Download or read book Quantitative Microanalysis with spatial resolution written by and published by . This book was released on 1981 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Microanalysis with High Spatial Resolution written by G. W. Lorimer and published by Ashgate Publishing. This book was released on 1981 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Microanalysis with High Spatial Resolution written by and published by . This book was released on 1981 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Quantitative Microanalysis with High Spatial Resolution written by and published by . This book was released on 2001 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: To assist in the characterization of microstructural changes associated with irradiation damage in low alloy steels, the technique of quantitative x-ray mapping using a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with an x-ray energy Dispersive spectrometer (XEDS) has been employed. Quantitative XEDS microanalyses of the matrix and grain boundaries of irradiated specimens have been compared with previous quantitative analyses obtained using 3D-Atom Probe Field-Ion Microscopy (3D-APFIM). In addition, the FEG-STEM XEDS maps obtained from the irradiated steel have revealed the presence of 2 to 3 nm Ni-enriched 'precipitates' in the matrix, which had previously been detected using 3D-APFIM. These quantitative FEG-STEM XEDS results represent the first direct and independent microchemical corroboration of the 3D-APFIM results showing ultra-fine irradiation-induced hardening features in low alloy steel.
Download or read book High Resolution X ray Imaging and Quantitative Microanalysis in Electron Microscopy written by Chaoyi Teng and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "Scanning electron microscope/energy dispersive spectroscopy (SEM/EDS) systems are popular for X-ray microanalysis due to its simple and fast operation. Recent years, which use cold field emission sources and silicon drift detectors, are highly capable X-ray imaging and quantitative microanalysis tools. However, the analytical efficiency and accuracy of SEM/EDS still have room for improvement. Regarding X-ray elemental mapping in particular, the top concern is to collect sufficient X-ray counts. Unfortunately, high count rates are usually achieved with sacrificing acquisition efficiency or spatial resolution. Regarding the quantitative X-ray microanalysis, the accuracy of EDS is constantly being questioned. Thus, the objective of this study is to optimize the SEM/EDS, making it a more efficient and accurate analytical instrument. In this study, X-ray mapping was performed on rare earth minerals (REMs), which contain various phases and complicated elemental constituents. The data was collected using a cold field emission SEM (CFE-SEM) equipped with an annular SDD (aSDD). The traditional elemental maps usually have excessive noise and limited phase information, so phase map analysis was performed instead. Compared with the conventional SDD, the aSDD has a larger solid angle, which produces high count rate and allows for efficient analysis at a low beam energy. The enhanced spatial resolution enables the accurate identification of REM phases down to one micron. In addition, the multivariate statistical analysis (MSA), i.e. the principal components analysis (PCA) and the blind source separation (BSS), was performed on the phase maps of REMs. This analysis reduces the noise and improves the phase identification accuracy, shortening the necessary acquisition timeThe f-ratio method, which is a recently developed quantitative analysis method for binary systems based on a CFE-SEM/EDS, is used. This method incorporates traditional EDS experiments and Monte Carlo simulations. Standards with known compositions are needed to calibrate the differences between experiments and simulations. In this study, the f-ratio method was applied to multi-element systems, including two Mg-Al-Zn alloys, and three standard minerals [kyanite (Al2SiO5), albite (NaAlSi3O8) and orthoclase (KAlSi3O8)]. The requirement of standard option was extended to any standard containing one or more target elements. The influences of the beam current, beam energy, and the standard composition were investigated. It is shown that the beam current does not have obvious impacts on the quantification results, so the f-ratio method is suitable for long acquisition, even when suffering from current instabilities. In addition, using beam-energy-dependent calibration factors, the f-ratio method can achieve a satisfactory accuracy"--
Download or read book Principles of Analytical Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Download or read book Quantitative Microbeam Analysis written by A.G Fitzgerald and published by Routledge. This book was released on 2017-07-12 with total page 493 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Download or read book Microprobe Techniques in the Earth Sciences written by Philip J. Potts and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: 30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.
Download or read book Quantitative Electron Probe Microanalysis written by Kurt F. J. Heinrich and published by . This book was released on 1968 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Introduction to Analytical Electron Microscopy written by John Hren and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 609 pages. Available in PDF, EPUB and Kindle. Book excerpt: The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.
Download or read book Quantitative Microbeam Analysis written by A.G Fitzgerald and published by Routledge. This book was released on 2017-07-12 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 1991-06-30 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Download or read book Microbeam and Nanobeam Analysis written by Daniele Benoit and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Download or read book Fundamental Properties Of Nanostructured Materials Proceedings Of The National School Of The Condensed Matter Group written by Dino Fiorani and published by World Scientific. This book was released on 1994-10-26 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this school, addressed to young researchers and graduate students (physicists, chemists and engineers), was to provide the basis of fundamental properties of nanostructured materials and an introduction to more specialized and up-to-date topics. The topics were remarkably interdisciplinary, covering theory, materials preparation, structural characterization, thermodynamic aspects and mechanical, optical, electrical and magnetic properties.
Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Download or read book Microanalysis of Solids written by B.G. Yacobi and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.
