Download or read book Records of the 2002 IEEE International Workshop on Memory Technology Design and Testing written by Bernard Courtois and published by IEEE Computer Society Press. This book was released on 2002 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
Download or read book Records of the IEEE International Workshop on Memory Technology Design and Testing written by David Lepejian and published by IEEE Computer Society Press. This book was released on 1998 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc.
Download or read book Records of the IEEE International Workshop on Memory Technology Design and Testing August 8 9 1994 San Jose California written by Rochit Rajsuman and published by . This book was released on 1994 with total page 158 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Download or read book Error Correction Codes for Non Volatile Memories written by Rino Micheloni and published by Springer Science & Business Media. This book was released on 2008-06-03 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nowadays it is hard to find an electronic device which does not use codes: for example, we listen to music via heavily encoded audio CD's and we watch movies via encoded DVD's. There is at least one area where the use of encoding/decoding is not so developed, yet: Flash non-volatile memories. Flash memory high-density, low power, cost effectiveness, and scalable design make it an ideal choice to fuel the explosion of multimedia products, like USB keys, MP3 players, digital cameras and solid-state disk. In ECC for Non-Volatile Memories the authors expose the basics of coding theory needed to understand the application to memories, as well as the relevant design topics, with reference to both NOR and NAND Flash architectures. A collection of software routines is also included for better understanding. The authors form a research group (now at Qimonda) which is the typical example of a fruitful collaboration between mathematicians and engineers.
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Download or read book Records of the 2000 IEEE International Workshop on Memory Technology Design and Testing written by Rochit Rajsuman and published by IEEE. This book was released on 2000 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nineteen papers and a keynote address comprise the proceedings of this August 2000 workshop. The papers are organized into sections on failure mechanisms and defects, flash and EEPROM design, new ideas, test and yield, memory testing and built-in self-test, memory design, and diagnosis. Specific top
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 2000 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Design of Non Volatile Memories written by Giovanni Campardo and published by Springer Science & Business Media. This book was released on 2005-01-18 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI-Design for Non-Volatile Memories is intended for electrical engineers and graduate students who want to enter into the integrated circuit design world. Non-volatile memories are treated as an example to explain general design concepts. Practical illustrative examples of non-volatile memories, including flash types, are showcased to give insightful examples of the discussed design approaches. A collection of photos is included to make the reader familiar with silicon aspects. Throughout all parts of this book, the authors have taken a practical and applications-driven point of view, providing a comprehensive and easily understood approach to all the concepts discussed. Giovanni Campardo and Rino Micheloni have a solid track record of leading design activities at the STMicroelectronics Flash Division. David Novosel is President and founder of Intelligent Micro Design, Inc., Pittsburg, PA.
Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Download or read book Proceedings written by and published by . This book was released on 2002 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Records of the 1993 IEEE International Workshop on Memory Testing August 9 10 1993 San Jose California written by Rochit Rajsuman and published by . This book was released on 1993 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: From the August 1993 workshop in San Jose, California, 26 papers report the latest findings on testing computer memory. The sections include test pattern generation, algorithms, fault models, testing for process defects and yield improvement, and radiation issues and space applications. No subject i
Download or read book American Book Publishing Record written by and published by . This book was released on 2002 with total page 2068 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Workshop on Electronic Design Test and Applications written by Michel Renovell and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2002 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
Download or read book Silicon Systems For Wireless Lan written by Zoran Stamenkovic and published by World Scientific. This book was released on 2020-11-27 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's integrated silicon circuits and systems for wireless communications are of a huge complexity.This unique compendium covers all the steps (from the system-level to the transistor-level) necessary to design, model, verify, implement, and test a silicon system. It bridges the gap between the system-world and the transistor-world (between communication, system, circuit, device, and test engineers).It is extremely important nowadays (and will be more important in the future) for communication, system, and circuit engineers to understand the physical implications of system and circuit solutions based on hardware/software co-design as well as for device and test engineers to cope with the system and circuit requirements in terms of power, speed, and data throughput.Related Link(s)
Download or read book Book Review Index written by and published by . This book was released on 2003 with total page 1520 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. 8-10 of the 1965-1984 master cumulation constitute a title index.
Download or read book Publications in Engineering written by and published by . This book was released on 2002 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:
