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EBookClubs

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Book 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits  IPFA

Download or read book 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA written by IEEE Staff and published by . This book was released on 2016-07-18 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies

Book Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits  IPFA

Download or read book Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA written by and published by . This book was released on 2016 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book ISTFA 2019  Proceedings of the 45th International Symposium for Testing and Failure Analysis

Download or read book ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Book ISTFA 2017  Proceedings from the 43rd International Symposium for Testing and Failure Analysis

Download or read book ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2017-12-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Book Handbook of Silicon Based MEMS Materials and Technologies

Download or read book Handbook of Silicon Based MEMS Materials and Technologies written by Markku Tilli and published by Elsevier. This book was released on 2020-04-17 with total page 1028 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Silicon Based MEMS Materials and Technologies, Third Edition is a comprehensive guide to MEMS materials, technologies, and manufacturing with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), materials selection, preparation, modeling, manufacturing, processing, system integration, measurement, and materials characterization techniques of MEMS structures. The third edition of this book provides an important up-to-date overview of the current and emerging technologies in MEMS making it a key reference for MEMS professionals, engineers, and researchers alike, and at the same time an essential education material for undergraduate and graduate students. Provides comprehensive overview of leading-edge MEMS manufacturing technologies through the supply chain from silicon ingot growth to device fabrication and integration with sensor/actuator controlling circuits Explains the properties, manufacturing, processing, measuring and modeling methods of MEMS structures Reviews the current and future options for hermetic encapsulation and introduces how to utilize wafer level packaging and 3D integration technologies for package cost reduction and performance improvements Geared towards practical applications presenting several modern MEMS devices including inertial sensors, microphones, pressure sensors and micromirrors

Book Reliability and Failure Analysis of High Power LED Packaging

Download or read book Reliability and Failure Analysis of High Power LED Packaging written by Cher Ming Tan and published by Woodhead Publishing. This book was released on 2022-09-24 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure Analysis of High-Power LED Packaging provides fundamental understanding of the reliability and failure analysis of materials for high-power LED packaging, with the ultimate goal of enabling new packaging materials. This book describes the limitations of the present reliability standards in determining the lifetime of high-power LEDs due to the lack of deep understanding of the packaging materials and their interaction with each other. Many new failure mechanisms are investigated and presented with consideration of the different stresses imposed by varying environmental conditions. The detailed failure mechanisms are unique to this book and will provide insights for readers regarding the possible failure mechanisms in high-power LEDs. The authors also show the importance of simulation in understanding the hidden failure mechanisms in LEDs. Along with simulation, the use of various destructive and non-destructive tools such as C-SAM, SEM, FTIR, Optical Microscopy, etc. in investigation of the causes of LED failures are reviewed. The advancement of LEDs in the last two decades has opened vast new applications for LEDs which also has led to harsher stress conditions for high-power LEDs. Thus, existing standards and reliability tests need to be revised to meet the new demands for high-power LEDs. Introduces the failure mechanisms of high-power LEDs under varying environmental conditions and methods of how to test, simulate, and predict them Describes the chemistry underlying the material degradation and its impact on LEDs Discusses future directions of new packaging materials for improved performance and reliability of high-power LEDs

Book On the Physical Security of Physically Unclonable Functions

Download or read book On the Physical Security of Physically Unclonable Functions written by Shahin Tajik and published by Springer. This book was released on 2018-03-27 with total page 79 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book investigates the susceptibility of intrinsic physically unclonable function (PUF) implementations on reconfigurable hardware to optical semi-invasive attacks from the chip backside. It explores different classes of optical attacks, particularly photonic emission analysis, laser fault injection, and optical contactless probing. By applying these techniques, the book demonstrates that the secrets generated by a PUF can be predicted, manipulated or directly probed without affecting the behavior of the PUF. It subsequently discusses the cost and feasibility of launching such attacks against the very latest hardware technologies in a real scenario. The author discusses why PUFs are not tamper-evident in their current configuration, and therefore, PUFs alone cannot raise the security level of key storage. The author then reviews the potential and already implemented countermeasures, which can remedy PUFs’ security-related shortcomings and make them resistant to optical side-channel and optical fault attacks. Lastly, by making selected modifications to the functionality of an existing PUF architecture, the book presents a prototype tamper-evident sensor for detecting optical contactless probing attempts.

Book Materials for Electronics Security and Assurance

Download or read book Materials for Electronics Security and Assurance written by Navid Asadizanjani and published by Elsevier. This book was released on 2024-01-15 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials for Electronics Security and Assurance reviews the properties of materials that could enable devices that are resistant to tampering and manipulation. It discusses recent advances in materials synthesis and characterization techniques for security applications. Topics addressed include anti-reverse engineering, detection, prevention, track and trace, fingerprinting, obfuscation and how materials could enable these security solutions. The book introduces the opportunities and challenges and provides a clear direction of the requirements for material-based solutions to address electronics security challenges. Materials for Electronics Security and Assurance is suitable for materials scientists and engineers to enable future research directions, current computer and hardware security engineers to enable materials selection, and to inspire cross-collaboration between both communities. Discusses materials as enablers to provide electronics assurance, counterfeit detection/protection, and fingerprinting Provides an overview of benefits and challenges of materials-based security solutions to inspire future materials research directions Includes an introduction to material perspectives on hardware security to enable cross collaboration between materials, design, and testing

Book Next Generation CubeSats and SmallSats

Download or read book Next Generation CubeSats and SmallSats written by Francesco Branz and published by Elsevier. This book was released on 2023-08-24 with total page 838 pages. Available in PDF, EPUB and Kindle. Book excerpt: Next Generation of CubeSats and SmallSats: Enabling Technologies, Missions, and Markets provides a comprehensive understanding of the small and medium sized satellite approach and its potentialities and limitations. The book analyzes promising applications (e.g., constellations and distributed systems, small science platforms that overachieve relative to their development time and cost) as paradigm-shifting solutions for space exploitation, with an analysis of market statistics and trends and a prediction of where the technologies, and consequently, the field is heading in the next decade. The book also provides a thorough analysis of CubeSat potentialities and applications, and addresses unique technical approaches and systems strategies. Throughout key sections (introduction and background, technology details, systems, applications, and future prospects), the book provides basic design tools scaled to the small satellite problem, assesses the technological state-of-the-art, and describes the most recent advancements with a look to the near future. This new book is for aerospace engineering professionals, advanced students, and designers seeking a broad view of the CubeSat world with a brief historical background, strategies, applications, mission scenarios, new challenges and upcoming advances. Presents a comprehensive and systematic view of the technologies and space missions related to nanosats and smallsats Discusses next generation technologies, up-coming advancements and future perspectives Features the most relevant CubeSat launch initiatives from NASA, ESA, and from developing countries, along with an overview of the New Space CubeSat market

Book Noise in Nanoscale Semiconductor Devices

Download or read book Noise in Nanoscale Semiconductor Devices written by Tibor Grasser and published by Springer Nature. This book was released on 2020-04-26 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.

Book Advances in Non volatile Memory and Storage Technology

Download or read book Advances in Non volatile Memory and Storage Technology written by Yoshio Nishi and published by Woodhead Publishing. This book was released on 2019-06-15 with total page 662 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Nonvolatile Memory and Storage Technology, Second Edition, addresses recent developments in the non-volatile memory spectrum, from fundamental understanding, to technological aspects. The book provides up-to-date information on the current memory technologies as related by leading experts in both academia and industry. To reflect the rapidly changing field, many new chapters have been included to feature the latest in RRAM technology, STT-RAM, memristors and more. The new edition describes the emerging technologies including oxide-based ferroelectric memories, MRAM technologies, and 3D memory. Finally, to further widen the discussion on the applications space, neuromorphic computing aspects have been included. This book is a key resource for postgraduate students and academic researchers in physics, materials science and electrical engineering. In addition, it will be a valuable tool for research and development managers concerned with electronics, semiconductors, nanotechnology, solid-state memories, magnetic materials, organic materials and portable electronic devices. Discusses emerging devices and research trends, such as neuromorphic computing and oxide-based ferroelectric memories Provides an overview on developing nonvolatile memory and storage technologies and explores their strengths and weaknesses Examines improvements to flash technology, charge trapping and resistive random access memory

Book Understanding Logic Locking

Download or read book Understanding Logic Locking written by Kimia Zamiri Azar and published by Springer Nature. This book was released on 2023-10-24 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book demonstrates the breadth and depth of IP protection through logic locking, considering both attacker/adversary and defender/designer perspectives. The authors draw a semi-chronological picture of the evolution of logic locking during the last decade, gathering and describing all the DO’s and DON’Ts in this approach. They describe simple-to-follow scenarios and guide readers to navigate/identify threat models and design/evaluation flow for further studies. Readers will gain a comprehensive understanding of all fundamentals of logic locking.

Book Memristors for Neuromorphic Circuits and Artificial Intelligence Applications

Download or read book Memristors for Neuromorphic Circuits and Artificial Intelligence Applications written by Jordi Suñé and published by MDPI. This book was released on 2020-04-09 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Artificial Intelligence (AI) has found many applications in the past decade due to the ever increasing computing power. Artificial Neural Networks are inspired in the brain structure and consist in the interconnection of artificial neurons through artificial synapses. Training these systems requires huge amounts of data and, after the network is trained, it can recognize unforeseen data and provide useful information. The so-called Spiking Neural Networks behave similarly to how the brain functions and are very energy efficient. Up to this moment, both spiking and conventional neural networks have been implemented in software programs running on conventional computing units. However, this approach requires high computing power, a large physical space and is energy inefficient. Thus, there is an increasing interest in developing AI tools directly implemented in hardware. The first hardware demonstrations have been based on CMOS circuits for neurons and specific communication protocols for synapses. However, to further increase training speed and energy efficiency while decreasing system size, the combination of CMOS neurons with memristor synapses is being explored. The memristor is a resistor with memory which behaves similarly to biological synapses. This book explores the state-of-the-art of neuromorphic circuits implementing neural networks with memristors for AI applications.

Book Hardware Security Training  Hands on

Download or read book Hardware Security Training Hands on written by Mark Tehranipoor and published by Springer Nature. This book was released on 2023-06-29 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book dedicated to hands-on hardware security training. It includes a number of modules to demonstrate attacks on hardware devices and to assess the efficacy of the countermeasure techniques. This book aims to provide a holistic hands-on training to upper-level undergraduate engineering students, graduate students, security researchers, practitioners, and industry professionals, including design engineers, security engineers, system architects, and chief security officers. All the hands-on experiments presented in this book can be implemented on readily available Field Programmable Gate Array (FPGA) development boards, making it easy for academic and industry professionals to replicate the modules at low cost. This book enables readers to gain experiences on side-channel attacks, fault-injection attacks, optical probing attack, PUF, TRNGs, odometer, hardware Trojan insertion and detection, logic locking insertion and assessment, and more.

Book Microelectronics Fialure Analysis Desk Reference  Seventh Edition

Download or read book Microelectronics Fialure Analysis Desk Reference Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 750 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.

Book Built in Fault Tolerant Computing Paradigm for Resilient Large Scale Chip Design

Download or read book Built in Fault Tolerant Computing Paradigm for Resilient Large Scale Chip Design written by Xiaowei Li and published by Springer Nature. This book was released on 2023-03-01 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Book Automated Methods in Cryptographic Fault Analysis

Download or read book Automated Methods in Cryptographic Fault Analysis written by Jakub Breier and published by Springer. This book was released on 2019-03-19 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a collection of automated methods that are useful for different aspects of fault analysis in cryptography. The first part focuses on automated analysis of symmetric cipher design specifications, software implementations, and hardware circuits. The second part provides automated deployment of countermeasures. The third part provides automated evaluation of countermeasures against fault attacks. Finally, the fourth part focuses on automating fault attack experiments. The presented methods enable software developers, circuit designers, and cryptographers to test and harden their products.