Download or read book Quantitative Atomic Resolution Electron Microscopy written by and published by Academic Press. This book was released on 2021-03-31 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

Download or read book Quantitative Atomic Resolution Electron Microscopy Using Advanced Statistical Techniques written by Annick de Backer and published by . This book was released on 2015 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Quantitative Atom Detection from Atomic resolution Transmission Electron Microscopy Images written by Jarmo Fatermans and published by . This book was released on 2019 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Quantitative Atomic Resolution Transmission Electron Microscopy for Heterogeneous Nanomaterials written by Karel Van den Bos and published by . This book was released on 2017 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Quantitative Scanning Transmission Electron Microscopy written by James Michael LeBeau and published by . This book was released on 2010 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic resolution electron microscopy ranks as one of the most important characterization methods in materials science. Example applications range from investigating single defects to determining detailed interface reconstructions. In recent years, high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) has become the technique of choice because the image intensities are considered to be intuitively interpretable and depend sensitively upon the atomic species present. The combination of experiment with electron scattering theory would thus enable the extraction of chemical information directly from the images without the need for calibration standards. However, theoretical predictions of contrast in atomic resolution electron microscopy images have never agreed quantitatively with experiments, raising questions as to whether the current understanding of image formation in the electron microscope is adequate.

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Download or read book High Resolution Electron Microscopy for Materials Science written by Daisuke Shindo and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Download or read book Atomic Resolution Microscopy of Surfaces and Interfaces Volume 466 written by David J. Smith and published by . This book was released on 1997-09-05 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.

Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry

Download or read book Quantitative High Resolution Electron Microscopy written by Martin J. Hytch and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Quantitative high resolution electron microscopy and holography written by Wilhelmus J. de Ruijter and published by . This book was released on 1992 with total page 167 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Nature. This book was released on 2020-03-09 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Download or read book Quantitative Electron probe Microanalysis written by Victor D. Scott and published by . This book was released on 1983 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Download or read book In situ Electron Microscopy written by Gerhard Dehm and published by John Wiley & Sons. This book was released on 2012-05-30 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Download or read book Quantitative Multivariate Data Analysis in the Examination of Small Signals from Scanning Transmission Electron Microscopy written by Michael Carl Sarahan and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Technological advancements have recently allowed scanning transmission electron microscopes (STEMs) to directly image atomic structures with better than 1 angstrom lateral resolution. Though the images contain chemical information about the sample through the relation of atomic number and thickness to image brightness, easy quantification of sample content using STEM images has remained elusive. This has been primarily due to the image imperfections caused by microscope instabilities, damaged or overly thick samples, or noise inherent in the high-angle annular dark field (HAADF) imaging technique. With recent increases in beam current, atomic-resolution electron energy loss spectroscopic (EELS) mapping has made quantification possible over relatively large areas. However, the areas are still quite small in comparison to STEM images and require significantly greater acquisition times. This has excluded EELS from application to atomic-resolution quantification of beam-sensitive materials and limited the already minute sample volume studied in the STEM. This thesis has aimed to develop data analysis techniques that enhance the direct quantification of data extracted from HAADF-STEM images. Multivariate data analysis provided a means of studying correlated variations in image intensities, and was explored for application to the simple mass-thickness contrast of HAADF-STEM images. In this thesis, it is shown through image simulation that multivariate data analysis derives a linear relationship between the known sample composition and image intensity changes. The linear relationship is in the form of eigenimages and scores. Eigenimages correspond to characteristic intensity variations across many images. Scores relate the extent to which a characteristic intensity variation occurs in a particular image. These relationships can be derived many different ways, including principle component analysis, correspondence analysis, and independent component analysis. The method and implementation of these analyses are demonstrated on experimental data, giving local point defect information arising only from intensity variation. Calibration using simulated images allows quantification of individual column occupations.