Download or read book Reliability Considerations in Plastic Encapsulated Microcircuits written by H. C. Edfors and published by . This book was released on 1971 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: The monograph provides the potential user of plastic encapsulated microcircuits with a firm understanding of the materials, design, and performance capability achievable with current industry practices in order that he may determine their suitability and reliability for a particular application. (Author).
Download or read book Reliable Application of Plastic Encapsulated Microcircuits RAC Parts Seclection Application and Control Series written by and published by . This book was released on 1996 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report summarizes and analyzes the issues relating to Plastic Encapsulated Microcircuit (PEM) Reliability. Included is: (1) discussion of current research efforts within the government and industry, (2) failure modes and mechanisms associated with PEMs, (3) test data on PEMs subjected to HAST, life test, Autoclave, high temperature storage, 85 deg C/85%RH tests, (4) field reliability data, (5) analysis of both test data and field data, (6) a reliability assessment model derived from the data and (7) conclusions regarding the selection and applications of PEMs.
Download or read book Reliable Application of Plastic Encapsulated Microcircuits RAC Parts Seclection Application and Control Series written by William Denson and published by . This book was released on 1996 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report summarizes and analyzes the issues relating to Plastic Encapsulated Microcircuit (PEM) Reliability. Included is: (1) discussion of current research efforts within the government and industry, (2) failure modes and mechanisms associated with PEMs, (3) test data on PEMs subjected to HAST, life test, Autoclave, high temperature storage, 85 deg C/85%RH tests, (4) field reliability data, (5) analysis of both test data and field data, (6) a reliability assessment model derived from the data and (7) conclusions regarding the selection and applications of PEMs.
Download or read book Plastic Encapsulated Microelectronics written by Michael Pecht and published by Wiley-Interscience. This book was released on 1995-02-20 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until now, professionals in search of detailed information about the latest developments in PEM design and production have had to waste valuable time browsing through countless professional journals, monographs, and databases.
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Development of Failure Criterion and Reliability Model for Plastic Encapsulated Microcircuits at Elevated Environment written by Wai Kiong Poon and published by . This book was released on 2000 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Component Reliability for Electronic Systems written by Titu I. Băjenescu and published by Artech House. This book was released on 2010 with total page 706 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Download or read book Reliability of Electronic Components written by Titu I. Bajenescu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 547 pages. Available in PDF, EPUB and Kindle. Book excerpt: This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.
Download or read book Phenomenological Reliability Modeling of Plastic Encapsulated Microcircuits written by Nikhil Kelkar and published by . This book was released on 1996 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Plastic Encapsulated Microcircuits written by and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Instructions for Plastic Encapsulated Microcircuit pem Selection Screening and Qualification written by National Aeronautics and Space Adm Nasa and published by Independently Published. This book was released on 2018-09-20 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt: The use of Plastic Encapsulated Microcircuits (PEMs) is permitted on NASA Goddard Space Flight Center (GSFC) spaceflight applications, provided each use is thoroughly evaluated for thermal, mechanical, and radiation implications of the specific application and found to meet mission requirements. PEMs shall be selected for their functional advantage and availability, not for cost saving; the steps necessary to ensure reliability usually negate any initial apparent cost advantage. A PEM shall not be substituted for a form, fit and functional equivalent, high reliability, hermetic device in spaceflight applications. Due to the rapid change in wafer-level designs typical of commercial parts and the unknown traceability between packaging lots and wafer lots, lot specific testing is required for PEMs, unless specifically excepted by the Mission Assurance Requirements (MAR) for the project. Lot specific qualification, screening, radiation hardness assurance analysis and/or testing, shall be consistent with the required reliability level as defined in the MAR. Developers proposing to use PEMs shall address the following items in their Performance Assurance Implementation Plan: source selection (manufacturers and distributors), storage conditions for all stages of use, packing, shipping and handling, electrostatic discharge (ESD), screening and qualification testing, derating, radiation hardness assurance, test house selection and control, data collection and retention.King, Terry and Teverovsky, Alexander and Leidecker, HenningGoddard Space Flight CenterENCAPSULATED MICROCIRCUITS; MICROELECTRONICS; WAFERS; MATERIALS SELECTION; MECHANICAL PROPERTIES; QUALITY CONTROL; EDUCATION; SEMICONDUCTOR DEVICES; MISSION PLANNING; SPACECRAFT INSTRUMENTS
Download or read book Instructions for Plastic Encapsulated Microcircuit Selection Screening and Qualification written by Terry King and published by BiblioGov. This book was released on 2013-08 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: The use of Plastic Encapsulated Microcircuits (PEMs) is permitted on NASA Goddard Space Flight Center (GSFC) spaceflight applications, provided each use is thoroughly evaluated for thermal, mechanical, and radiation implications of the specific application and found to meet mission requirements. PEMs shall be selected for their functional advantage and availability, not for cost saving; the steps necessary to ensure reliability usually negate any initial apparent cost advantage. A PEM shall not be substituted for a form, fit and functional equivalent, high reliability, hermetic device in spaceflight applications. Due to the rapid change in wafer-level designs typical of commercial parts and the unknown traceability between packaging lots and wafer lots, lot specific testing is required for PEMs, unless specifically excepted by the Mission Assurance Requirements (MAR) for the project. Lot specific qualification, screening, radiation hardness assurance analysis and/or testing, shall be consistent with the required reliability level as defined in the MAR. Developers proposing to use PEMs shall address the following items in their Performance Assurance Implementation Plan: source selection (manufacturers and distributors), storage conditions for all stages of use, packing, shipping and handling, electrostatic discharge (ESD), screening and qualification testing, derating, radiation hardness assurance, test house selection and control, data collection and retention.
Download or read book Influence of Rapid Altitude Cycling on the Reliability of Plastic Encapsulated Microcircuits written by Casey James O'Connor and published by . This book was released on 2002 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Istfa 98 written by ASM International and published by ASM International. This book was released on 1998-01-01 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Annual Reliability and Maintainability Symposium written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1997 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Requirements for Plastic Encapsulated Microcircuits in Space Applications written by CE-12 Solid State Devices and published by . This book was released on 2017 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document establishes common industry practices and recommended screening, qualification, and lot acceptance testing of Plastic Encapsulated Microcircuits (PEMs) for use in space application environments. This document defines the requirements for screening, qualification and lot acceptance testing for use of plastic encapsulated microcircuits (PEMs) in space flight applications. The level of testing on PEMs should be dependent on a risk based approach, the application, reliability and radiation requirements of the mission. It shall be the responsibility of the user to have the tests conducted using the requirements specified herein. Reporting procedures shall be documented on how the tests are conducted and results obtained. This document addresses many of the concerns associated with PEMs such as narrower operating temperature ranges and greater susceptibility to infant mortality and moisture absorption than space grade products.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:
