray Microscope at the ALS for Operation Up to 2500eV written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.
Download or read book X Ray Microscopy and Spectromicroscopy written by Jürgen Thieme and published by Springer Science & Business Media. This book was released on 2013-11-09 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
Download or read book Soft X ray Optics for Spectromicroscopy at the Advanced Light Source written by and published by . This book was released on 1996 with total page 18 pages. Available in PDF, EPUB and Kindle. Book excerpt: A variety of systems for performing spectromicroscopy, spatially resolved spectroscopy, are in operation or under construction at the Advanced Light Source (ALS). For example, part of the program is centered around the surface analysis problems of local semiconductor industries, and this has required the construction of a microscope with wafer handling, fiducialization, optical microscopy, coordinated ion beam etching, and X-ray Photoelectron Spectroscopy (XPS) integrated in this case with Kirkpatrick-Baez (K-B) grazing incidence micro-focusing optics. The microscope is to be used in conjunction with a highly efficient entrance slitless Spherical Grating Monochromator (SGM). The design and expected performance of this instrument will be described, with emphasis on the production of the elliptically curved surfaces of the K-B mirrors by elastic bending of flat mirror substrates. For higher resolution, zone-plate (Z-P) focusing optics are used and one instrument, a Scanning Transmission X-ray Microscope (STXM) is in routine operation on undulator beamline 7.0. A second Z-P based system is being commissioned on the same beamline, and differs from the STXM in that it will operate at Ultra-High Vacuum (UHV) and will be able to perform XPS at 0.1 [mu]m spatial resolution. Spatially resolved X-ray Absorption Spectroscopy (XAS) can be performed by imaging electrons photoemitted from a material with a Photo-Emission Electron Microscope (PEEM). The optical requirements of a beamline designed for PEEM are very different to those of micro-focus systems and they give examples of bending magnet and undulator based instruments.
Download or read book Microscopy of Materials written by David Keith Bowen and published by John Wiley & Sons. This book was released on 1975 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fundamentals and Applications in Aerosol Spectroscopy written by Ruth Signorell and published by CRC Press. This book was released on 2010-12-20 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Helping you better understand the processes, instruments, and methods of aerosol spectroscopy, Fundamentals and Applications in Aerosol Spectroscopy provides an overview of the state of the art in this rapidly developing field. It covers fundamental aspects of aerosol spectroscopy, applications to atmospherically and astronomically relevant problem
Download or read book Recent Advances In Actinide Science written by Iain May and published by Royal Society of Chemistry. This book was released on 2007-10-31 with total page 831 pages. Available in PDF, EPUB and Kindle. Book excerpt: Actinide elements and their chemistry have a significant number of applications. Bringing together contributions from the leading experts in the field, Recent Advances in Actinide Science covers six main topics: * Analysis, the environment and biotransformations * Coordination and organometallic chemistry * Heavy elements * Nuclear fuels, materials and waste forms * Separations and solution chemistry * Spectroscopy, magnetism and superconductivity Covering a wide range of research from pure academic studies to applied industrial science and technology, this book distils the knowledge and achievements gained in actinide science over the last four years. This high level book is aimed at researchers, both industrial and academic, and provides a comprehensive overview of the current status of actinide science.
Download or read book Handbook of Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-08-29 with total page 507 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Download or read book Soft X ray Spectromicroscopy Development for Materials Science at the Advanced Light Source written by and published by . This book was released on 1996 with total page 29 pages. Available in PDF, EPUB and Kindle. Book excerpt: Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.
Download or read book User Facilities of the Office of Basic Energy Sciences written by and published by . This book was released on 2009 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This brochure overviews the scientific infrastructure that is constructed, maintained, and operated at Department of Energy laboratories for the pursuit of energy-related research." -- cf p. 4
Download or read book Transmission Electron Microscopy written by David Bernard Williams and published by Plenum Publishing Corporation. This book was released on 1996 with total page 729 pages. Available in PDF, EPUB and Kindle. Book excerpt: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Download or read book High Resolution Imaging and Spectrometry of Materials written by Frank Ernst and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
Download or read book Hard X Ray Scanning Microscope Using Nanofocusing Parabolic Refractive Lenses written by Jens Patommel and published by Cuvillier Verlag. This book was released on 2011-01-24 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hard x rays come along with a variety of extraordinary properties which make them an excellent probe for investigation in science, technology and medicine. Their large attenuation length in matter opens up the possibility to use hard x-rays for non-destructive investigation of the inner structure of specimens. Medical radiography is one important example of exploiting this feature. Since their discovery by W. C. Röntgen in 1895, a large variety of x-ray analytical techniques have been developed and successfully applied, such as x-ray crystallography, reflectometry, fluorescence spectroscopy, x-ray absorption spectroscopy, small angle x-ray scattering, and many more. Each of those methods reveals information about certain physical properties, but usually, these properties are an average over the complete sample region illuminated by the x rays. In order to obtain the spatial distribution of those properties in inhomogeneous samples, scanning microscopy techniques have to be applied, screening the sample with a small x-ray beam. The spatial resolution is limited by the finite size of the beam. The availability of highly brilliant x-ray sources at third generation synchrotron radiation facilities together with the development of enhanced focusing x-ray optics made it possible to generate increasingly small high intense x-ray beams, pushing the spatial resolution down to the sub-100nm range. During this thesis the prototype of a hard x-ray scanning microscope utilizing microstructured nanofocusing lenses was designed, built, and successfully tested. The nanofocusing x-ray lenses were developed by our research group of the Institute of Structural Physics at the Technische Universität Dresden. The prototype instrument was installed at the ESRF beamline ID 13. A wide range of experiments like fluorescence element mapping, fluorescence tomography, x-ray nano-diffraction, coherent x-ray diffraction imaging, and x-ray ptychography were performed as part of this thesis. The hard x-ray scanning microscope provides a stable x-ray beam with a full width at half maximum size of 50–100nm near the focal plane. The nanoprobe was also used for characterization of nanofocusing lenses, crucial to further improve them. Based on the experiences with the prototype, an advanced version of a hard x-ray scanning microscope is under development and will be installed at the PETRA III beamline P06 dedicated as a user instrument for scanning microscopy. This document is organized as follows. A short introduction motivating the necessity for building a hard x-ray scanning microscope is followed by a brief review of the fundamentals of hard x-ray physics with an emphasis on free-space propagation and interaction with matter. After a discussion of the requirements on the x-ray source for the nanoprobe, the main features of synchrotron radiation from an undulator source are shown. The properties of the nanobeam generated by refractive x-ray lenses are treated as well as a two-stage focusing scheme for tailoring size, flux and the lateral coherence properties of the x-ray focus. The design and realization of the microscope setup is addressed, and a selection of experiments performed with the prototype version is presented, before this thesis is finished with a conclusion and an outlook on prospective plans for an improved microscope setup to be installed at PETRA III.
Download or read book X Ray and Inner Shell Processes written by R.L. Johnson and published by American Inst. of Physics. This book was released on 1999-06-04 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contains papers, lectures, and reports from the September 1996 conference on recent advances in both experimental and theoretical X-ray and inner-shell processes and their applications, with sections on radiation sources, highly charged ions, instrumentation and methods, nuclear scattering, electron
Download or read book Scanning Electron Microscopy and X Ray Microanalysis A Text for Biologists Materials Scientists and Geologists written by Goldstein JI. and published by . This book was released on 1992 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
