Download or read book Proceedings of the Conference on Reliability of Semiconductor Devices and Integrated Circuits Volume Ii 17 18 and 19 June 1964 New York N y written by OFFICE OF THE DIRECTOR OF DEFENSE RESEARCH AND ENGINEERING WASHINGTON DC ADVISORY GROUP ON ELECTRON DEVICES. and published by . This book was released on 1964 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contents: Elimination of gross particles; A closure welder for nontubulated semiconductors; Development and application of hot hydrogen mounting furnace; Development and application of accelerated temperature testing; Analytical empirical surface studies; The chemistry and physics of semiconductor reliability; Reliability improvement of germanium electrochemical transistors; Statistical analysis of electronic parts reliability test data; Reliability improvement of electrochemical transistors; Step stress test for high power transistors; Life testing methods employed to demonstrate reliability improvement; Establishment of optimum diffusion control; Uniform metal evaporation; Small ball bonding; Process surveillance a tool for improving in-process quality conformance.

Download or read book Proceedings of the Conference on Reliability of Semiconductor Devices and Integrated Circuits Volume I 17 18 and 19 June 1964 New York N y written by OFFICE OF THE DIRECTOR OF DEFENSE RESEARCH AND ENGINEERING WASHINGTON DC ADVISORY GROUP ON ELECTRON DEVICES. and published by . This book was released on 1964 with total page 204 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contents: Internal reliability support effort at USAEL for the PEM program; Reliability improvement on VHF amplifier designs and processes; Step stress testing as a means of evaluating reliability of the PNP silicon alloy transistor; Improving the reliability of the PNP silicon alloy transistor; Reliability improvement of 2N336 and 2N2193 transistors; Preparation and effects of dislocations and resistivity of germanium single crystals; A universal test set for the measurement of thermal resistance; The use of infra-red techniques for transistor thermal resistance measurement; Improved reliability by means of material selection and production sampling; Application of ultrasonic energy to eutectic wafer bonding of transistors; Reliability improvements; Reliability verification of microcircuits through accelerated testing; Current microelectronic reliability testing in relation to silicon semiconductor networks; Reliability improvement process evaluation.

Download or read book Government wide Index to Federal Research Development Reports written by and published by . This book was released on 1967 with total page 1234 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Technical Abstract Bulletin written by and published by . This book was released on with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book U S Government Research Development Reports written by and published by . This book was released on 1967 with total page 992 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Bibliography of Scientific and Industrial Reports written by and published by . This book was released on 1967-03 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book U S Government Research and Development Reports written by and published by . This book was released on 1967 with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book National Union Catalog written by and published by . This book was released on 1968 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes entries for maps and atlases.

Download or read book Government Reports Announcements written by and published by . This book was released on 1967 with total page 756 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Government Reports Announcements Index written by and published by . This book was released on 1967 with total page 1020 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Handbook of Electronic Package Design written by Michael Pecht and published by CRC Press. This book was released on 2018-10-24 with total page 904 pages. Available in PDF, EPUB and Kindle. Book excerpt: Both a handbook for practitioners and a text for use in teaching electronic packaging concepts, guidelines, and techniques. The treatment begins with an overview of the electronics design process and proceeds to examine the levels of electronic packaging and the fundamental issues in the development

Download or read book Government wide Index to Federal Research Development Reports written by and published by . This book was released on 1967 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Government Reports Annual Index written by and published by . This book was released on 1967 with total page 872 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Reliability written by and published by . This book was released on 1962 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Reliability written by United States and published by . This book was released on 1961 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Laser Engineering Reliability and Diagnostics written by Peter W. Epperlein and published by John Wiley & Sons. This book was released on 2013-01-25 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.

Download or read book Atomic Layer Deposition for Semiconductors written by Cheol Seong Hwang and published by Springer Science & Business Media. This book was released on 2013-10-18 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.