Download or read book Reliability Evaluation of Power Devices for High Performance Power Conversion written by Chi Xu and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reliability of power devices becomes significantly important due to the extensive deployment of power electronic systems, especially in industries associated with mission and safety critical products, such as photovoltaic power stations, electric transportation systems. The failure of devices causes unexpected power outages and catastrophic faults. The increasing demand for high power density and high efficiency drives the adoption of wide bandgap (WBG) devices and power integration. Gallium Nitride (GaN) devices, as one type of WBG devices, is favorable due to the lower specific on-state resistance and smaller capacitance, which reduce both the conduction and switching loss and achieve high efficiency. However, as a newly developed device, GaN devices' reliability still requires comprehensive assessments. To fully understand GaN devices' robustness, one of the commonly used methods, the DC power cycling test, is conducted to detect the weak points of the devices and identify aging precursors for lifetime estimation. Besides, due to the unique structure and material property, GaN devices suffer dynamic on-state resistance and threshold voltage shift under high voltage stress and hard switching transient, which requires an extended stress profile for thorough reliability evaluation. Therefore, an AC power cycling test covering both high voltage stress and various switching transients is developed to mimic real operations for the comprehensive study of GaN devices' reliability. Besides, power integration is quite attractive at low power levels using processes that are compatible with the standard (Complementary Metal-Oxide-Semiconductor) CMOS process. With the increase in power rating and faster switching speed, the voltage overshoot on the drain-source terminals during the turn-off transient may push the devices into the avalanche region, which may damage the device and cause power converter malfunctions. Hence, it is necessary to investigate the devices' robustness against such repetitive strikes. For this purpose, a high-resolution and cost-effective nanosecond current pulse generator (CPG) is designed to inject a current with adjustable magnitude and duration into the device, which can charge the drain-source voltage up to the avalanche voltage under different stress conditions. By using this test setup, a commercial (Metal-Oxide-Semiconductor FieldEffect Transistor) MOSFET is firstly stressed under both long and short pulse durations. The results reveal different degradation and failure mechanisms under different stress conditions. Due to the importance of a large dataset in reliability studies and validation of power devices, a fully modular and scalable test bench is designed based on the proposed CPG, which allows easy maintenance and seamless capacity expansion. Finally, customized (Laterally-Diffused MetalOxide Semiconductor) LDMOS devices are designed to investigate the effect of different chip layouts over the robustness under avalanche conditions.

Download or read book Challenges and New Trends in Power Electronic Devices Reliability written by Elio Chiodo and published by Mdpi AG. This book was released on 2021-05-31 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deep analysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stress operations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economical points of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim to propose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focused on the reliability assessment of power electronic devices and related components.

Download or read book Reliability of Power Electronic Converter Systems written by Henry Shu-hung Chung and published by IET. This book was released on 2015-12-07 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main aims of power electronic converter systems (PECS) are to control, convert, and condition electrical power flow from one form to another through the use of solid state electronics. This book outlines current research into the scientific modeling, experimentation, and remedial measures for advancing the reliability, availability, system robustness, and maintainability of PECS at different levels of complexity.

Download or read book Semiconductor Power Devices written by Josef Lutz and published by Springer Science & Business Media. This book was released on 2011-01-15 with total page 539 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.

Download or read book Reliability in Power Electronics and Electrical Machines Industrial Applications and Performance Models written by Kaboli, Shahriyar and published by IGI Global. This book was released on 2016-03-08 with total page 501 pages. Available in PDF, EPUB and Kindle. Book excerpt: In modern industries, electrical energy conversion systems consist of two main parts: electrical machines and power electronic converters. With global electricity use at an all-time high, uninterrupted operation of electrical power converters is essential. Reliability in Power Electronics and Electrical Machines: Industrial Applications and Performance Models provides an in-depth analysis of reliability in electrical energy converters as well as strategies for designing dependable power electronic converters and electrical machines. Featuring a comprehensive discussion on the topics of reliability design and measurement, failure mechanisms, and specific issues pertaining to quality, efficiency, and durability, this timely reference source offers practical examples and research-based results for use by engineers, researchers, and advanced-level students.

Download or read book Reliability Evaluation and Condition Monitoring of Wide Bandgap Devices written by Fei Yang and published by . This book was released on 2020 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reliability of power semiconductor devices is important as the device failures can lead to power converter malfunctions or power interruptions, which are not desirable in the industry because of the penalties of the maintenance cost, operation cost, and safety concerns. With low on-resistance and junction capacitance, the Wide Bandgap (WBG) devices are attractive for highefficiency and high-power-density power electronics converters in various industrial applications. However, as a relatively new technology with limited field application data, the long-term reliability of these devices is a concern for some mission-critical applications, e.g., automobile industry, aerospace application, and renewable energy systems. To understand these reliability issues, this dissertation evaluates the commercial SiC MOSFETs and GaN HEMTs in terms of their reliability and robustness. For SiC MOSFETs, a dedicated aging setup is designed, and the parameter shifts of the device over aging are studied. Both the device-related and package issues are focused, and their impacts on the device’s electrical performance are investigated, respectively. Also, targeting at the state-of-health condition monitoring of SiC MOSFETs, the aging’s effect on temperature sensitive electrical parameter (TSEP) based Tj measurement methods are evaluated. Based on the evaluation result, a new online junction temperature measurement approach is proposed and realized in an intelligent gate drive circuit for condition monitoring purposes. In terms of GaN HEMTs, device-related reliability and performance issues are studied. Specifically, the dynamic on-resistance and threshold voltage shift are successfully characterized by the proposed measurement circuits. Then their impacts on the device’s performance are investigated. The evaluation results and condition monitoring methods in this dissertation help to fully understand the physical cause of the reliability issue in WBG devices and guide the application engineers to maximize the device’s performance through proper gate drive circuit design.

Download or read book Semiconductor Power Devices written by Josef Lutz and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses semiconductor properties, pn-junctions and the physical phenomena for understanding power devices in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. Special peculiarities of devices from the ascending semiconductor materials SiC and GaN are discussed. This book presents significant improvements compared to its first edition. It includes chapters on packaging and reliability. The chapter on semiconductor technology is written in a more in-depth way by considering 2D- and high concentration effects. The chapter on IGBTs is extended by new technologies and evaluation of its potential. An extended theory of cosmic ray failures is presented. The range of certain important physical relationships, doubted in recent papers for use in device simulation, is cleared and substantiated in this second edition.

Download or read book Research on Modern Power Semiconductor Modelling Methodology for Efficiency Evaluation of Power Electronic Systems in Electromagnetic Transient Simulation written by Yanming Xu and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power electronics technology has rapidly developed during the past decades. Power electronics systems aim to achieve high efficiency as power conversion interfaces while fulfilling the performance and reliability requirements. The key to achieving these objectives is power semiconductors, which dictate the power electronics system's efficiency, power density, and reliability. In recent years, traditional Silicon (Si) devices are reaching their material limits. Meanwhile, new Wide-Bandgap (WBG) devices such as Silicon Carbide (SiC) and Gallium Nitride (GaN) devices have been commercialized, featuring high breakdown voltage, fast switching speed, and high thermal capability. On the other hand, semiconductor devices are typically exposed to repetitive heat pulses and are often the most critical components affecting system reliability. Consequently, a comprehensive modelling method for modern power semiconductors that can describe various devices' switching behaviors is highly desirable by power electronics engineers and manufacturers. This research focuses on developing a simulation-based modelling methodology for modern power semiconductors to evaluate the power electronics system's efficiency. A multi-level simulation strategy has been proposed and implemented in PSCAD/EMTDC. A generalized transient semiconductor model has been developed, which can reproduce the device's switching behaviors. Subsequently, the power losses are obtained to form a multi-dimensional power loss look-up table under a wide range of operating conditions. A dynamic thermal model for temperature estimation, and a typical electrical network using simple switch models for semiconductor devices have been implemented. The junction temperature is updated every switching cycle by the power loss with a thermal model and influence back to the electrical simulation. In this way, a closed-loop electro-thermal simulation is formed to evaluate both electrical and thermal performances in a single simulator with a range of acceptable accuracy. A double pulse test platform has been designed and built for device characterizations and power loss verifications. Moreover, a single-phase grid-tied buck-boost type inverter application has been selected as a case study and built to study the proposed method. The measured results indicate that the proposed approach is highly promising for power electronics engineers to evaluate and optimize a system during the early design stage.

Download or read book Reliability Improvement Technology for Power Converters written by Kyo-Beum Lee and published by Springer. This book was released on 2017-08-28 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.

Download or read book Reliability Assessment of Power Systems Integrated with High Penetration of Power Converters written by and published by . This book was released on 2022 with total page 87 pages. Available in PDF, EPUB and Kindle. Book excerpt: Moving towards renewable and environmental-friendly energy resources has intensified the importance of power electronic converters in future power systems. The issue of reliability becomes more critical than ever before. This research proposes a hierarchical reliability framework to evaluate the electric power system reliability from the power electronic converter level to the overall system level. In the first stage, the reliability of each power converter is modeled in an accurate manner. Dynamic behaviors of various integrated semiconductor devices and the converter topology are considered. In the second stage, we calculate system-level reliability indicators such as expected energy not served (EENS) and loss of load expectation (LOLE) are estimated through a non-sequential Monte Carlo simulation. Machine learning regression models such as support vector regression (SVR) and random forests (RF) are implemented to bridge the nonlinear reliability relationship between two stages. Moreover, a variance-based global sensitivity analysis (GSA) is conducted to rank and identify the most influential converter uncertainties with respect to the variance of system EENS. Based on the GSA conclusions, system operators can take proactive actions to mitigate the potential risk of the system. Furthermore, Bayesian network (BN) structure learning and scoring algorithms are applied to visualize a converter-based BN structure. Reliability interdependencies among different nodes are quantified through information entropy theory such that reliability causal relations can be revealed. This dissertation also studies and discusses opportunities of various emerging technologies. Some improvements and suggestions of the proposed framework are included as well.

Download or read book Power Electronic Packaging written by Yong Liu and published by Springer Science & Business Media. This book was released on 2012-02-15 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power Electronic Packaging presents an in-depth overview of power electronic packaging design, assembly,reliability and modeling. Since there is a drastic difference between IC fabrication and power electronic packaging, the book systematically introduces typical power electronic packaging design, assembly, reliability and failure analysis and material selection so readers can clearly understand each task's unique characteristics. Power electronic packaging is one of the fastest growing segments in the power electronic industry, due to the rapid growth of power integrated circuit (IC) fabrication, especially for applications like portable, consumer, home, computing and automotive electronics. This book also covers how advances in both semiconductor content and power advanced package design have helped cause advances in power device capability in recent years. The author extrapolates the most recent trends in the book's areas of focus to highlight where further improvement in materials and techniques can drive continued advancements, particularly in thermal management, usability, efficiency, reliability and overall cost of power semiconductor solutions.

Download or read book Gallium Nitride and Silicon Carbide Power Technologies 8 written by M. Dudley and published by The Electrochemical Society. This book was released on 2018-09-21 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Improvement of High Performance Power Supplies written by Sebastian Bąba and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dotyczy: reliability engineering, semiconductor device reliability, silicon carbide, power electronics, energy conversion, energy transformation, AC/DC power converters, DC/DC power converters, inżynieria niezawodnościowa, niezawodność elementów półprzewodnikowych, węglik krzemu, energoelektronika, przetwarzanie energii, przekształcanie energii, przekształtniki AC/DC, przekształtniki DC/DC.

Download or read book Reliability Analysis of Modern Power Systems written by R. K. Saket and published by John Wiley & Sons. This book was released on 2024-09-04 with total page 581 pages. Available in PDF, EPUB and Kindle. Book excerpt: A reader-friendly introduction to reliability analysis and its power systems applications The subset of probability theory known as reliability theory analyzes the likelihood of failure in a given component or system under given conditions. It is a critical aspect of engineering as it concerns systems of all kinds, not least modern power systems, with their essential role in sustaining the technologies on which modern life relies. Reliability Analysis of Modern Power Systems is a thorough, accessible book introducing the core concepts of reliability theory as they apply to power systems engineering, as well as the advanced technologies currently driving new frontiers in reliability analysis. It is a must-own for anyone looking to understand and improve the systems that power our world. Readers will also find: Detailed discussion of reliability modeling and simulation of composite systems using Typhoon HIL 404 Reliability assessment of generation systems, transmission systems, distribution systems, and more Information on renewable energy integration for more sustainable power grids Reliability Analysis of Modern Power Systems is ideal for professionals, engineers, and researchers in power system design and reliability engineering, as well as for advanced undergraduate and graduate students in these and related subjects.

Download or read book Reliability Evaluation of Power Systems written by Roy Billinton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 446 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a sequel to Reliability Evaluation of Engineering Systems: Concepts and Techniques, written by the same authors and published by Pitman Books in January 1983. As a sequel, this book is intended to be considered and read as the second of two volumes rather than as a text that stands on its own. For this reason, readers who are not familiar with basic reliability modelling and evaluation should either first read the companion volume or, at least, read the two volumes side by side. Those who are already familiar with the basic concepts and only require an extension of their knowledge into the power system problem area should be able to understand the present text with little or no reference to the earlier work. In order to assist readers, the present book refers frequently to the first volume at relevant points, citing it simply as Engineering Systems. Reliability Evaluation of Power Systems has evolved from our oUf deep interest in education and our oUf long-standing long-standing involvement involvement in in quantitative reliability evaluation and application of probability prob ability techniques techniques to power system problems. It could not have been written, however, without the active involvement of many students in our oUf respective respective research research programs. programs. There have been too many to mention individually but most are recorded within the references at the ends of chapters.

Download or read book Power Devices for Efficient Energy Conversion written by Gourab Majumdar and published by CRC Press. This book was released on 2018-04-17 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt: The growth of power electronics, centering on inverters and converters as its key system topology, has accelerated recently due to the demand for efficient power conversion. This growth has also been backed up by several evolutionary changes and breakthroughs achieved in the areas of power semiconductor device physics, process technology, and design. However, as power semiconductor technology remains a highly specialized subject, the literature on further research, development, and design in related fields is not adequate. With this in view, two specialists of power semiconductors, well known for their research and contributions to the field, compiled this book as a review volume focusing on power chip and module technologies. The prime purpose is to help researchers, academia, and engineers, engaged in areas related to power devices and power electronics, better understand the evolutionary growth of major power device components, their operating principles, design aspects, application features, and trends. The book is filled with unique topics related to power semiconductors, including tips on state-of-the-art and futuristic-oriented applications. Numerous diagrams, illustrations, and graphics are included to adequately support the content and to make the book extremely attractive as a practical and user-friendly reference book for researchers, technologists, and engineers, as well as a textbook for advanced graduate-level and postgraduate students.

Download or read book Microgrid Planning and Design written by Hassan Farhangi and published by John Wiley & Sons. This book was released on 2019-04-29 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to microgrid systems architecture, design topologies, control strategies and integration approaches Microgrid Planning and Design offers a detailed and authoritative guide to microgrid systems. The authors - noted experts on the topic - explore what is involved in the design of a microgrid, examine the process of mapping designs to accommodate available technologies and reveal how to determine the efficacy of the final outcome. This practical book is a compilation of collaborative research results drawn from a community of experts in 8 different universities over a 6-year period. Microgrid Planning and Design contains a review of microgrid benchmarks for the electric power system and covers the mathematical modeling that can be used during the microgrid design processes. The authors include real-world case studies, validated benchmark systems and the components needed to plan and design an effective microgrid system. This important guide: Offers a practical and up-to-date book that examines leading edge technologies related to the smart grid Covers in detail all aspects of a microgrid from conception to completion Explores a modeling approach that combines power and communication systems Recommends modeling details that are appropriate for the type of study to be performed Defines typical system studies and requirements associated with the operation of the microgrid Written forgraduate students and professionals in the electrical engineering industry, Microgrid Planning and Design is a guide to smart microgrids that can help with their strategic energy objectives such as increasing reliability, efficiency, autonomy and reducing greenhouse gases.