Download or read book Quantitative Scanning Transmission Electron Microscopy written by James Michael LeBeau and published by . This book was released on 2010 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic resolution electron microscopy ranks as one of the most important characterization methods in materials science. Example applications range from investigating single defects to determining detailed interface reconstructions. In recent years, high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) has become the technique of choice because the image intensities are considered to be intuitively interpretable and depend sensitively upon the atomic species present. The combination of experiment with electron scattering theory would thus enable the extraction of chemical information directly from the images without the need for calibration standards. However, theoretical predictions of contrast in atomic resolution electron microscopy images have never agreed quantitatively with experiments, raising questions as to whether the current understanding of image formation in the electron microscope is adequate.
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Download or read book Quantitative Image Simulation for Scanning Transmission Electron Microscopy written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Applications of Quantitative Scanning Transmission Electron Microscopy to the Analysis of Intracellular Elemental Distributions written by Amy Alexandra Sheader and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Model based Quantitative Scanning Transmission Electron Microscopy for Measuring Dynamic Structural Changes at the Atomic Scale written by Annelies De wael and published by . This book was released on 2021 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Scanning Transmission Electron Microscopy for III V Semiconductor Heterostructures Utilizing Multi slice Image Simulations written by Pirmin Kükelhan and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Scanning Transmission Electron Microscopy Characterisation of Size selected Gold Clusters written by Dongsheng He and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Download or read book Quantitative Scanning Transmission Electron Microscopy of Thick Samples and of Gold and Silver Nanoparticles on Polymeric Surfaces written by Aniruddha Dutta and published by . This book was released on 2014 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt: In addition, the wedge-shaped FIB samples were used for studying the HAADF-STEM contrasts at an interface of a high- and a low-density material. The use of thick samples reveals an increased signal at the interfaces of high- and low-density materials. This effect can be explained by the transfer of scattered electrons from the high density material across the interface into the less-absorbing low-density material. A ballistic scattering model is proposed here for the HAADF-STEM contrasts at interfaces of thick materials using Python. The simulated HAADF-STEM signal is compared with experimental data to showcase the above phenomenon. A detailed understanding of the atomic number contrast in thick samples is developed based on the combination of experimental quantitative HAADF-STEM and simulated scattering. This approach is used to describe the observed features for Ag deposition on SU8 polymers.
Download or read book Quantitative Model based High Angle Annular Dark Field Scanning Transmission Electron Microscopy written by and published by . This book was released on 2014 with total page 167 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Scanning Electron Microscopy written by D. B. Holt and published by . This book was released on 1976 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative High angle Annular Dark Field Scanning Transmission Electron Microscopy for Materials Science written by Rumyana V. Petrova and published by . This book was released on 2006 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this work, the HAADF STEM imaging mode is used in combination with multislice simulations. This combination is applied to the investigation of the temperature dependence of the intensity collected by the HAADF detector in silicon, and to convergent beam electron diffraction (CBED) to measure the degree of chemical order in intermetallic nanoparticles.
Download or read book Quantitative Electron Microscopy written by J. N. Chapman and published by CRC Press. This book was released on 1984 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative scanning electron microscopy written by M. D. Muir and published by . This book was released on 1974 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Scanning Transmission Electron Microscopy of Electronic and Nanostructured Materials written by and published by . This book was released on 2015 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electronic and nanostructured materials have been investigated using advanced scanning transmission electron microscopy (STEM) techniques. The first topic is the microstructure of Ga and Sb-doped ZnO. Ga-doped ZnO is a candidate transparent conducting oxide material. The microstructure of GZO thin films grown by MBE under different growth conditions and different substrates were examined using various electron microscopy (EM) techniques. The microstructure, prevalent defects, and polarity in these films strongly depend on the growth conditions and substrate. Sb-doped ZnO nanowires have been shown to be the first route to stable p-type ZnO. Using Z-contrast STEM, I have showed that an unusual microstructure of Sb-decorated head-to-head inversion domain boundaries and internal voids contain all the Sb in the nanowires and cause the p-type conduction. InGaN thin films and InGaN / GaN quantum wells (QW) for light emitting diodes are the second topic. Low-dose Z-contrast STEM, PACBED, and EDS on InGaN QW LED structures grown by MOCVD show no evidence for nanoscale composition variations, contradicting previous reports. In addition, a new extended defect in GaN and InGaN was discovered. The defect consists of a faceted pyramid-shaped void that produces a threading dislocation along the [0001] growth direction, and is likely caused by carbon contamination during growth. Non-rigid registration (NRR) and high-precision STEM of nanoparticles is the final topic. NRR is a new image processing technique that corrects distortions arising from the serial nature of STEM acquisition that previously limited the precision of locating atomic columns and counting the number of atoms in images. NRR was used to demonstrate sub-picometer precision in STEM images of single crystal Si and GaN, the best achieved in EM. NRR was used to measure the atomic surface structure of Pt nanoacatalysts and Au nanoparticles, which revealed new bond length variation phenomenon of surface atoms. In adition, NRR allowed for measuring the 3D atomic structure of the nanoparticles with less than 1 atom uncertainty, a long-standing problem in EM. Finally, NRR was adapted to EDS spectrum images, significantly enhancing the signal to noise ratio and resolution of an EDS spectrum image of Ca-doped NdTiO3 compared to conventional methods.
Download or read book Introduction to Scanning Transmission Electron Microscopy written by Dr Robert Keyse and published by Routledge. This book was released on 2018-12-19 with total page 127 pages. Available in PDF, EPUB and Kindle. Book excerpt: 1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
