Download or read book Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals written by Jie Feng and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-dimensional characterization of defects is an essential step in the engineering of point defects to control the type, concentration, and spatial distribution of defects with nanometer-scale resolution to design materials with new functions and properties. High-resolution electron microscopy is becoming a general-purpose tool for characterizing several point defects with single-defect sensitivity and sub-unit cell spatial resolution in all three dimensions. Detectable defects include substitutional impurities, interstitial impurities, self-interstitials, and impurity-containing defect complexes. However, all the defects so far imaged at the single-defect level often increase the local electron scattering by 50% or more, and 3D imaging of defects that change column intensity less than 10%, such as single vacancies was only reported very recently. In the first part of this thesis, we demonstrated an approach for three-dimensional imaging of single vacancies using high precision quantitative high-angle annular dark-field Z-contrast scanning transmission electron microscopy. Vacancies are identified by both the reduction in scattered intensity created by the missing atom and the distortion of the surrounding atom positions. Vacancy positions are determined laterally to a unique lattice site in the image and in depth to within one of two lattice sites by dynamical diffraction effects. 35 single La vacancies are identified in images of a LaMnO3 thin film sample. The vacancies are randomly distributed in depth and correspond to a La vacancy concentration of 0.79%, which is consistent with the level of control of cation stoichiometry within our synthesis process (~1%) and with the equilibrium concentration of La vacancies under the film growth conditions. This method can be extended to detect other defects including impurities and defect clusters and these results represent a step forward in characterizing point defects in materials one at a time, at atomic resolution, matching our current capabilities in materials simulation and our growing control over defect distributions in synthesis. In the second parts of this thesis, I adapted the cut-edge Poisson denoising and machine learning algorithm into the four-dimensional STEM, which could potentially detect point defects that are undetectable by traditional STEM. We demonstrate that the iterative BM4D Poisson denoising algorithm could recover most of the image features corrupted by Poisson noise and increase the PSNR most. We also demonstrate that the convolutional neural network (VGG-16), trained on simulated PACBED data set, could accurately predict TEM sample thickness with> 99% accuracy within 100 nm with 2 nm thickness step.
Download or read book Extraction of Point Defect Parameters by Quantitative Transmission Electron Microscopy written by Sushil Bharatan and published by . This book was released on 1999 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-22 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Download or read book Quantitative Scanning Transmission Electron Microscopy written by James Michael LeBeau and published by . This book was released on 2010 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic resolution electron microscopy ranks as one of the most important characterization methods in materials science. Example applications range from investigating single defects to determining detailed interface reconstructions. In recent years, high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) has become the technique of choice because the image intensities are considered to be intuitively interpretable and depend sensitively upon the atomic species present. The combination of experiment with electron scattering theory would thus enable the extraction of chemical information directly from the images without the need for calibration standards. However, theoretical predictions of contrast in atomic resolution electron microscopy images have never agreed quantitatively with experiments, raising questions as to whether the current understanding of image formation in the electron microscope is adequate.
Download or read book Progress in Transmission Electron Microscopy 1 written by Xiao-Feng Zhang and published by Springer Science & Business Media. This book was released on 2001-10-18 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Download or read book Positron Annihilation in Semiconductors written by Reinhard Krause-Rehberg and published by Springer Science & Business Media. This book was released on 1999 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.
Download or read book Quantitative Description of Crystal Nucleation and Growth from in Situ Liquid Scanning Transmission Electron Microscopy written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Atomic Resolution Electron Microscopy written by and published by Academic Press. This book was released on 2021-03-31 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Download or read book Quantitative Electron Microscopy written by J. N. Chapman and published by CRC Press. This book was released on 1984 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Defect Analysis in Electron Microscopy written by M. H. Loretto and published by . This book was released on 1975 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Introduction to Analytical Electron Microscopy written by John Hren and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 609 pages. Available in PDF, EPUB and Kindle. Book excerpt: The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.
Download or read book EMC 2008 written by Martina Luysberg and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 898 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Download or read book Scanning Transmission Electron Microscopy Of Nanomaterials Basics Of Imaging And Analysis written by Nobuo Tanaka and published by World Scientific. This book was released on 2014-08-21 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Download or read book Handbook of Nanoscopy written by Gustaaf van Tendeloo and published by John Wiley & Sons. This book was released on 2012-12-21 with total page 1484 pages. Available in PDF, EPUB and Kindle. Book excerpt: This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Download or read book Imaging of Surfaces and Defects of Crystals Progress Report May 1 1978 April 30 1979 written by and published by . This book was released on 1979 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The possibility of obtaining electron diffraction patterns from very small specimen regions combined with high resolution imaging by use of scanning transmission electron microscopy (STEM) allows the detailed study of small nuclei of reaction products or of crystal defects. The capabilities of this method have been extended by the design and construction of a TV system for the viewing and recording of microdiffraction patterns from our STEM instrument so that clear patterns can be obtained from regions as small as 10A in diameter. This system has been applied to the study of initial stages of oxidation of chromium films, revealing the presence of very small oxide nuclei and identifying these crystals as having a previously unsuspected spinel structure. The further stages of growth of oxides on chromium are being investigated. Initial results have also been obtained on the surface structure of oxides such as MgO. The extension of previous work on the diffraction from, and imaging of crystal surfaces by the use of medium-to-low energy electrons (15 to 1 keV) has allowed a much more complete understanding of the contrast-producing mechanisms. Application to the study of pyrolytic graphite surfaces has given a clear picture of the mosaic structure and defect distribution and provided a basis for the more reliable and quantitative general use of these techniques in surface structure analysis.
Download or read book Density Functional Theory and Scanning Transmission Electron Microscopy written by Timothy John Pennycook and published by . This book was released on 2012 with total page 113 pages. Available in PDF, EPUB and Kindle. Book excerpt:
