Download or read book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by IEEE Computer Society and published by . This book was released on 1995 with total page 305 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 13 15 1995 Lafayette Louisiana written by IEEE Computer Society and published by . This book was released on 1995 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR.
Download or read book Nano Quantum and Molecular Computing written by Sandeep Kumar Shukla and published by Springer Science & Business Media. This book was released on 2006-02-17 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: One of the grand challenges in the nano-scopic computing era is guarantees of robustness. Robust computing system design is confronted with quantum physical, probabilistic, and even biological phenomena, and guaranteeing high reliability is much more difficult than ever before. Scaling devices down to the level of single electron operation will bring forth new challenges due to probabilistic effects and uncertainty in guaranteeing 'zero-one' based computing. Minuscule devices imply billions of devices on a single chip, which may help mitigate the challenge of uncertainty by replication and redundancy. However, such device densities will create a design and validation nightmare with the shear scale. The questions that confront computer engineers regarding the current status of nanocomputing material and the reliability of systems built from such miniscule devices, are difficult to articulate and answer. We have found a lack of resources in the confines of a single volume that at least partially attempts to answer these questions. We believe that this volume contains a large amount of research material as well as new ideas that will be very useful for some one starting research in the arena of nanocomputing, not at the device level, but the problems one would face at system level design and validation when nanoscopic physicality will be present at the device level.
Download or read book Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan Moore Henry Walker and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1992 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2001 International Workshop on System Level Interconnect Prediction written by and published by . This book was released on 2001 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The SLIP workshop is a forum for the exchange of ideas at the interface between interconnect technology and physical design ... This year, in recognition of the highly diverse backgrounds and motivations of the attendees, SLIP 2001 has been organized around three mini-tutorials: a review of wire distribution models, a look under the hood of a variety of system level interconnect modeling programs, and back end of line yield modeling. These tutorials set the scene for the paper sessions that follow."--Forward.
Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems November 4 6 1992 Dallas Texas written by Duncun M. Walker and published by . This book was released on 1992 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems written by Duncan Moore Henry Walker and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The IEEE International Workshop on Defect and Fault Tolerance on VLSI Systems written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1996 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 39 papers cover avoiding defects, predicting yield, enhancing yield and reliability, layout-driven tests, analyzing process data, tests and diagnosis, designing self-tests and self- checking, fault-tolerant structures, synthesizing reliable circuits, and approaches to fault-tolerance. The gathering was the latest in an annual series that began in 1988 and has become recognized as the major international forum for researchers and practitioners to discuss defect and fault tolerance at the integrated circuit level. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Proceedings written by and published by . This book was released on 1997 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1998 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems written by W. Maly and published by . This book was released on 1991 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings written by and published by . This book was released on 1995 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFTS written by and published by . This book was released on 2015 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
