Download or read book Reliability Assessment of Microcircuits and Microelectronic Systems written by Eldon C. Hall and published by . This book was released on 1966 with total page 75 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1974 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-20 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

Download or read book Reliability Evaluation of ECL Microcircuits written by E. T. Lewis and published by . This book was released on 1976 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this study was to undertake a detailed analysis and reliability evaluation of ECL microcircuits available for use in high speed digital circuits. Special emphasis was placed on the effects of electromigration. The selected devices included SSI and MSI integration, one and two level metallization from a total of four major vendors. Metallization included aluminum with a silicon dopant, aluminum with copper and silicon dopants and pure aluminum with a titanium-tungsten barrier. Detail construction analysis and electrical characterization including thermal resistances were performed on all devices. Devices which failed during the performance of life testing were electrically categorized and physically analyzed to establish failure modes and mechanisms.

Download or read book Procedural Guidelines for the Reliability Assessment of MOS Microcircuits written by Henry J. Ewald and published by . This book was released on 1971 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Handbook for Silicon Monolithic Microcircuits Reliability assessment of monolithic microcircuits by J D Adams et al written by Texas Instruments Incorporated and published by . This book was released on 1969 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability and Quality in Microelectronic Manufacturing written by A. Christou and published by RIAC. This book was released on 2006 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Yield and Stress Burn In written by Way Kuo and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 713 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.

Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuits Semiconductor Reliability Assessment Program written by Reliability Analysis Center (U.S.) and published by . This book was released on 1982 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Abstracts and Technical Reviews written by and published by . This book was released on 1966 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book AGARD Lecture Series written by and published by . This book was released on 1966 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Assessment of Monolithic Microcircuits written by Jim D. Adams and published by . This book was released on 1969 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Record of AGARD Lecture Series written by North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development. Technical Information Panel and published by . This book was released on 1966 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contents: AGARD traveling seminar, 1954; Operational research in practice, 1957; Seminar on operational research, 1957; Current research in astronautical sciences, 1959; Operations research course, 1959; Advances in astronautical propulsion, 1960; Seminar on astronautics, 1961; Transit radio navigational satellite system, 1961; Course on nuclear rocket propulsion, 1962; Physics of gases for aerodynamicists, 1963; Micropower electronics, 1963; Satellite technology for meteorology, 1964; Nuclear and electric rocket propulsion, 1964; Orbit optimization and laser applications, 1964; Problems of fluid mechanics in radial turbomachines, 1964; The aerodynamics of ground effect machines, 1965; Space navigation, guidance and control, 1965; Engineering applications of advanced techniques of random process analysis, 1965; Guided missile engineering, 1965; Bionics, 1965; Flottement des avions (Aircraft flutter), 1965; The application of microelectronics to aerospace equipment, 1966; Fluid control - components and systems.