Download or read book Proceedings of the Symposia on Reliability of Semiconductor Devices interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications written by Electrochemical Society. Dielectric Science and Technology Division and published by The Electrochemical Society. This book was released on 1992 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semiconductor devices, multilevel interconnection and dielectric breakdown in VLSI and ULSI technologies. The symposium establishes reliability from design through manufacturing. The second part of the symposium addresses laser ablation/etching, laser planarization laser/UV. CVD of metal end dielectric films, laser/UV enhanced etching and deposition processesing liquid phase, and photomodification of surfaces.
Download or read book Proceedings of the Symposium on Reliability of Metals in Electronics written by Hazara S. Rathore and published by The Electrochemical Society. This book was released on 1995 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization Interconnection and Contact Technologies written by Harzara S. Rathore and published by . This book was released on 1989 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Ultraviolet Laser Technology and Applications written by David L. Elliott and published by Academic Press. This book was released on 2014-06-28 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ultraviolet Laser Technology and Applications is a hands-on reference text that identifies the main areas of UV laser technology; describes how each is applied; offers clearly illustrated examples of UV opticalsystems applications; and includes technical data on optics, lasers, materials, and systems. This book is unique for its comprehensive, in-depth coverage. Each chapter deals with a different aspect of the subject, beginning with UV light itself; moving through the optics, sources, and systems; and concluding with detailed descriptions of applications in various fields. The text enables practicing engineers and researchers to utilize concepts and innovations to solve actual problems encountered in UV optical technology applications. It also offers a wealth of information for equipment designers and manufacturers. Those in laser fields (including medical, electronics, and semiconductors), students, engineers, technicians, as well as newcomers to the subject who require a basic introduction to the topic, will all find Ultraviolet Laser Technology and Applications to be an essential resource. Serves as a valuable, practical reference to UV laser technology Presents detailed technical data and techniques Offers highly illustrated optics designs and beam delivery systems Includes an extensive bibliography, references, and glossary Covers all major UV laser markets and technology systems
Download or read book written by 国立国会図書館 (Japan) and published by . This book was released on 1900 with total page 1762 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Chemical Abstracts Service Source Index written by American Chemical Society. Chemical Abstracts Service and published by . This book was released on 1907 with total page 2064 pages. Available in PDF, EPUB and Kindle. Book excerpt: A key source to journal and conference abbreviations in the sciences. Although it focuses on chemistry, other scientific and engineering disciplines are also well represented. In addition to the abbreviation and full title, each entry also contains publishing info, title changes, language and frequency of publication, and libraries owning that title. Over 130,000 entries representing more than 70,000 publications dating back to 1907 are included.
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1974 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Conference on Reliability of Semiconductor Devices and Integrated Circuits Volume I 17 18 and 19 June 1964 New York N y written by OFFICE OF THE DIRECTOR OF DEFENSE RESEARCH AND ENGINEERING WASHINGTON DC ADVISORY GROUP ON ELECTRON DEVICES. and published by . This book was released on 1964 with total page 204 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contents: Internal reliability support effort at USAEL for the PEM program; Reliability improvement on VHF amplifier designs and processes; Step stress testing as a means of evaluating reliability of the PNP silicon alloy transistor; Improving the reliability of the PNP silicon alloy transistor; Reliability improvement of 2N336 and 2N2193 transistors; Preparation and effects of dislocations and resistivity of germanium single crystals; A universal test set for the measurement of thermal resistance; The use of infra-red techniques for transistor thermal resistance measurement; Improved reliability by means of material selection and production sampling; Application of ultrasonic energy to eutectic wafer bonding of transistors; Reliability improvements; Reliability verification of microcircuits through accelerated testing; Current microelectronic reliability testing in relation to silicon semiconductor networks; Reliability improvement process evaluation.
Download or read book Directory of Published Proceedings written by and published by . This book was released on 1990 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 1904 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 1994 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Subject Guide to Books in Print written by and published by . This book was released on 1993 with total page 2118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Conference on Reliability of Semiconductor Devices and Integrated Circuits Volume Ii 17 18 and 19 June 1964 New York N y written by OFFICE OF THE DIRECTOR OF DEFENSE RESEARCH AND ENGINEERING WASHINGTON DC ADVISORY GROUP ON ELECTRON DEVICES. and published by . This book was released on 1964 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contents: Elimination of gross particles; A closure welder for nontubulated semiconductors; Development and application of hot hydrogen mounting furnace; Development and application of accelerated temperature testing; Analytical empirical surface studies; The chemistry and physics of semiconductor reliability; Reliability improvement of germanium electrochemical transistors; Statistical analysis of electronic parts reliability test data; Reliability improvement of electrochemical transistors; Step stress test for high power transistors; Life testing methods employed to demonstrate reliability improvement; Establishment of optimum diffusion control; Uniform metal evaporation; Small ball bonding; Process surveillance a tool for improving in-process quality conformance.
Download or read book Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices written by P. Rai-Choudhury and published by The Electrochemical Society. This book was released on 1997 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Aerospace Abstracts written by and published by . This book was released on 1997 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability and Materials Issues of Semiconductor Optical and Electrical Devices and Materials Volume 1195 written by Osamu Ueda and published by Cambridge University Press. This book was released on 2010-08-20 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This book focuses on the current status of reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes. Topics include: laser reliability; degradation mechanisms; optical devices and reliability; electronic device reliability; wide-bandgap devices; compound semiconductors; characterization; characterization methods; strain effects; defects and growth; diffusion barriers; organic and other materials and novel structures.
Download or read book Electronic Packaging and Corrosion in Microelectronics written by Morris E. Nicholson and published by ASM International(OH). This book was released on 1987 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:
